• Title/Summary/Keyword: Chemical conditioning

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Development of Conditioning for Small Red Muscle Fish Using Kimchi Seasoning Ingredients and Organic acids 1. Chemical Changes during Conditioning in Conditioned Saury with Kimchi Seasoning and Organic acids (김치양념과 유기산을 이용한 소형 적색육어 조미숙성제품 개발 1. 꽁치 조미제품의 숙성 중 화학적 변화)

  • JEONG In-Hak;LIM Yeong-Seon
    • Korean Journal of Fisheries and Aquatic Sciences
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    • v.34 no.4
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    • pp.309-314
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    • 2001
  • In order to promote the consumption of small red muscle fish, such as saury, sardine, herring, etc., a new conditioning technique to soften backbone and small bones was investigated by using kimchi seasoning ingredients and organic acids. In the conditioning process, various chemical changes were examined during 60 days at 15 days intervals, The decrease of moisture content and the increase of salt concentration in seasoned fish meat were good correlated respectively. In the dry salt conditioning, the moisture content was more rapidly decreased than wet salt conditioning. The pH of fish meat during conditioning were more slowly decreased in dry salting than in wet salting. The VBN contents were suppressed under 30 mg/100 g in dry salt conditioning during 60 days at $5^{\circ}C$. The addition of rice bran in dry salting was effective on retarding lipid oxidation because the TBA value was most effectively retarded.

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The Pad Recovery as a function of Diamond Shape on Diamond Disk for Metal CMP (Metal CMP 용 컨디셔너 디스크 표면에 존재하는 다이아몬드의 형상이 미치는 패드 회복력 변화)

  • Kim, Kyu-Chae;Kang, Young-Jae;Yu, Young-Sam;Park, Jin-Goo;Won, Young-Man;Oh, Kwang-Ho
    • Journal of the Microelectronics and Packaging Society
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    • v.13 no.3 s.40
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    • pp.47-51
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    • 2006
  • Recently, CMP (Chemical Mechanical Polishing) is one of very important processing in semiconductor technology because of large integration and application of design role. CMP is a planarization process of wafer surface using the chemical and mechanical reactions. One of the most important components of the CMP system is the polishing pad. During the CMP process, the pad itself becomes smoother and glazing. Therefore it is necessary to have a pad conditioning process to refresh the pad surface, to remove slurry debris and to supply the fresh slurry on the surface. A conditioning disk is used during the pad conditioning. There are diamonds on the surface of diamond disk to remove slurry debris and to polish pad surface slightly, so density, shape and size of diamond are very important factors. In this study, we characterized diamond disk with 9 kinds of sample.

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A Study on the Ultrasonic Conditioning for Interlayer Dielectic CMP (층간절연막 CMP의 초음파 컨디셔닝 특성에 관한 연구)

  • 서헌덕;정해도;김형재;김호윤;이재석;황징연;안대균
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2000.05a
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    • pp.854-857
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    • 2000
  • Chemical Mechanical Polishing(CMP) has been accepted as one of the essential processes for VLSI fabrication. However, as the polishing process continues, pad pores get to be glazed by polishing residues, which hinder the supply of new slurry. This defect makes removal rate decrease with a number of polished wafer and the desired within-chip planarity, within wafer and wafer-to-wafer nonuniformity are unable to be achieved. So, pad conditioning is essential to overcome this defect. The eletroplated diamond grit disk is used as the conventional conditioner, And alumina long fiber, the .jet power of high pressure deionized water and vacuum compression are under investigation. But, these methods have the defects like scratches on wafer surface by out of diamond grits, subsidences of pad pores by over-conditioning, and the limits of conditioning effect. To improve these conditioning methods. this paper presents the Characteristics of Ultrasonic conditioning aided by cavitation.

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The Conditioning Behaviors of Diamond CVD Deposited Seramic CMP Conditioner (다이아몬드 CVD 증착에 의한 세라믹 CMP Conditioner의 Conditioning 거동)

  • Kang, Young-Jae;Eom, Dae-Hong;Park, Jum-Yong;Park, Jin-Gu;Ko, Soong;Myung, Beom-Young;Lee, Sang-Ik;Kwon, Pan-Gi
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2002.05a
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    • pp.270-273
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    • 2002
  • Conditioning은 CMP(Chemical Mechanical Planarization)에 필수적인 공정중의 하나이다. Conditioning의 목적은 removal rate와 uniformity를 CMP 공정 중에서 일정하게 유지시키는데 목적이 있다. 예전의 conditioning disks는 stainless steel substrate 위에 diamond 입자를 올리고 Ni전기도금을 결합시켜서 사용하였다. 그러나, CMP 공정 중에 Ni의분해로 인한 금속의 오염과 diamond abrasive의 분리로 인하여 scratch 문제가 발생하였다. 이 문제를 해결하기 위해서 ceramic substrate와 그것을 정밀 가공하는 기술을 응용함으로써 본래의 conditioning disks가 가지고 있는 diamond 입자의 분리와 metals 분해의 문제를 해결할 수 있게 되었다.

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Effect of Diamond Abrasive Shape of CMP Conditioner on Polishing Pad Surface Control (CMP 컨디셔너의 다이아몬드 입자 모양이 연마 패드 표면 형상 제어에 미치는 영향)

  • Lee, Donghwan;Lee, Kihun;Jeong, Seonho;Kim, Hyungjae;Cho, Hanchul;Jeong, Haedo
    • Tribology and Lubricants
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    • v.35 no.6
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    • pp.330-336
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    • 2019
  • Conditioning is a process involving pad surface scraping by a moving metallic disk that is electrodeposited with diamond abrasives. It is an indispensable process in chemical-mechanical planarization, which regulates the pad roughness by removing the surface residues. Additionally, conditioning maintains the material removal rates and increases the pad lifetime. As the conditioning continues, the pad profile becomes unevenly to be deformed, which causes poor polishing quality. Simulation calculates the density at which the diamond abrasives on the conditioner scratch the unit area on the pad. It can predict the profile deformation through the control of conditioner dwell time. Previously, this effect of the diamond shape on conditioning has been investigated with regard to microscopic areas, such as surface roughness, rather than global pad-profile deformation. In this study, the effect of diamond shape on the pad profile is evaluated by comparing the simulated and experimental conditioning using two conditioners: a) random-shaped abrasive conditioner (RSC) and b) uniform-shaped abrasive conditioner (USC). Consequently, it is confirmed that the USC is incapable of controlling the pad profile, which is consistent with the simulation results.

Modeling of the Conditioning Process in Chemical Mechanical Polishing (컨디셔닝 공정의 수학적 모델링)

  • Chang, One-Moon;Park, Ki-Hyun;Lee, Hyun-Seop;Jung, Won-Duck;Park, Sung-Min;Park, Boum-Young;Seo, Heon-Deok;Kim, Hyoung-Jea;Jeong, Hae-Do
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.569-570
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    • 2006
  • The conditioning process is very important process for the CMP (Chemical Mechaning Polishing). This process regenerates the roughness of the polishing pad during the CMP process, increases the MRR (Material Removal Rate) and gives us longer pad life so conditioning process is essential for the CMP, and conditioning process influences the polishing pad shape gradually. Conditining process is related to the Non-Uniformity. In This paper, Kinematic of the conditioning process and mathematic modeling of the pad wear is studied and result shows how the various parameters influence the pad shape and WIWNU[1]. Consequently through these parameter, optimal design of the conditioning process equipment is predicted.

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