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A Simulation Study of Atomic Resolution TEM images for Two Dimensional Single Layer and Bilayer Graphene Crystal  

Kim, Hwang-Su (Department of Physics, Kyungsung University)
Publication Information
Applied Microscopy / v.40, no.1, 2010 , pp. 21-28 More about this Journal
Abstract
In a simulation study of atomic resolution transmission electron microscope images of single layer and bilayer graphene, it is demonstrated that the conventional Bloch wave formulations can be used when high-order Laue zone reflections are properly taken into account in the theory. The simulated images for bilayer graphene show 3-fold rotational lattice symmetry rather than the 6-fold one under certain conditions. This result can be understood as revealed the 3-fold rotational lattice symmetry of bilayer graphene in three dimensions along [0001]. For single layer graphene the observed phase images showing 3-fold rotational lattice symmetry were particularly noted. This phenomenon has been explained by an assumption of the re-configuration of electron density on the surface of graphene. And the matching images have been obtained as simulated with up to the second order Laue zone reflections only, reflecting the re-configuration of electrons on the surface.
Keywords
Atomic resolution image; Graphene; Higher-order Laue zone reflection;
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1 Dato A, Lee ZH, Jeon KJ, Erni R, Radmilovic V, Richardson TJ, Frenklach M. Clean and highly ordered graphene synthesized in the gas phase. Chem Commun 40 : 6095-6097, 2009.
2 Geim AK: Graphene: status and prospects. Science 324(5934) : 1530-1534, 2009.   DOI   ScienceOn
3 Allen LJ, McBride W, O'Leary NL, Oxley MP: Exit wave reconstruction at atomic resolution. Ultramicroscopy 100 : 91-104, 2004.   DOI   ScienceOn
4 Lee ZH, Dato A, Jeon KJ, Erni R, Richardson TJ, Frenklach M, Radmilovic V: Atomic resolution imaging and spectroscopy of graphene using the TEAM 0.5. Microsc. Microanal. 15(Suppl.2) : 124-125, 2009.   DOI
5 Rutter GM, Crain JN, Guisinger NP, First PN, Stroscio JA: Structure and electronic properties of bilayer epitaxial graphene. J Vac Sci Technol A 26(4) : 938-943, 2008.   DOI
6 Trucano P, Chen R: Structure of graphite by neutron diffraction. Nature 258(5531) : 136-137, 1975.   DOI
7 Zhang Y, Tang TT, Girit C, Hao Z, Martin MC, Zettl A, Crommie MF, Shen YR, Wang F: Direct observation of a widely tunable bandgap in bilayer graphene. Nature 459 : 820-823, 2009.   DOI   ScienceOn
8 Meyer JC, Chuvilin A, Kaiser U: Electron microscopic studies with graphene. Microsc. Microanal. 15(Suppl.2) : 126-127, 2009.   DOI
9 Meyer JC, Geim AK, Katsnelson MI, Novoselov KS, Booth TJ, Roth S: The structure of suspended of graphene sheets. Nature 446(7131) : 60-63, 2007.   DOI   ScienceOn
10 Lee CG, Wei X, Kysar JW, Hone J: Measurement of the elastic properties and intrinsic strength of monolayer graphene. Science 321 : 385-388, 2008.   DOI   ScienceOn
11 Jinschek J, Yucelen E, Kisielowski C: Cover image for single layer and bilayer graphene. Microscopy and Analysis (suppl.) Nov/Dec 2009 Asia/Pacific.
12 Allen LJ, Oxley MP and Ishizuka K: Electron microscope Cs correction using iterative wave-function reconstruction. Asia/Pacific Microscopy and Analysis 52 : 5-7, 2006.
13 Kim HS, Sheinin SS: Effects of higher-order Laue zone reflections on structure images. Proc. 51st Annual Meeting of MSA at San Francisco, pp. 450-451, 1993.
14 Kim HS: Effects of higher-order Laue zone reflections on HRTEM images for illumination along an off-zone axis of a crystal. Korean J. Electron Microscopy 37(4) : 259-269, 2007. (Korean)   과학기술학회마을
15 Girit C, Meyer JC, Erni R, Rossell MD, Kisielowski C, Yang L, Park CH, Crommie MF, Cohen ML, Louie SG, Zettl A: Graphene at the edge: stability and dynamics. Science 323 : 1705-1708, 2009.   DOI
16 Hirsch P, Howie A, Nicholson RB, Pashley DW, Whelan MJ: Electron Microscopy of Thin Crystals. Krieger Publ., Huntington (N.Y.) 1977.