• Title/Summary/Keyword: Co-sputtering

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Magnetic Property Evolution of Co-22%Cr Alloy Thin Films with Self-Organized Nano Structure Formation (Co-22%Cr 합금박막의 자가정렬형 나노구조에 의한 자기적 물성)

  • Song, O-Seong;Lee, Yeong-Min
    • Korean Journal of Materials Research
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    • v.11 no.12
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    • pp.1042-1046
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    • 2001
  • Co-22%Cr alloy films are promising for high-density perpendicular magnetic recording media with their perpendicular anisotropy and large coercivity of 3000 Oe. We observed that a self organized nano structure(SONS) of fine ferromagnetic Co-enriched phase and paramagnetic Cr-enriched phase appears inside the grain of Co-Cr magnetic alloy thin films at the elevated substrate temperature after do-sputtering. We prepared 1000 $\AA$-thick Co-22%Cr films on 2000 $\AA$- SiO$_2$/Si(100) substrates at the deposition rate of 100 $\AA$/min with substrate temperatures of 3$0^{\circ}C$, 10$0^{\circ}C$, 15$0^{\circ}C$, 20$0^{\circ}C$, 30$0^{\circ}C$, and 40$0^{\circ}C$, respectively. We employed a vibrating sample magnetometer(VSM) to measure the B-H loops showing the saturation magnetifation, coercivity, remanence in in- plane and out- of- plane modes. In- plane coercivity, perpendicular coercivity, and perpendicular remanence increased as substrate temperature increased, how-ever they decreased after 30$0^{\circ}C$ slowly. Transmission electron microscope (TEM) characterization revealed that the self organized nano structure (SONS) appears at the elevated substrate temperature, which forms fine Co-enriched phases inside a grain, then it eventually affect the perpendicular magnetic property. Our results imply that we may tune the perpendicular magnetic properties with SONS obtained at appropriate substrate temperature.

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Magnetoresistance of ${[Co/Fe/Cu]}_20$ Multilayers (${[Co/Fe/Cu]}_20$ 다층박막의 자기저항 특성)

  • 이장로
    • Journal of the Korean Magnetics Society
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    • v.6 no.6
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    • pp.411-416
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    • 1996
  • We have studied the effect of a spin-dependence interface electron scattering on the giant magnetoresistance by adding a Fe magnetic material to the Co/Cu interfaces. The $Fe(50\;{\AA})/[Co(17\;{\AA})/Fe(t\;{\AA})/Cu(24\;{\AA})]_{20}$ multilayers are deposited on the Corning glass 2948 and 7059 substrates in a dc magnetron sputtering system. The magnetoresistance ratio is 22 % in the only Co/Cu multilayer, while it is increased to 26 % with inserted ultra thin Fe interface layer and reduced with increasing thickness of the Fe interface layer. It was investigated to the dependence of the magnetoresistance behaviors on annealing temperature. The magnetic properties of the multilayers were measured by vibrating sample magnetometer. Also, the structures and the surface roughness of samples were characterized by X-ray diffraction and atomic force microscope, respectively. The magnetoresistance ratio was increased to annealing temperature $300^{\circ}C$, but reduced at the temperature higher than $300^{\circ}C$ due to the interfacial diffuse.

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A Study on the Properties of AlN Films Deposited with Nitrogen Ion Beam Assisted RF Magnetron Sputtering (질소이온 빔 보조 마그네트론 스퍼터로 증착 된 AlN 박막의 물성연구)

