• Journal of the Microelectronics and Packaging Society
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• v.3 no.2
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• pp.1-6
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• 1996

최근 Cellular phone시장을 가장 주도적으로 이끌어 오고 눈부신 발전을 가져온 것 은 역시 개인 휴대형 Cellular phone이라 할수 있을 것이다. Cellular phone의 기본목표인 언제나, 어디서나, 누구라도라는 목표에 정확하게 부합할 수 있었기 때문이라 생각한다. 특 히 그 사용형태가 개인 휴대형이기 때문에 사용자들은 보다 소형화, 경량화, 다기능화를 요 구했고 Cellular phone의 제조 Maker들은 그 요구에 부응할 수 있는 제품을 설계하고 생산, 판매하는데 주력해오고 있다. 휴대전화에 있어서 소형화, 경량화를 주도해온 요인으로서 가 장 큰 역할을 해온 것은 어느 것이 먼저라기 보다 PWB의 수량감소, 다층화, 고밀도화, Flexible화, 실장부품의 소형화, Chip화에 따라 부품탑재기의 고속화 정밀화등 다양화된 새 로운 실장기술이 부합되어 현재, 향후는 더욱개선될것이라 사료된다. 그래서 이번 원고에서 는 휴대전호기만이 아니라 일반통신기기 및 민생용 기판의 실장기술 및 납땜품질, 생산성, 효율등을 위해서 표면실장공정 삽입실장공정에서 발생되고 있는 문제의 50%이상을 점유하 는 납땜에 대한 문제를 사전에 예방하여 표면실장 기술력을 높이는 것이 더욱 중여하다는 사실에 역점을 두고 당사생산 Model인 H500 Series에 대한 기본을 기술한다.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2013.05a
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• pp.451-452
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• 2013

• Journal of the Korean Society for Precision Engineering
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• v.30 no.9
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• pp.893-899
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• 2013

Recently, the requirement of automation in the cell production system is increasing due to a decrease of skilled workers who are the key point of a cell production system. This paper proposes a dual-arm robot designed and implemented with consideration of being applied to a cell production line of cellular phone. A specification was derived from the analysis of production process and the consideration of configuration for human-robot cooperation. Design and implementation results of the proposed dual-arm robot were suggested and the feasibility was verified through the demonstration of the proposed robot in some of packaging job of cellular phone.

• Journal of the Microelectronics and Packaging Society
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• v.8 no.1
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• pp.19-25
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• 2001

In this paper, the design and simulation results of IF frequency synthesizer section has been described. We has been used 0.8 $\mu\textrm{m}$ BiCMOS device and library of the AMS. IF frequency synthesizer section has been contained IF VCO, Phase Detector, Divide_by_8, Charge Pump and Loop Filter. IF frequency synthesizer has been shown operating voltage of 2.7~3.6 V, control voltage of 0.5~2.7 V and supply current of 11 mA. The measured results have been showed good agreement with the simulation results about supply current.

• Proceedings of the KSME Conference
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• 2007.05b
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• pp.2333-2337
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• 2007

The practical studies on the method of particle contamination control for yield enhancement in the cleanroom were carried out. The method of the contamination control was considered, which is composed of data collection, data analysis, improvement action, verification, and implement control. The composition analysis for data collection and data analysis was used in the cellular phone module packaging lines. And this method was evaluated by the variation of yield loss between before and after improvement action. In case that the composition analysis was applied, the critical sources were selected and yield loss reduction through improvement actions was also investigated. From these results, it is concluded that the composition analysis is effective solutions for particle contamination control in the cleanroom.

• Journal of the Microelectronics and Packaging Society
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• v.15 no.3
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• pp.27-33
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• 2008

With increasing use of portable appliances such as PDA and cellular phone, changing environment of applications requires higher solder joint reliability. The ENIG (Electroless Nickel Immersion Gold) process has been widely used for fine pitch SMT (Surface Mount Technology) and BGA (Ball Grid Array) packaged devices due to its benefits including excellent solderability, high uniformity and substantial legibility throughout the packaging process. Its brittle fracture of solder, however, has received increasingly attentions. It was Down that fracture brittleness is mainly related with black pad resulting from galvanic nickel corrosion and P-enriched layer formation between the IMC (Intermetallic Compounds) and electroless nickel layer. Theoretically, smooth electroless Ni layer was blown to have a advantages in minimizing the black pad phenomenon by uniform solution exchange during immersion gold plating. Nevertheless, how to control the surface morphology of electroless Ni layer has been hardly blown. This study investigates an effect of surface morphology of Cu underlayer on surface morphology of electroless Ni layer. To obtain various kinds of surface morphology of Cu layer, two types of Cu etching chemical and a number of Cu etching treatment were applied.

• Journal of the Microelectronics and Packaging Society
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• v.16 no.3
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• pp.11-17
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• 2009

The drop impact reliability comes to be important for evaluation of the life time of mobile electronic products such as cellular phone. The drop impact reliability of solder joint is generally affected by the kinds of pad and reflow number, therefore, the reliability evaluation is needed. Drop impact test proposed by JEDEC has been used as a standard method, however, which requires high cost and long time. The drop impact reliability can be indirectly evaluated by using high speed shear test of solder joints. Solder joints formed on 3 kinds of surface finishes OSP (Organic Solderability Preservation), ENIG (Electroless Nickel Immersion Gold) and ENEPIG (Electroless Nickel Electroless Palladium Immersion Gold) was investigated. The shear strength was analysed with the morphology change of intermetallic compound (IMC) layer according to reflow number. The layer thickness of IMC was increased with the increase of reflow number, which resulted in the decrease of the high speed shear strength and impact energy. The order of the high speed shear strength and impact energy was ENEPIG > ENIG > OSP after the 1st reflow, and ENEPIG > OSP > ENIG after 8th reflow.