• Title/Summary/Keyword: Bottom-emitting

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Highly Efficient Top-Emitting Electrophosphorescent Organic Light-Emitting Devices

  • Lu, Min-Hao M.;Weaver, Michael S.;Zhou, Theodore X.;Rothman, Mark;Kwong, Raymond C.;Hack, Mike;Brown, Julie J.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.90-93
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    • 2002
  • We present both a theoretical analysis and experimental data to show that electrophosphorescent top-emitting organic light emitting-devices (TOLEDs) with a reflective anode and a transparent cathode can be more efficient than the equivalent state-of-the-art bottom-emitting electrophosphorescent OLEDs (PHOLEDs$^{TM}$). The lifetime of devices with transparent cathodes are shown to approach that of the corresponding bottom-emitting devices.

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Top emission inverted organic light emitting diodes with $N_{2}$ plasma treated Al bottom cathodes

  • Kho, Sam-Il;Shon, Sun-Young;Kwack, Jin-Ho;Jung, Dong-Geun
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.889-892
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    • 2003
  • Effects of $N_{2}$ plasma treatment of the Al bottom cathode on the characteristics of top emission inverted organic light emitting diodes (TEIOLEDs) were studied. TEIOLEDs were fabricated by depositing an Al bottom cathode, a tris-(8-hydroxyquinoline) aluminum $(Alq_{3})$ emitting layer, an N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1'-diphenyl-4,4'diamine (TPD) hole transport layer, and an indium tin oxide (ITO) top anode sequentially. The Al bottom cathode layer was subjected to $N_{2}$ plasma treatment before deposition of the $Alq_{3}$ layer. X-ray photoelectron spectroscopy suggested that the existence of and the amount of $AIN_x$ between the $Alq_{3}$ emitting layer and the Al bottom cathode significantly affect the characteristics of TEIOLEDs. The maximum external quantum efficiency of the TEIOLED with an Ai bottom cathode subjected to $N_{2}$ plasma treatment for 30 s was about twice as high as that of the TEIOLED with an untreated Al bottom cathode.

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Fabrications and Characterizations of InGaN/GaN Quantum Well Light Emitting Devices Including Photonic Crystal Nanocavity Structures (광결정 Nanocavity를 갖는 InGaN/GaN 양자우물구조의 청색 광소자 공정 및 특성평가)

  • Choi, Jae-Ho;Lee, Jung-Tack;Kim, Keun-Joo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.12
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    • pp.1045-1057
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    • 2009
  • The authors investigated the InGaN/GaN multi-quantum well blue light emitting devices with the implementation of the photonic crystals fabricated at the top surface of p-GaN layer and the bottom interface of n-GaN layer. The top photonic crystals result in the lattice-dependent photoluminescence spectra at the wavelength of 450 nm and however, the bottom photonic crystal shows a big shift of the photoluminescence peak from 444 nm to 394 nm. The sample with the bottom photonic crystal structure also shows the lasing effect at the wavelength of 468 nm. Furthermore, the quality enhancement for the crystal growth of GaN thin film on the bottom photonic crystal comes from the modulated compressive stress which was measured by the micro-Raman spectroscopy.

Layer Thickness-dependent Electrical and Optical Properties of Bottom- and Top-emission Organic Light-emitting Diodes

  • An, Hui-Chul;Na, Su-Hwan;Joo, Hyun-Woo;Kim, Tae-Wan
    • Transactions on Electrical and Electronic Materials
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    • v.10 no.1
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    • pp.28-30
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    • 2009
  • We have studied organic layer-thickness dependent electrical and optical properties of bottom- and top-emission devices. Bottom-emission device was made in a structure of ITO(170 nm)/TPD(x nm)/$Alq_3$(y nm)/LiF(0.5 nm)/Al(100 nm), and a top-emission device in a structure of glass/Al(100 nm)/TPD(x nm)/$Alq_3$(y nm)/LiF(0.5 nm)/Al(25 nm). A hole-transport layer of TPD (N,N'-diphenyl-N,N'-di(m-tolyl)-benzidine) was thermally deposited in a range of 35 nm and 65 nm, and an emissive layer of $Alq_3$ (tris-(8-hydroxyquinoline) aluminum) was successively deposited in a range of 50 nm and 100 nm. Thickness ratio between the hole-transport layer and the emissive layer was maintained to be 2:3, and a whole layer thickness was made to be in a range of 85 and 165 nm. From the current density-luminance-voltage characteristics of the bottom-emission devices, a proper thickness of the organic layer (55 nm thick TPD and 85 nm thick $Alq_3$ layer) was able to be determined. From the view-angle dependent emission spectrum of the bottom-emission device, the peak wavelength of the spectrum does not shift as the view angle increases. However, for the top-emission device, there is a blue shift in peak wavelength as the view angle increases when the total layer thickness is thicker than 140 nm. This blue shift is thought to be due to a microcavity effect in organic light-emitting diodes.

Bottom photonic crystals-dependent photoluminescence of InGaN/GaN Quantum-Well Blue LEDs (하부 광결정에 따른 InGaN/GaN 양자우물구조의 청색발광 다이오드 발광 특성)

  • Cho, Sung-Nam;Choi, Jae-Ho;Kim, Keun-Joo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.52-54
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    • 2008
  • The authors investigated the InGaN/GaN multi-quantum well blue light emitting diodes with the implements of the photonic crystals fabricated at the top surface of p-GaN layer or the bottom interface of n-GaN layer. The top photonic crystals result in the lattice-dependent photoluminescence spectra for the blue light emitting diodes, which have a wavelength of 450nm. However, the bottom photonic crystal shows a big shift of the photoluminescence peak from 444 nm to 504 nm and played as a role of quality enhancement for the crystal growth of GaN thin film. The micro-Raman spectroscopy shows the improved epitaxial quality of GaN thin film.

