• The Journal of the Korea institute of electronic communication sciences
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• v.14 no.6
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• pp.1031-1036
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• 2019

This study describes the technique of the beam pattern measurement of array antenna for VHF band radar using drone and active beam pattern measuring device. There is no anechoic chamber for measuring the beam pattern of a large size antenna in the country. In this study, to test the antenna beam pattern characteristics of the developed VHF band radar, the antenna beam pattern characteristics were tested by Drone mounting an Active Beam Pattern Measuring Device. By comparing the results of the pre-simulation analysis with the measured results for the antenna, we could confirm that the beamwidth and side-lobe characteristics are satisfactory. Through the antenna beam pattern measurement technology using Drone and Active Beam Pattern Measuring Device, the beam pattern measurement technology of array antenna of low frequency band and large antenna for low band radar will be used.

• Laser Solutions
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• v.18 no.3
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• pp.6-8
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• 2015

Finishing process includes deburring, polishing and edge radiusing. It improves the surface profile of specimen and eliminates the alien substance on surface. Deburring is the elimination process for debris of edges. Polishing lubricates surfaces by rubbing or chemical treatment. There are two types for electron finishing. The one is using pulse beam. The other is using the convergent and scanning electron beam. Pulse type device appropriates the large area process. But it does not control the beam dosage. Scanning type device has advantages for dosage control and edge deburring. We design the convergence and scan type. It has magnetic lenses for convergence and scan device for scanning beam. Magnetic lenses consist of convergent and objective lens. The lenses are designed by the specification(beam size and working distance). In this paper, we evaluate the convergence performance by pattern process. Also, we analysis the results and important factors for process. The important factors for process are beam size, pressure, stage speed and vacuum. These results will be utilized into systematizing pattern shape and the factors.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.10
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• pp.156-164
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• 1998

Electronic Speckle Pattern Interferometry(ESPI) has been used to measure surface deformations of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive technique, is capable of providing full-field results with high spatial resolution and high speed. One of the important application using electronic speckle pattern interferometry is electronic speckle contouring of a diffused object for 3-D shape analysis and topography measurement. Generally the electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and the shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. We also describe formation process of depth contour fringes and grid contour fringes by shifting direction of the two illumination beams. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring, and then, the electronic speckle contouring experiment with various specimens. For quantitative analysis of the contour fringes, we used 4-frame phase shifting method with PZT Finally, good agreement between the geometric analysis and experimetal results is obtained.

• Journal of the Korean Society of Industry Convergence
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• v.4 no.2
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• pp.149-155
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• 2001

The use of primitive cell volume and zero order Laue (ZOLZ) pattern is proposed to identify phase in a complex microstructure. Single convergent beam electron pattern containing higher order Laue zone ring from a nanosized region is sufficient to calculate the primitive cell volume of the phase, while ZOLZ pattern is used to determine the zone axis of the crystal. A computer program is used to screen out possible phases from the value of measured cell volume from convergent beam electron diffraction (CBED) pattern. Indexing of ZOLZ pattern follows in the program to find the zone axis of the identification from a single CBED pattern. An example of the analysis is given from the rapidly solidified $Al-Al_3Ti$ system.

• The Journal of The Korea Institute of Intelligent Transport Systems
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• v.3 no.1 s.4
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• pp.21-30
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• 2004

This paper describes the design of RF link between RSE and OBU of ETCS and the analysis of the antenna beam pattern to get a proper communication area in the cross direction and traveling direction of lanes. This stage should be performed prior to determination of system requirements of ITS service based on active DSRC. This study is important and fundamental technical analysis to design and implement base station of ETCS.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.397-401
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• 1995

ESPI(Electronic Speckle Pattern Interfermetry) is an optical technique to measure surface deforamtion of engineering components and materials in industrial ares. This optical method is capable of providing full-field results with high spatial resolution, high speed and is the non-contact technique. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The contouring method by modified dual-beam speckle pattern interferometry is proposed. We introduce a shift of the illumination beams through optical fiber in order to obtain the contour fringe patterns. The speckle pattern correlation technique is suitable for providing measurement range from millimeters to several centimeters. The complete geometric analysis of the contoretical and experimental results are obtained.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.10a
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• pp.593-597
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• 2005

FIB equipment can perform sputtering and chemical vapor deposition simultaneously. It is very advantageously used to fabricate a micro structure part having 3D shape because the minimum beam size of ${\phi}$ 10nm and smaller is available. Currently FIB is not being applied in the fabrication of this micro part because of some problems to redeposition and charging effect of the substrate causing reduction of accuracy with regards to shape and productivity. Furthermore, the prediction of the material removal rate information should be required but it has been insufficient for micro part fabrication. The paper have the targets that are FIB-CVD characteristic analysis and minimum line pattern resolution achievement fur 3D micro fabrication. We make conclusions with the analysis of the results of the experiment according to beam current, pattern size and scanning parameters. CVD of 8 pico ampere shows superior CVD yield but CVD of 1318 pico ampere shows the pattern sputtered. And dwell time is dominant parameter relating to CVD yield.

• Korean Journal of Optics and Photonics
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• v.31 no.6
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• pp.268-273
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• 2020

We analyze the characteristics of the coherent beam combination of lasers by monitoring the speckle pattern of the beam reflected from a scattering medium. Three collimated laser sources with high coherence are focused on a scattering target using a lens, and we then examine the speckle pattern of the returned beam in the Fourier domain. We observe that the size of the speckle pattern changes, depending on the focused-beam size or degree of spatial overlap of the three beams. Furthermore, through Fourier-domain analysis of the speckle pattern we obtain the monitoring variable to qualify the efficiency of the coherent beam combination.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 1998.03a
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• pp.239-244
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• 1998

ESP(Electronic Speckle Pattern Interferometry) is an optical technique to measure deforamtion of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive measuring method, is capable of providing full-field results with high spatial resolution and high speed. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and a shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring. And by this geometric analysis, we performed the electronic speckle contouring experiment. We used 4-frame phase shifting method with PZT for quantitative analysis of contour fringes. Finally, we showed good agreements between the geometric analysis and experimental results.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.9 no.2
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• pp.141-148
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• 1998

For developing a beam shaping antenna, the circumference and the length of the vertical and horizontal elements of the Modified Transmission Line type Antenna(MTLA) are varied. The vertical radiation pattern of MTLA which has various shape was analyzed by the moment method in order to verify the beam tilt characteristics. From the analysis, it is confirmed that the condition of the maximum beam tilt is determined by the length of the vertical elements of the antenna. The antennal with the maximum beam tilt was designed and its input impedance and the radiation pattern was calculated theoretically and measured experimentally.