• Title/Summary/Keyword: Columnar crystal growth

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A study on the growth morphology of AlN crystals grown by a sublimation process (승화법으로 성장된 AlN 결정의 성장 양상에 관한 연구)

  • Kang, Seung-Min
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.19 no.5
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    • pp.242-245
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    • 2009
  • AlN crystals were grown by a sublimation process without seed crystals and the growth morphology of them was characterized. The grown AlN crystals were a polycrystalline phase, which had a diameter of $60\sim200\;{\mu}m$ and were grown with a growth rate of $0.2\sim0.5\;{\mu}n/hr$. It was observed that the as-grown crystals had a hexagonal crystal structure and revealed that these crystals were grown with a morphology of columnar morphology in the initial stage of the growth before they were enlarged in a way of a lateral growth behavior in the final stage. On the surface, a lot of pinholes were observed on the surface of crystals grown. The evolution of a growth morphology was characterized by optical and scanning electron microscopic observation.

The analysis of columnar to equiaxed dendritic transition during alloy solidification (합금응고시 주상정으로부터 등축정 수지상으로의 천이에 관한 해석)

  • 김신우
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.8 no.1
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    • pp.187-192
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    • 1998
  • Generally the solidified microstructures of materials consist of the columnar and equiaxed dendritic regions, and many theoretical studies about columnar-to-equiaxed transition have been done because that is closely related to the mechanical and physical properties of products. In this study, the modified equation based on the Hunt's analytical columnar-to-equiaxed transition condition which was derived from heterogeneous nucleation and grain growth in front of the columnar dendrite tip under directional solidification, was obtained applying the growth-velocity-dependent distribution coefficient and liquidus slope to Hunt's. The effects of the number of nucleation sites, nucleation temperature, alloy composition, growth velocity and liquid temperature gradient on the transition for Al-Cu alloys have been investigated.

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The Effect of Chamber Pressure and Nitrogen Flow Rate on Deposition Characteristics of $(Ni_{0.8}Fe_{0.2})_{20}Ag_{80}$ Thin Films

  • Oh, T.S.;Choo, W.K.
    • Proceedings of the Korea Association of Crystal Growth Conference
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    • 1997.06a
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    • pp.275-280
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    • 1997
  • We have investigated the deposition characteristics of (Ni0.8Fe0.2)20Ag80 thin films as a function of chamber pressure and nitrogen flow rate with scanning electron microscopy(SEM), atomic force microscopy(AFM), XRD and $\alpha$-step. The deposition rate of these film is decreased with increasing the chamber pressure and the nitrogen flow rate. With raising the chamber pressure, the growth mode of thin film is changed from island growth to columnar one, which is probably due to energy of atom. Contrary, the nitrogen flow rate is raised, growth mode is changed from columnar to island one. According to the XRD patterns, the preferred orientation is inhibited as the nitrogen flow rate is kept above 10 sccm, but that is nearly independent on the chamber pressure. When the chamber pressure decrease or the nitrogen flow rate increase, phase separation into permoally and silver is occured.

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Study on the Mechanical Properties of TiAl Crystals Grown by a Floating Zone Method

  • Han, Chang-Suk;Kim, Sang-Wook
    • Korean Journal of Materials Research
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    • v.27 no.7
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    • pp.369-373
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    • 2017
  • Unidirectionally solidified TiAl alloys were prepared by optically-heated floating zone method at growth rates of 10 to 70 mm/h in flowing argon. The microstructures and tensile properties of these crystal bars were found to depend strongly on the growth rate and alloy composition. TiAl alloys with composition of 47 and 50 at.%Al grown under the condition of 10 mm/h showed $Ti_3Al({\alpha}_2)/TiAl({\gamma})$ layer structures similar to single crystals. As the growth rate increased, the alloys with 47 and 50 at.%Al compositions showed columnar-grain structures. However, the alloys fabricated under the condition of 10 mm/h had a layered structure, but the alloy with increased growth rate consisted of ${\gamma}$ single phase grains. The alloy with a 53 at.%Al composition showed a ${\gamma}$ single phase regardless of the growth rate. Room-temperature tensile tests of these alloys revealed that the columnar-grained material consisting of the layered structure showed a tensile ductility of larger than 4 % and relatively high strength. The high strength is caused by stress concentration at the grain boundaries; this enhances the secondary slip or deformation twinning across the layered structure in the vicinity of the grain boundaries, resulting in the appreciable ductility.

