• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.21 no.4
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• pp.143-148
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• 2021

A systematic study of Bloch surface wave (BSW), which is created by guided mode resonance (GMR) of dielectric multilayer structures with a grating profile, is presented to analyze the sensing performance of bio-sensors. The effect of structural parameters on optical behavior is evaluated by using Babinet's principle and modal transmission-line theory. The sensitivity of designed bio-sensors is proportional to the grating constant at wavelength spectrum, and inversely proportional to the normal wave vector of incident electromagnetic wave at angular spectrum. Numerical results for two devices with SiO/SiO₂ and TiO₂/SiO₂ multilayer dielectric stacks are presented, showing that BSW can be exploited for the realization of efficient diffraction-based bio-sensors from infrared to visible-band range.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.05a
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• pp.143-144
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• 2015

Here we report the Ar-ion milling rates of ultrathin Si and GaAs single crystals. The thickness change is measured using convergent beam electron diffraction (CBED) technique with the help of Bloch wave simulation method. This study suggests the experimental procedures to determine the references for an etching rate to reduce a sample thickness or to remove the damaged sample surface using Ar-ion source.

• Journal of the Optical Society of Korea
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• v.16 no.3
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• pp.196-202
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• 2012

We observe that the transmission and reflection efficiencies of a one-dimensional metallic grating under transverse-magnetic illumination calculated using the Fourier modal method (FMM) with the Fourier factorization rules have peculiar fluctuations, albeit small in magnitude, as the number of field harmonics increases. It is shown that when the number of Fourier terms for the electromagnetic field is increased from that in the conventional FMM, the fluctuations due to non-convergent highly evanescent eigenmodes can be eliminated. Our examination reveals that the fluctuations originate from the Gibbs phenomenon inherent in the Fourier-series representation of a permittivity function with discontinuities, and from non-convergence of highly evanescent internal Bloch eigenmodes.

• Applied Microscopy
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• v.40 no.1
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• pp.21-28
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• 2010

In a simulation study of atomic resolution transmission electron microscope images of single layer and bilayer graphene, it is demonstrated that the conventional Bloch wave formulations can be used when high-order Laue zone reflections are properly taken into account in the theory. The simulated images for bilayer graphene show 3-fold rotational lattice symmetry rather than the 6-fold one under certain conditions. This result can be understood as revealed the 3-fold rotational lattice symmetry of bilayer graphene in three dimensions along [0001]. For single layer graphene the observed phase images showing 3-fold rotational lattice symmetry were particularly noted. This phenomenon has been explained by an assumption of the re-configuration of electron density on the surface of graphene. And the matching images have been obtained as simulated with up to the second order Laue zone reflections only, reflecting the re-configuration of electrons on the surface.