• 대한화학회지
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• 제53권2호
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• pp.166-174
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• 2009

양자화학에는 추상적이거나 비직관적인 개념이 많이 존재하여 학생들이 이해하기에 어려움 을 준다. 다행히, 전통적인 강의실에서의 강의를 보조할 멀티미디어 웹 응용프로그램을 제작할 강력한 도구들이 웹 기술의 발전으로 많이 생겼다. 이 논문에서는 이 문제를 다루는 한 방안으로서 쇽웨이브 기술을 이용하여 웹 브라우저 상에서 쌍방향 시뮬레이션과 시각화를 동시에 해결하는 방법을 제시한 다. 여러 예를 통하여 어떻게 쇽웨이브 기술의 특성을 이용하여 웹에 기반을 둔 학습 자료를 용이하게 개발하는가를 보여준다.

• Bulletin of the Korean Chemical Society
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• 제30권4호
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• pp.882-886
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• 2009

The electrode contact poling is one of the efficient tools to induce a stable polar order of nonlinear optical (NLO) chromophores in the solid film. Self-assembled NLO chromophores with high electro-optic (E-O) activities were utilized for quantitative determination of the chromophore order induced under contact poling by spectroscopic changes. We found that NLO chromophores rarely decompose under the high electric field during contact poling. The absorption spectra were de-convoluted into a sum of Gaussian components to separate energy transitions for a binary composite system which contains a secondary guest chromophore AJC146 in the self-assembled chromophore HDFD. Poling efficiency was significantly improved in the binary system compared to the individual components.

• 한국표면공학회지
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• 제29권5호
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• pp.314-324
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• 1996

Scanning probe microscopes (SPMs) such as the scanning tunneling microscope (STM) and the atomic force microscope (AFM) were used for surface modification tools at the nanometer scale. Material surfaces, i. e., titanium, hydrogen-terminated silicon and trimethylsilyl organosilane monolayer on silicon, were locally oxidized with the best lateral spatial resolution of 20nm. The principle behind this proximal probe oxidation method is scanning probe anodization, that is, the SPM tip-sample junction connected through a water column acting as a minute electrochemical cell. An SPM-nanolithogrphy process was demonstrated using the organosilane monolayer as a resist. Area-selective chemical modifications, i. e., etching, electroless plating with gold, monolayer deposition and immobilization of latex nanoparticles; were achieved in nano-scale resolution. The area-selectivity was based on the differences in chemical properties between the SPM-modified and unmodified regions.

• 한국안전학회지
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• 제23권6호
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• pp.1-6
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• 2008

Machine operator and quality are affected by chip during cutting process to product machine parts. This paper presents a study of the influence of cutting conditions on the surface roughness obtained by turning using Taguchi method for safety of turning operator. In the machining of titanium alloy, high cutting temperature and strong chemical affinity between the tool and the work material are generated because of its low thermal conductivity and chemical reactivity. Therefore titanium alloys are known as difficult-to materials. An orthogonal array, the signal-to-noise ratio, the analysis of variance are employed to investigate the cutting characteristics of implant material bars using tungsten carbide cutting tools of throwaway type. Also Experimental results by orthogonal array are compared with optimal condition to evaluate advanced reliability. Required simulations and experiments are performed, and the results are investigated.

• Tribology and Lubricants
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• 제4권2호
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• pp.44-51
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• 1988

Titanium carbide(TiC), Titanium nitride(TiN), and Titanium carbonnitride(Ti(C,N)) films were deposited on $Si_3N_4$-TiC composite cutting tools by chemical vapor deposition(CVD) using $TiCl_4-CH_4-H_2$, $TiCl_4-N_2-H_2$, and $TiCl_4-CH_4-N_2-H_2$ gas mixtures, respectively. The experimental results indicate that TiC coatings compared with TiN coatings on $Si_3N_4$ -TiC ceramic have an improved microstructural property, good thermal shock resistance, and good interfacial bonding. However TiN coatings compared with TiC coatings have a low friction coefficient with steel and good chemical stability. It is found by cutting test that coated insert compared with $Si_3N_4$-TiC ceramic have a superior flank and crater wear resistance. And multilayer coating compared with monolayer coating shows a improved wear resistance.