FBAR Devices Fabrication and Effects of Deposition Temperature on ZnO Crystal Growth for RF Filter Applications (RF 필터응용을 위한 FBAR 소자제작과 증착온도가 ZnO 박막의 결정성장에 미치는 영향)

  • Munhyuk Yim;Kim, Dong-Hyun;Dongkyu Chai;Mai Linh;Giwan Yoon
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2003.05a
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    • pp.88-92
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    • 2003
  • In this paper, the characteristics of the ZnO films deposited on AI bottom electrode and the temperature effects on the ZnO film growth are presented along with the fabrication and their evaluation of the film bulk acoustic wave resonator (FBAR) devices. All the films used in this work were deposited using a radio-frequency (RF) magnetron sputtering technique. Growth characteristics of the ZnO films are shown to have a strong dependence on the deposition temperatures ranged from room temperature to 35$0^{\circ}C$ regardless of the RF power applied for sputtering the ZnO target. In addition, according to the growth characteristics of the distinguishably different micro-crystal structures and the degree of the c-axis preferred orientation, the deposition temperatures can be divided into 3 temperature regions and 2 critical temperatures in-between. Overall, the ZnO films deposited at/below 20$0^{\circ}C$ are seen to have columnar grains with a highly preferred c-axis orientation where the full width at half maximum (FWHM) of X-ray diffraction rocking curve is 14$^{\circ}$. Based on the experimental findings, several FBAR devices were fabricated and measured. As a result, the FBAR devices show return loss of ~19.5dB at resonant frequency of ~2.05GHz.

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Single crystal growth of synthetic emerald by flux method of Vandadium - Molybdenum - Lithium oxide system (산화 바나디움, 몰리브데늄, 리티움계 융제법에 의한 합성 Emerald 단결정 육성)

  • 최의석;김무경;이종민;안영필;서청교;안찬준
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.6 no.1
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    • pp.44-55
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    • 1996
  • Emerald (3BeO{\cdot}Al$_{2}$O_{3}{\cdot}6SiO_2 : Cr^{3+}$) single crystals were grown by flux method of $Li_2O-MoO_3 - V_2O_5$ system. The composition of starting materials were 1, 3, 5 mole ratio of $MoO_3 - V_2O_5/$Li_2O$, 20 - 15% of emerald content to flux composition and 1% of $Cr_2O_3$ colordopant to emerald composition. After mixing those were melted at $1100^{\circ}C$ in Pt crucible of electric furnace. Single crystal growth was cooled down slowly rate of $3^{\circ}C$/hr from $1100^{\circ}C$ to $650^{\circ}C$, for the cooling period it was controlled and prevented the nucleation of microcrystallite from variation of each thermal fluctuation range. Specially it has been obtained plenty of large emerald single crystal when thermal fluctuation was treated for cooling period at $1050 ~ 950^{\circ}C$, in 3 mole ratio of $V_2O_5 - MoO_3/Li_2O$ flux. Emerald single crystal growing effect and $Cr_{+3}$ ion of substitutional solid solution effect for $Al_{+3}$ ion was good than mole ratio of 5. Emerald single crystals were c (0001) hexagonal rystal face of preferencial direction and m (1010) post side. Emerald was hexagonal columnar greenish transparent and 2.65 ~ 2.66 of specific gravity.

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Synthetic and characterization of Na-tetrasilicic fluorine mica by skull melting method (스컬용융법에 의한 Na사규소운모 합성 및 특성평가)

  • Seok, Jeong-Won;Choi, Jong-Geon
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.19 no.4
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    • pp.190-195
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    • 2009
  • Na-tetrasilicic fluorine mica powders were synthesized by skull melting method. The staring materials having chemical composition of $Mg_3(OH)_2Si_4O_{10}:Na_2SiF_6:SiO_2=8.3:24.8:66.9$ mol% were charged into a cold crucible of 13 cm in diameter and 14cm in height and heated by R.F. generator at working frequency of 2.84 MHz. The materials were maintained for 1hr as a molten state and cooled down in the container. In this study, the specific electric resistance of mica was estimated and the columnar and plate shaped mica were synthesized.

