Laser Solutions (한국레이저가공학회지)

Korean Society of Laser Processing (한국레이저가공학회)
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Investigation of Spot Marking in Multilayer Thin Films using OCT

OCT에 의한 다층 박막의 Spot Marking 분석

  • Shin Yongjin (Department of Physics, College of Natural Science, Chosun University) ;
  • Kim Hyunjin (Department of Physics, College of Natural Science, Chosun University) ;
  • Kim Youngseop (Department of Physics, College of Natural Science, Chosun University) ;
  • Park Sohee (Department of Physics, College of Natural Science, Chosun University)
  • 신용진 (조선대학교 자연과학대학 물리학과) ;
  • 김현진 (조선대학교 자연과학대학 물리학과) ;
  • 김영섭 (조선대학교 자연과학대학 물리학과) ;
  • 박소희 (조선대학교 자연과학대학 물리학과)
  • Published : 2004.08.01
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Abstract

We propose a novel application of optical coherence tomography (OCT) to monitor pit formation in laser irradiated optical storage materials. A multilayer optical storage recordable compact disk, is composed of multiple layers, each of different structure. Disks were irradiated with aQ-Switched Nd:YAG laser with an energy of 373 mJ. Post-irradiated disks were evaluated by OCT and those images were compared with optical microscopy. Our results indicate that OCT is a useful instrument to investigate pit formation in multilayer optical storage disks and might also provide information to optimize optical memory technology.

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