  • Heo, Sung-Bo;Lee, Hak-Min;Jeong, Chul-Woo;Choi, Dae-Han;Lee, Byung-Hoon;Kim, Min-Gyu;You, Yong-Zoo;Kim, Daeil
    • Journal of the Korean Society for Heat Treatment
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    • v.24 no.2
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    • pp.77-81
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    • 2011
  • Aluminum nitride (AlN) thin films were prepared by using nitrogen ion beam assisted reactive radio frequency (RF) magnetron sputtering on the glass substrates without intentional substrate heating. After deposition, the effect of nitrogen ion beam energy on the structural and optical properties of AlN films were investigated by x-ray diffraction (XRD), atomic force microscope (AFM) and UV-Vis. spectrophotometer, respectively. AlN films deposited with $N^+$ ion irradiation at 100 eV show the higher (002) peak intensity in XRD pattern than other films. It means that $N^+$ ion energy of 100 eV is the favorable condition for low temperature crystallization. AFM images also show that surface average roughness is increased from 1.5 to 9.6 nm with $N^+$ ion energy in this study. In an optical observation, AlN films which deposited by $N^+$ ion beam energy of 100 eV show the higher transmittance than that of the films prepared with the other $N^+$ ion beam conditions.

Characterization of post-annealed Si QDs in $Si_{1-x}C_x$ thin film by RF co-sputtering (RF Co-sputtering법에 의한 $Si_{1-x}C_x$ 박막 증착 및 후 열처리에 따른 양자점 박막 특성 분석)

  • Moon, Ji-Hyun;Kim, Hyun-Jong;Cho, Jun-Sik;Chang, Bo-Yun;Ko, Chang-Hyun;Park, Sang-Hyun;Yun, Kyoung-Hoon;Song, Jin-Soo;O, Byung-Sung;Lee, Jeong-Chul
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.06a
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    • pp.33-36
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    • 2009
  • 고효율 양자점 태양전지를 위하여 $Si_{1-x}C_x$ 박막 내에 Si 양자점을 형성한 박막을 제작하고 그 특성을 분석하였다. $Si_{1-x}C_x$ 박막은 Si과 C target을 co-sputtering하여 증착하였다. C target의 RF power를 변화시켜 $Si_{1-x}C_x$ 박막의 조성비를 조절하였으며, 조성비는 auger electron spectroscopy로 정량적으로 측정하였다. 이 박막들을 질소 분위기에서 후 열처리하여 high resolution transmittance electron microscopy로 확인한 결과 박막 내에 2~10nm 크기의 양자점이 형성된 것을 관측할 수 있었다. 이 양자점은 transmittance electron diffraction과 grazing incident X-ray diffraction을 통해 Si 양자점과 SiC 양자점이 형성되었음을 알 수 있었다. Raman 측정 결과에서는 후 열처리한 $Si_{1-x}C_x$ 박막의 조성비가 증가할 수록 crystal Si peak의 shift가 증가함을 알 수 있었고, 이를 통해 양자점의 크기도 함께 계산할 수 있었다. Fourier transform infrared spectroscopy을 통해 후 열처리한 Si1-xCx 박막의 양자점의 형성 원인을 추정하였다.

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Effects of Ta addition in Co-sputtering Process for Ta-doped Indium Tin Oxide Thin Film Transistors

  • Park, Si-Nae;Son, Dae-Ho;Kim, Dae-Hwan;Gang, Jin-Gyu
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.334-334
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    • 2012
  • Transparent oxide semiconductors have recently attracted much attention as channel layer materials due to advantageous electrical and optical characteristics such as high mobility, high stability, and good transparency. In addition, transparent oxide semiconductor can be fabricated at low temperature with a low production cost and it permits highly uniform devices such as large area displays. A variety of thin film transistors (TFTs) have been studied including ZnO, InZnO, and InGaZnO as the channel layer. Recently, there are many studies for substitution of Ga in InGaZnO TFTs due to their problem, such as stability of devices. In this work, new quaternary compound materials, tantalum-indium-tin oxide (TaInSnO) thin films were fabricated by using co-sputtering and used for the active channel layer in thin film transistors (TFTs). We deposited TaInSnO films in a mixed gas (O2+Ar) atmosphere by co-sputtering from Ta and ITO targets, respectively. The electric characteristics of TaInSnO TFTs and thin films were investigated according to the RF power applied to the $Ta_2O_5$ target. The addition of Ta elements could suppress the formation of oxygen vacancies because of the stronger oxidation tendency of Ta relative to that of In or Sn. Therefore the free carrier density decreased with increasing RF power of $Ta_2O_5$ in TaInSnO thin film. The optimized characteristics of TaInSnO TFT showed an on/off current ratio of $1.4{\times}108$, a threshold voltage of 2.91 V, a field-effect mobility of 2.37 cm2/Vs, and a subthreshold swing of 0.48 V/dec.