Magnetic properties and the shapes of magnetic domain for $CoCr_{16.2}Pt_{10.8}Ta_4$ alloy films with the prior deposition of Ti layer ($CoCr_{16.2}Pt_{10.8}Ta_4$ 합금박막의 Ti 우선증착에 따른 자기적 특성과 자구형상변화)

  • 이인선;김동원
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.10 no.1
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    • pp.17-22
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    • 2000
  • A quaternary alloy film of $CoCr_{16.2}Pt_{10.8}Ta_4$was investigated for its magnetic properties and c-axis orientation with and without Ti underlayer. Additional elements such as Ta, Pt have been frequently introduced in CoCr alloy film for perpendicular recording as a means of improving magnetic performance. It has been reported that the addition of Pt and Ta in CoCr increase the coercivity and the magnetic isolation of columnar grains, respectively. However, CoCrPtTa perpendicular magnetic layer should be more increased its perpendicular magnetic anisotropy than at present for the application of ultrahigh recording density. The improvement of underlayers and substrate materials is one of the promised schemes to intensify the perpendicular magnetic anisotropy. In this study, the insertion of Ti underlayer shows the remarkable improvement of c-axis orientation compare with the direct deposition on the bare glass. The mechanism about this effect of Ti underlayer on CoCrPtTa is not to be clarified yet. Meanwhile, it is found that the magnetic domain of CoCrPtTa on 20 nm Ti underlayer has the continuous stripe pattern but the one of CoCrPtTa on 90 nm Ti underlayer shows the discrete mass type from the results of MFM investigation. This phenomenon is to be a distinct evidence that the improvement of perpendicular anisotropy by the adoption of Ti underlayer is originated from the reinforcement of the grain boundary segregation in CoCrPtTa alloy. Moreover, the transition of the M-H hysteresis pattern with the thickness of Ti underlayer indicates that the major contribution of Ti underlayer is not the magnetocrystalline anisotropy but the shape anisotropy due to the formation of uniform columnar grains by the nonmagnetic alloy segregation.

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Single crystal growth of syntheric emerald by reflux method of temperatute gradient using natural beryl (천연베릴을 이용한 온도구배 환류법에 의한 합성 Emerald 단결정 육성)

  • 최의석;김무경;안영필;서청교;안찬준;이종민
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.8 no.4
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    • pp.532-538
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    • 1998
  • Emerald ($3BeO{\cdot}Al_2O_3{\cdot}6SiO_2:Cr^{3+}$) single crystal was grown by temperature gradient reflux method with using Korean natural beryl. The flux of lithium-molibudenium-vanadium oxide system was made by means of mixing the 2 sort of flux which were differently melted $Mo_3-Li_2O$ and $V_2O_5-Li_2O$ each other. The optimum composition of flux was 3 mole ratio of molibudenium. vanadium oxides to lithium oxide ($(MoO_3+V_2O_5)/Li_2O$), flux additives were substituted more less then 0.2 mole% of $K_2O$ or $Na_2O$ to the $Li_2O$ amount. The melting concentration of mixing beryl material was 3~10% content to the flux, that of $Cr_2O_3$ color dopant was 1% to the beryl amount. In the crystal growing apparatus with temperature gradient in the 3 zone furnace which was separated into the block of melt, growth and return, the solution have got to circulate continuously between $1100^{\circ}C$ and $1000^{\circ}C$ in steady state. When thermal fluctuation was treated to during 2 hrs once on a day at 950~$1000^{\circ}C$ in growth zone, the supersaturation solution was maintained, controled and emerald single crystal can be grown large crystal which was prevented from the nucleation of microcrystallite. The preferencial growth direction of hexagonal columnar emerald single crystal was the c(0001) plane of botton side and vertical to the m(1010) plane of post side.

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