• Bulletin of the Korean Chemical Society
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• 제10권1호
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• pp.30-32
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• 1989

Traces of nine elements, gold, arsenic, cobalt, chromium, copper, europium, hafnium, sodium and antimony in commercially available silicon crystals were determined by the instrumental neutron activation analysis using the single comparator method. The values of the concentrations of these elements in both single and polycrystals were found to decrease significantly to a low limiting level by simply washing and etching surface contaminants having been introduced during various steps of sample preparation and irradiation. However, the chromium levels in polycrystals were not easily decreased, these depending upon the cutting tools employed. The Sb-doped content in each semiconductor has been compared with the associated quantities such as the concentration and the conductivity range given by the sample donor. Uncertainty in the sodium analysis due to the fission neutron reaction by silicon itself was discussed.

• 대한화학회지
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• 제63권2호
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• pp.78-84
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• 2019

High-resolution $^1H$ NMR spectroscopic technique has been widely used as one of the most powerful analytical tools in food chemistry as well as to define molecular structure. The $^1H$ NMR spectra-based metabolomics has focused on classification and chemometric analysis of complex mixtures. The principal component analysis (PCA), an unsupervised clustering method and used to reduce the dimensionality of multivariate data, facilitates direct peak quantitation and pattern recognition. Using a combination of these techniques, the various green teas and black teas brewed were investigated via metabolite profiling. These teas were characterized based on the leaf size and country of cultivation, respectively.

• Bulletin of the Korean Chemical Society
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• 제11권4호
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• pp.290-296
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• 1990

Ion-surface collision studies at low kinetic energies (1-100 eV) provide a unique opportunity for investigating reactions and collision dynamics at surfaces. A special ion optics system for generating an energy- and mass-selected ion beam of this energy is designed and constructed. An ultrahigh vacuum (UHV) reaction chamber, in which the ions generated from the beamline collide with a solid surface, is equipped with Auger electron spectroscopy (AES) and thermal desorption spectrometry (TDS) as in-situ surface analytical tools. The resulting beam from the system has the following characteristics : ion current of 5-50 nA, energy spread < 2eV, current stability within ${\pm}5%,$ and unit mass resolution below 20 amu. The performance of the instrument is illustrated with data representing the implantation behavior of $Ar^+$ into a graphite (0001) surface.

• 천문학회보
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• 제44권2호
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• pp.50.1-50.1
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• 2019

Ultra Metal-Poor (UMP; [Fe/H] < -4.0) stars are thought to be true second generation of stars. Thus, the chemistry and kinematics of these stars serve as powerful tools to understand the early evolution of the Milky Way (MW). However, only about 40 of these stars have been discovered thus far. To increase the number of these stars, we selected UMP candidates from low-resolution spectra (R ~ 2000) of the Sloan Digital Sky Survey (SDSS) and Large Sky Area Multi-Object Fibre Spectroscopic Telescope (LAMOST), and performed high-resolution (R ~ 40,000) spectroscopic follow-ups with Gemini/GARACES. In this study, we present chemical and kinematic properties of the observed UMP candidates, and infer the nature of their progenitors to trace the chemical enrichment history of the MW.

• Current Photovoltaic Research
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• 제4권1호
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• pp.21-24
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• 2016

Chalcopyrite based (CIGS) thin films have considered to be a promising candidates for industrial applications. The growth of quality CIGS thin films without secondary phases is very important for further efficiency improvements. But, the identification of complex secondary phases present in the entire film is crucial issue due to the lack of powerful characterization tools. Even though X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and normal Raman spectroscopy provide the information about the secondary phases, they provide insufficient information because of their resolution problem and complexity in analyzation. Among the above tools, a normal Raman spectroscopy is better for analysis of secondary phases. However, Raman signal provide the information in 300 nm depth of film even the thickness of film is > $1{\mu}m$. For this reason, the information from Raman spectroscopy can't represent the properties of whole film. In this regard, the authors introduce a new way for identification of secondary phases in CIGS film using depth Raman analysis. The CIGS thin films were prepared using DC-sputtering followed by selenization process in 10 min time under $1{\times}10^{-3}torr$ pressure. As-prepared films were polished using a dimple grinder which expanded the $2{\mu}m$ thick films into about 1mm that is more than enough to resolve the depth distribution. Raman analysis indicated that the CIGS film showed different secondary phases such as, $CuIn_3Se_5$, $CuInSe_2$, InSe and CuSe, presented in different depths of the film whereas XPS gave complex information about the phases. Therefore, the present work emphasized that the Raman depth profile tool is more efficient for identification of secondary phases in CIGS thin film.