• Title/Summary/Keyword: Co deposition

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Fabrication of Pt-Ru/C Composite Catalyst Electrodes by Electrophoresis Deposition Method for DMFC Fuel Cell and their Characteristics (전기영동법에 의한 직접메탄올 연료전지용 Pt-Ru/C 복합촉매 전극제조 및 특성평가)

  • Kim, Jeonghyun;Song, Minkyeong;Kim, Jinwoo;Yu, Yeontae
    • 한국신재생에너지학회:학술대회논문집
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    • 2011.11a
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    • pp.86.2-86.2
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    • 2011
  • 저온형 연료전지인 직접 메탄올 연료전지(Direct Methanol Fuel Cells, DMFC)는 친환경적인 발전 시스템, 높은 에너지 효율의 장점 때문에 주목을 받고 있으나 연료극의 촉매로 사용되는 금속은 고가의 귀금속인 Pt와 Ru가 요구되어 제조비용이 비싸기 때문에 촉매의 양을 줄이고, 반응 도중 생성되는 CO에 의한 촉매의 피독 문제 등 해결하여야 할 점이 산적해 있어 연료전지 중 촉매의 활성을 높이는 연구들이 활발히 이루어지고 있다. 종래의 MEA의 촉매층 제조공정은 우선 환원석출법에 의해 Pt-Ru/C를 합성하고 Nafion 용액에 혼합하여 Pt-Ru/C 슬러리를 제조한다. 이 방법에서는 carbon sheet에 spray 방법으로 Pt-Ru/C 촉매층이 만들어지기 때문에, Pt-Ru 촉매가 Nafion에 의해 부분적으로 매몰되어 촉매의 전기화학적 활성이 떨어지는 문제점이 있다. 이를 해결하는 방안으로 펄스전류를 이용하여 Pt-Ru 합금입자를 carbon sheet에 전기화학적으로 담지 시켜 Nafion에 매몰되는 것을 방지하는 펄스전해법 연구가 진행되고 있다. 그러나 촉매의 입자크기가 일반적으로 50~70 nm 이상으 크기 때문에 촉매의 낮은 활성이 문제점으로 야기되고 있다. 본 연구에서는 Pt-Ru/C 촉매층 제조 문제점을 해결하고, 촉매의 전기화학적 활성을 증가시키기 위해서 2~4 nm Pt-Ru 콜로이드를 전해액으로 사용하고, 전기영동법을 이용하여 Pt-Ru 나노 입자를 carbon sheet($1{\times}1cm^2$) 에 담지 시켰다. 전기영동법에서 균일한 Pt-Ru 촉매층의 제조를 위해 전류인가 방법으로는 펄스전류를 사용하였고, 실험변수로는 전해액 pH, duty cycle, 담지시간을 선정하였다. 합성된 Pt-Ru 콜로이드를 TEM분석으로 나노입자의 크기와 분산성 분석하였고, 콜로이드 나노입자의 표면전하 상태를 분석하기 위해 zeta-potential을 분석하였다. Pt-Ru/C의 촉매의 전기화학적 활성을 분석하기 위하여 0.5 M H_2SO_4$ 와 1 M $CH_3OH$ 혼합용액에 CV(Cyclic Voltammetry)실시하였고, carbon sheet 전극 상 Pt-Ru의 분산성 확인을 위하여 FE-SEM분석을 수행하였다.

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Metal-induced Crystallization of Amorphous Semiconductor on Glass Synthesized by Combination of PIII&D and HiPIMS Process

  • Jeon, Jun-Hong;Choi, Jin-Young;Park, Won-Woong;Moon, Sun-Woo;Lim, Sang-Ho;Han, Seung-Hee
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.286-286
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    • 2011
  • 최근 폴리머를 기판으로 하는 Flexible TFT (thin film transistor)나 3D-ULSI (three dimensional ultra large-scale integrated circuit)에서 높은 에너지 소비효율과, 빠른 반응 속도를 실현 시키기 위해 낮은 비저항(resistivity)을 가지며, 높은 홀 속도(carrier hall mobility)를 가지는 다결정 반도체 박막(poly-crystalline thin film)을 만들고자 하고 있다. 이를 실현 시키기 위해서는 높은 온도에서 장시간의 열처리가 필요하며, 이는 폴리머 기판의 문제점을 야기시킬 뿐 아니라 공정시간이 길다는 단점이 있었다. 이에 반도체 박막의 재결정화 온도를 낮춰주는 metal (Al, Ni, Co, Cu, Ag, Pd etc.,)을 이용하여 결정화 시키는 방법이 많이 연구 되어지고 있지만, 이 또한 재결정화가 이루어진 반도체 박막 안에 잔여 금속(residual metal)이 존재하게 되어 비저항을 높이고, 홀 속도를 감소시키는 단점이 있다. 이에 본 실험은 HiPIMS (High power impulse magnetron sputtering)와 PIII and D (plasma immersion ion implantation and deposition) 공정을 복합시킨 프로세스로 적은양의 금속이온주입을 통하여 재결정화 온도를 낮췄을 뿐 아니라, 잔여 하는 금속의 양도 매우 적은 다결정 반도체 박막을 만들 수 있었다. 분석 장비로는 박막의 결정화도를 측정하기 위해 GAXRD (glancing angle X-ray diffractometer)를 사용하였고, 잔여 하는 금속의 양과 화학적 결합 상태를 알아보기 위해 XPS를 통해 분석을 하였다. 마지막으로 홀 속도와 비저항을 측정하기 위해 Hall measurement와 Four-point prove를 사용하였다.