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An Inverted Bottom Emission Organic Light Emitting Device with a New Electron Injection Layer.

  • Lee, You-Jong;Kim, Joo-Hyung;Kwon, Soon-Nam;Hong, Mun-Pyo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.1023-1026
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    • 2007
  • Highly efficient inverted bottom emission organic light emitting device (IBOLED) with a structure of ITO/EIL/Alq3/NPB/WO3/Al was investigated. To enhance electron injection from ITO cathode to Alq3 EML layer, we introduced ultra thin Al layer and Liq layer between ITO and Alq3. The device characteristics showed tune on voltage of 4.5V, the maximum luminance of 21100 Cd/m2 and current efficiencies of 3.56 Cd/A.

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The Study of Luminescence Efficiency by change of OLED's Hole Transport Layer

  • Lee, Jung-Ho
    • International Journal of Precision Engineering and Manufacturing
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    • v.7 no.2
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    • pp.52-55
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    • 2006
  • The OLEDs(Organic Light-Emitting Diodes) structure organizes the bottom layer using glass, ITO(indium thin oxide), hole injection layer, hole transport layer, emitting material layer, electron transport layer, electron injection layer and cathode using metal. OLED has various advantages. OLEDs research has been divided into structural side and emitting material side. The amount of emitting light and luminescence efficiency has been improved by continuing effort for emitting material layer. The emitting light mechanism of OLEDs consists of electrons and holes injected from cathode and anode recombination in emitting material layer. The mobilities of injected electrons and holes are different. The mobility of holes is faster than that of electrons. In order to get high luminescence efficiency by recombine electrons and holes, the balance of their mobility must be set. The more complex thin film structure of OLED becomes, the more understanding about physical phenomenon in each interface is needed. This paper observed what the thickness change of hole transport layer has an affection through the below experiments. Moreover, this paper uses numerical analysis about carrier transport layer thickness change on the basis of these experimental results that agree with simulation results.

Top-emission Electroluminescent Devices based on Ga-doped ZnO Electrodes (Ga-doped ZnO 투명전극을 적용한 교류무기전계발광소자 특성 연구)

  • Lee, Wun Ho;Jang, Won Tae;Kim, Jong Su;Lee, Sang Nam
    • Journal of the Semiconductor & Display Technology
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    • v.16 no.2
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    • pp.44-48
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    • 2017
  • We explain optical and electrical properties of top and bottom-emission structured alternating-current powder electroluminescent devices (ACPELDs) with Ga-doped ZnO(GZO) transparent electrode. The top-emission ACPELDs were layered as the metal electrode/dielectric layer/emission layer/top transparent electrode and the bottom-emission ACPELDs were structured as the bottom transparent electrode/emission layer/dielectric layer/metal electrode. The yellow-emitting ZnS:Mn, Cu phosphor and the barium titanate dielectric layers were layered through the screen printing method. The GZO transparent electrode was deposited by the sputtering, its sheet resistivity is $275{\Omega}/{\Box}$. The transparency at the yellow EL peak was 98 % for GZO. Regardless of EL structures, EL spectra of ACPELDs were exponentially increased with increasing voltages and they were linearly increased with increasing frequencies. It suggests that the EL mechanism was attributed to the impact ionization by charges injected from the interface between emitting phosphor layer and the transparent electrode. The top-emission structure obtained higher EL intensity than the bottom-structure. In addition, charge densities for sinusoidal applied voltages were measured through Sawyer-Tower method.

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Long-lifetime Green Phosphorescent OLEDs for Low Power Displays

  • Weaver, Michael S.;Adamovich, Vadim I.;Xia, Sean C.;Fiordeliso, James J.;Kwong, Raymond C.;Brown, Julie J.;Lee, Kwan-Hee;Lim, Choon-Woo;Kim, Sung-Chul
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.38-41
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    • 2009
  • We demonstrate a new commercial green phosphorescent organic light emitting device (OLED) in a bottom emission device and top emission microcavity. The bottom and top emitting phosphorescent OLEDs (PHOLED$^{TM}$s) had luminance efficiencies of 60cd/A and 137cd/A respectively, at a luminance of 1,000cd/$m^2$. The top emission microcavity was close to 1953 NTSC color requirements with 1931 CIE color coordinates of 0.231, 0.718. A record green PHOLED lifetime of >3,500hrs to LT95 from 4000cd/$m^2$ is demonstrated for the microcavity device.

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Application of AZO electrode for bottom emission organic light emitting diode (AZO(ZnO-Ag-ZnO) 전극을 이용한 Bottom emission Organic Light Emitting Diode 제작)

  • Han, Jin-Woo;Seo, Dae-Shik;Kim, Yong-Hoon;Moon, Dae-Gyu;Han, Jeong-In
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.522-523
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    • 2005
  • Top emission OLED 소자에 사용되는 ITO(Indium-Tin-Oxide)의 저항을 개선하여 보다 낮은 저항을 가지는 전극을 제작하기 위해 AZO(ZnO-Ag-ZnO)를 제작하였다. AZO박막은 기존의 ITO박막이 수십 $\Omega$을 나타내던 것과 비교하여 $8\Omega$으로 매우 낮은 저항을 나타내었다. 투과율은 84%로 기존의 ITO박막과 유사한 성능을 나타내었다.

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