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Light Sensing Characteristics of $BaAl_2O_4$ thin film by RF magnetron sputtering (RF 마그네트론 스퍼터링에 의한 $BaAl_2O_4$:Eu 박막의 광센싱 특성)

  • Kim, Sei-Ki;Kang, Jung-Woo;Kwak, Chang-Gon;Ji, Mi-Jung;Choi, Byung-Hyun;Kim, Young-Woo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.54-54
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    • 2008
  • $Eu^{2+}$, $Nd^{3+}$ co-doped $BaAl_2O_4$ are known as a long afterglow phosphor. We found that $Eu^{2+}$-doped $BaAl_2O_4$ showed ptotoconductivity in the range of UV and visual light. In this study, $BaAl_2O_4$:Eu thin film has been prepared by RF sputtering method and a sensing characteristics to UV and visual light was performed. Only $Eu^{2+}$ and $Nd^{3+}$ co-doped $BaAl_2O_4$ powders and targets for deposition were prepared by a convention solid state method, and the deposition was performed in a reducing $H_2$-Ar mixture gas on Si substrates. The observation of crystalline phase and morphology of the sputtered film were performed using XRD, EDX. The photoluminescence and photocurrent to UV and visual light were measured simultaneously using 300W-Xe solar simulator as a light source. It was confirmed that the photocurrent induced by irradiation of light showed a linear relationship to the light intensity.

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Effect of Selenization Pressure on the properties of $CuInSe_2$ Thin Films (Selenization 압력이 $CuInSe_2$ 박막의 특성에 미치는 영향)

  • 김상덕;김형준;송진수;윤경훈
    • Journal of the Korean Ceramic Society
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    • v.35 no.8
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    • pp.871-877
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    • 1998
  • $CuInSe_2$ thin films have been formed by two-step method in which Cu-In alloy layer was first deposited and then it was selenized. Cu-In alloy layers were deposited by co-sputtering method at ambient tem-perature. XRD analysis showed that both of $Cu_{11}In_{9}$ and CuIn$_2$ phases were formed from these films. $Cu_{11}In_{9}$ peak intensity was increased increased with varying the composition from In-rich to Cu-rich. The metallic layers were selenized either in low pressure of 10 mTorr or in atmospheric pressure(AP) Less compounds of Cu-Se and In-Se were observed during the early stage of selenization and also $CuInSe_2$ thin films selenized in vacuum showed lower roughness larger grain size and better crystallinity than those in AP.

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Optical and structural properties of ZnMgO thin films by RF co-sputtering (RF magnetron sputtering으로 성장된 ZnMgO박막의 구조적, 광학적 특성 분석)

  • Kang, Si-Woo;Kim, Young-Yi;Ahn, Cheol-Hyoun;Cho, Hyung-Koun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.178-178
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    • 2007
  • II-VI의 넓은 밴드갭 (3.37 eV)을 가지는 ZnO는 solar cells, transparent conductive electrodes, ultraviolet light emitters, and chemical sensors 등에 응용되고 있다. 특히 고효율 ZnO계 발광 소자 구현을 위하여 MgO (7.7eV), CdO (2.0eV) 등의 고용을 통한 밴드갭을 엔지니어링 하며, 단파장 영역의 광원을 확보하기 위하여 MgO 첨가를 통한 밴드갭 에너지를 증가시키는 방향으로의 연구가 활발하다. 그러나 ZnO의 wurtzite 구조와 MgO의 rocksalt 구조의 상이한 결정구조로 인하여 Mg의 고용한계는 4 at. %, 4.1 eV 알려져 있다. 본 실험에서는 p-type Si (100), c-sapphire (0002)과 GaN 기판 위에 MgO (99.999 %)와 ZnO (99.999 %) 두가지 타겟을 사용하여 RF co-스퍼터링법으로 ZnMgO 박막을 증착 하였다. 이때 ZnO 타겟의 power 밀도는 고정 시키고 MgO 타겟의 power 밀도를 변화 시키며 Mg의 함량을 조절하여 그에 따른 광학적 구조적 특성의 변화를 연구 하였다. 성장된 ZnMgO 박막은 MgO 타겟의 power 밀도가 증가할 때 Mg의 함량이 10 at. %까지 증가 하며, 그에 따른 표면의 거칠기 및 입계 크기가 감소하며, 박막의 성장속도 또한 감소함을 SEM과 AFM을 통하여 알 수 있었다. XRD를 동하여 ZnMgO 박막의 (0002) peak의 위치는 $34.50^{\circ}{\sim}34.7^{\circ}$로 오른쪽으로 이동하며, c-축으로 성장하였음을 알 수 있다. PL과 UV룰 동하여, Mg의 함량이 증가 할수록 박막의 밴드갭 에너지는 3.2 eV에서 4.1 eV 로 증가하였다.