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Metal-induced Crystallization of Amorphous Ge on Glass Synthesized by Combination of PIII&D and HIPIMS Process

  • Jeon, Jun-Hong;Kim, Eun-Kyeom;Choi, Jin-Young;Park, Won-Woong;Moon, Sun-Woo;Lim, Sang-Ho;Han, Seung-Hee
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.144-144
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    • 2012
  • 최근 폴리머를 기판으로 하는 고속 Flexible TFT (Thin film transistor)나 고효율의 박막 태양전지(Thin film solar cell)를 실현시키기 위해 낮은 비저항(resistivity)을 가지며, 높은 홀 속도(carrier hall mobility)와 긴 이동거리를 가지는 다결정 반도체 박막(poly-crystalline semiconductor thin film)을 만들고자 하고 있다. 지금까지 다결정 박막 반도체를 만들기 위해서는 비교적 높은 온도에서 장시간의 열처리가 필요했으며, 이는 폴리머 기판의 문제점을 야기시킬 뿐 아니라 공정시간이 길다는 단점이 있었다. 이에 반도체 박막의 재결정화 온도를 낮추어 주는 metal (Al, Ni, Co, Cu, Ag, Pd, etc.)을 이용하여 결정화시키는 방법(MIC)이 많이 연구되어지고 있지만, 이 또한 재결정화가 이루어진 반도체 박막 안에 잔류 금속(residual metal)이 존재하게 되어 비저항을 높이고, 홀 속도와 이동거리를 감소시키는 단점이 있다. 이에 본 실험은, 종래의 MIC 결정화 방법에서 이용되어진 금속 증착막을 이용하는 대신, HIPIMS (High power impulse magnetron sputtering)와 PIII&D (Plasma immersion ion implantation and deposition) 공정을 복합시킨 방법으로 적은 양의 알루미늄을 이온주입함으로써 재결정화 온도를 낮추었을 뿐 아니라, 잔류하는 금속의 양도 매우 적은 다결정 반도체 박막을 만들 수 있었다. 분석 장비로는 박막의 결정화도를 측정하기 위해 GIXRD (Glazing incident x-ray diffraction analysis)와 Raman 분광분석법을 사용하였고, 잔류하는 금속의 양과 화학적 결합 상태를 알아보기 위해 XPS (X-ray photoelectron spectroscopy)를 통한 분석을 하였다. 또한, 표면 상태와 막의 성장 상태를 확인하기 위하여 HRTEM(High resolution transmission electron microscopy)를 통하여 관찰하였다.

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In-Situ Dry-cleaning (ISD) Monitoring of Amorphous Carbon Layer (ACL) Coated Chamber

  • Lee, Ho-Jae;Park, George O.;Hong, Sang-Jeen
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.183-183
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    • 2012
  • In the era of 45 nm or beyond technology, conventional etch mask using photoresist showed its limitation of etch mask pattern collapse as well as pattern erosion, thus hard mask in etching became necessary for precise control of etch pattern geometry. Currently available hard mask materials are amorphous carbon and polymetric materials spin-on containing carbon or silicon. Amorphous carbon layer (ACL) deposited by PECVD for etch hard mask has appeared in manufacturing, but spin-on carbon (SOC) was also suggested to alleviate concerns of particle, throughput, and cost of ownership (COO) [1]. SOC provides some benefits of reduced process steps, but it also faced with wiggling on a sidewall profile. Diamond like carbon (DLC) was also evaluated for substituting ACL, but etching selectivity of ACL was better than DLC although DLC has superior optical property [2]. Developing a novel material for pattern hard mask is very important in material research, but it is also worthwhile eliminating a potential issue to continuously develop currently existing technology. In this paper, we investigated in-situ dry-cleaning (ISD) monitoring of ACL coated process chamber. End time detection of chamber cleaning not only provides a confidence that the process chamber is being cleaned, but also contributes to minimize wait time waste (WOW). Employing Challenger 300ST, a 300mm ACL PECVD manufactured by TES, a series of experimental chamber cleaning runs was performed after several deposition processes in the deposited film thickness of $2000{\AA}$ and $5000{\AA}$. Ar Actinometry and principle component analysis (PCA) were applied to derive integrated and intuitive trace signal, and the result showed that previously operated cleaning run time can be reduced by more than 20% by employing real-time monitoring in ISD process.

