1 |
John, T. L., "ELECTRON BEAM TESTING TECHNOLOGY," Plenum Press, USA, pp. 35-125, 1993.
|
2 |
Joseph, I. G., Dale, E. N., Patrick, E., David. C. J., Roming. A. D., Charles. E. L., Charles, F. and Eric. L., "Scanning Electron Microscopy and X-Ray Microanalysis," Plenum Press, USA, pp. 21-68, 1992.
|
3 |
Hawkes, P. W. and Kasper, E. "Principles of Electron Optics," Academic press, UK. 1989.
|
4 |
Sunjong, L. and Jiyeon, C., "Design of Magnetic Lens Amplifier," KSPE 2014 spring conferenc, 2014.
|
5 |
Sunjong, L. and Jiyeon, C., "Design method of e-beam condensation and scan device for finishing instrument," KSPE 2013 fall conferenc, 2013.
|