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Co-sputtering법으로 제작된 화합물 반도체 박막형 태양전지에서 $CuInSe_2$(CIS) 광흡수층의 열처리 효과

  • Kim, Hae-Jin;Lee, Hye-Ji;Son, Seon-Yeong;Park, Seung-Hwan;Kim, Hwa-Min;Hong, Jae-Seok
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.269-269
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    • 2010
  • 현재 화석연료의 부족으로 인한 에너지 수급의 불균형, 자연환경의 파괴로 인해 대체에너지 개발이 절실히 요구되고 있다. 이러한 문제점을 극복하기 위한 방안으로 태양전지에 대한 관심이 높아지고 있다. 기존 결정형 실리콘 태양전지와 비교해 화합물 반도체를 기반으로 한 박막형 태양전지는 친환경적인 제품이면서 제조원가를 절감시킬 수 있고, 반영구적인 수명 및 값싼 기판을 활용할 수 있는 장점으로 인해 활발한 연구가 진행되고 있다. 본 실험에서는 Co-sputtering법으로 제작된 $CuInSe_2$(CIS)를 광활성층으로 한 박막형 태양전지에서 실온 ${\sim}550^{\circ}C$의 다양한 온도에서 후열 처리된 CIS 박막들의 전기적, 구조적, 광학적인 특성들을 분석하였다. 제작된 박막들 가운데 Hall Effect 측정결과 $550^{\circ}C$에서 후열 처리된 박막이 가장 높은 1.227E+22(/$cm^3$)의 캐리어 농도와 1.581(cm/$V{\cdot}s$)의 홀 이동도를 가지며, 3.092E-4(${\Omega}{\cdot}cm$)의 가장 낮은 비저항 값을 갖는 것으로 나타났다. EFM 측정결과 열처리 하지 않은 박막에 비해 후열처리된 CIS 박막의 전도성이 전체적으로 높아졌다. 특히, $550^{\circ}C$에서 후열 처리된 박막의 표면은 전체적으로 전기 전도성이 높은 결정립들이 골고루 분포하며 가장 높은 표면 포텐셜 에너지 값을 갖는 것으로 나타났다. 박막들의 구조적 특성을 분석하기 위해 SEM과 XRD를 측정한 결과, $350^{\circ}C$에서 후열 처리된 박막들은 열처리 되지 않은 박막과 비교해 표면형상 변화가 일어났으며, $550^{\circ}C$에서 후열 처리된 CIS 박막들은 $CuInSe_2$(112) 방향이 향상된 chalcopyrite-like 구조를 가지면서 박막 밀도가 높고 결정립의 크기가 증가된 것을 확인하였다. 이는 박막 성장시 기판온도의 상승으로 CIS 박막 내에서 셀레늄의 확산과 상호작용으로 3원 화합물이 재결정화되어 구조적인 특성향상에 기여하였기 때문이다. 결론적으로 본 연구는 CIS 광활성층에서 후열 처리의 효과들 뿐만아니라 박막 증착시 co-sputtering법을 이용함으로써 증착시간의 감소 및 대면적화와 대량생산으로도 적용 가능함을 제시하고자 한다.

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