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Liquid Velocity and Local Fouling in Coagulation-submerged Microfiltration Module for Drinking Water Treatment (정수처리를 위한 응집-침지식 정밀여과 모듈의 유체유속 및 국부오염)

  • Choi, Youngkeun;Kim, Hyun-Chul;Noh, Soohong
    • Membrane Journal
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    • v.25 no.3
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    • pp.268-275
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    • 2015
  • Effects of aeration intensity on local fouling were investigated in submerged membrane modules. Higher liquid velocities were observed at the section with the lower fiber packing density. The liquid velocity is increased with increasing the gas-liquid injection factor. The high shear stress coincided with the high liquid velocity. The shear stress increases with the increasing of gas-liquid injection factor and the liquid velocity improves with the increasing of gas-liquid injection factor. Irreversible fouling resistance ($R_{ir}$) of the fiber position is significant in a local region of high suction pressure near the suction point of the fiber (position 1). The ratio of $R_{ir}/R_m$ and $R_{ir}/R_r$ of position 1 was highest compared to the position 2 and 3. Irreversible fouling resistances results confirmed the preferential deposition of foulants near the suction part of the fiber where the local suction pressure is the highest and correspondingly, more particles are accumulated to the membrane surface. The effects of local fouling along the fiber length are significant factors to optimize the design of submerged modules.

Gas Permeation and Steam Stability of Ga Salt Doped Silica Membrane by Chemical Vapor Deposition (CVD 법으로 제조한 실리카 막의 Ga 염 첨가에 따른 스팀안정성 및 기체투과특성)

  • Ryu, Seung Hee;Lee, Yong Taek
    • Membrane Journal
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    • v.22 no.6
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    • pp.424-434
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    • 2012
  • In this study, a ceramic membrane was prepared by CVD. Tube type alpha alumina support was used for substrate and added the Ga salt in intermediate layer. Synthesized method was counter diffusion CVD method at $650^{\circ}C$ with tetramethylorthosilane (TMOS). Gas permeation was measured at $600^{\circ}C$ using single-component $H_2$, $N_2$, $CO_2$ and $CH_4$. During the steam treatment, $H_2/N_2$ permselectivity of non-Ga silica membrane was decreased 926 to 829 at $600^{\circ}C$. On the other hand $H_2/N_2$ permselectivity of added Ga silica membrane was stable 910 to 904 at $600^{\circ}C$. These results show that the metal-doped membranes improved steam stability for gas separation.

Deposition of Spacer-Si3N4 Thin Film for WSi2 Word-Line and Bit-Line (WSi2 word-line 및 bit-line용 spacer-Si3N4 박막의 증착)

  • Ahn S.;Kim D.W.;Kim J.H;Ahn S.J.;Kim Y.J.;Kim H.S.
    • Korean Journal of Materials Research
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    • v.14 no.6
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    • pp.402-406
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    • 2004
  • $WSi_2$, $TiSi_2$, $CoSi_2$, and $TaSi_2$ are general silicides used today in semiconductor devices. $WSi_2$ thin films have been proposed, studied and used recently in CMOS technology extensively to reduce sheet resistance of polysilicon and $n^{+}$ region. However, there are several serious problems encountered because $WSi_2$ is oxidized and forms a native oxide layer at the interface between $WSi_2$ and $Si_3$$N_4$. In this study, we have introduced 20 $slm-N_2$ gas from top to bottom of the furnace in order to control native oxide films between $WSi_2$ and $Si_3$$N_4$ film. In resulting SEM photographs, we have observed that the native oxide films at the surface of $WSi_2$ film are removed using the long injector system.

Characteristic Comparison of MAZO and MIZO Thin Films with Mg and ZnO Variation (Mg와 ZnO 함량변화에 따른 MAZO, MIZO 박막의 특성비교)

  • Jang, Jun Sung;Kim, In Young;Jeong, Chae Hwan;Moon, Jong Ha;Kim, Jin Hyeok
    • Current Photovoltaic Research
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    • v.3 no.3
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    • pp.101-105
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    • 2015
  • ZnO is gathering great interest for large square optoelectrical devices of flat panel display (FHD) and solar cell as a transparent conductive oxide (TCO). Herewith, Mg and IIIA (Al, In) co-doped ZnO films were prepared on SLG substrate using RF magnetron sputtering system. The effect of variation of atomic weight % of Mg and ZnO have been investigated. The atomic weight % Al and In are of 3% and kept constant throughout. The numbers of samples were prepared according to their different contents, which are $M_{3%}AZO_{94%}$, $M_{4%}AZO_{93%}-(MAZO)$ and $M_{3%}IZO_{94%}$, $M_{4%}IZO_{93%}-(MIZO)$ respectively. A RF power of 225 W and working pressure of 6 m Torr was used for the deposition at $300^{\circ}C$. All of the two thin film show good uniformity in field emission scanning electron microscopy image. $M_{3%}AZO_{94%}$ thin film shows overall better performance among the all. The film shows the best lowest resistivity, carrier concentration, mobility and Sheet resistance and is found to be are of $8.16{\times}10^{-4}{\Omega}cm$, $4.372{\times}10^{20}/cm^3$, $17.5cm^2/vs$ and $8.9{\Omega}/sq$ respectively. Also $M_{3%}AZO_{94%}$ thin film shows the relatively high optical band gap energy of 3.7 eV with high transmittance more than 80% in visible region required for the better solar cell performance.

A Study on the Genesis of Eonyang Amethyst Deposits (언양(彦陽) 자수정 광상(鑛床)의 성인(成因)에 관한 연구(硏究))

  • Youn, Seok-Tai;Park, Hee-In
    • Economic and Environmental Geology
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    • v.27 no.4
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    • pp.335-343
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    • 1994
  • The Eonyang amethyst deposits are composed of vug quartz emplaced in the Eonyang granites of Mesozoic Cretaceous age. The Eonyang granites are composed of biotite granite, porphyritic biotite granite, aplite and miarolitic granite. The petrochemical data of the Eonyang granites show the trend of subalkaline magma, calc-alkaline magma, I-type granitoid and magnetite series. The vug quartz show the characteristic growth zoning (white quartz-smoky quartz-amethyst) from wall side. Generally fluid inclusions in the vug quartz can be divided into four main types based on compositions (I-type: gas inclusion, II-type: liquid inclusion, III-type: polyphase inclusion, IV-type: liquid $CO_2$-bearing inclusion). Solid phase of polyphase inclusions are halite(NaCl), sylvite(KCl), hematite ($Fe_2O_3$) and unknown anisotropic solid. Homogenization temperatures inferred from the fluid inclusion study ranges from $440^{\circ}C$ to $485^{\circ}C$ in white quartz, from $227^{\circ}C$ to $384^{\circ}C$ in smoky quartz, from $133^{\circ}C$ to $186^{\circ}C$ in amethyst, respectively. Salinities of fluid inclusions in each mineralization stages ranges from 40 wt.% to 58 wt.% in white and smoky quartz, from 1.0 wt.% to 8.7 wt.% in amethyst respectively. A consideration of the pressure regime during vug quartz deposition based on the boiling evidence suggests lithostatic pressure of less than 72 bars. This range of pressure indicate that vug quartz lay at depth of 750 m below the surface at the during mineralization.

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Evaluation of the formation and occupation of Gosan-ri archaeological site in Jeju Island using OSL dating (OSL 연대측정을 통한 제주 고산리 유적의 형성과 점유시기 결정)

  • Kim, Myung-Jin
    • Analytical Science and Technology
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    • v.29 no.6
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    • pp.269-276
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    • 2016
  • Gosan-ri site is known as the early Neolithic cultural heritage, in which an archaic plainware, called as the Gosan-ri-type pottery, was excavated regarding as the first pottery manufactured in Korea. In this study, OSL dating was carried out to five soil layer samples collected in stratigraphic cross-section for evaluating the formation and occupation of the Gosan-ri site. Paleodose of each soil sample was calculated using the single aliquot regenerative dose (SAR) method with preheat of $220^{\circ}C$ and finally determined using maximum age model, considering its deposition process. The OSL age was determined from the ratio of paleodose to annual dose rate. From the resultant OSL ages and the related 14C dates, it was concluded that the Gosan-ri site was formed after 9,000 BC and a variety of cultural feature including the Gosan-ri-type pottery were occupied ranging from the early Neolithic to the middle of 4,000 BC. Finally, the Gosan-ri site was discarded in the middle of 4,000 BC and has been arrived at present through natural deposits.