• Proceedings of the Korean Vacuum Society Conference
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• 1999.07a
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• pp.29-29
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• 1999

The synthesis of layered structures on the nanometer scale has become essential for continued improvements in the operation of various electronic and magnetic devices. Abrupt metal-metal interfaces are desired for applications ranging from metallization in semiconductor devices to fabrication of magnetoresistive tunnel junctions for read heads on magnetic disk drives. In particular, characterizing the interface structure between various transition metals (TM) and aluminum is desirable. We have used the techniques of MeV ion backscattering and channeling (HEIS), x-ray photoemission (ZPS), x-ray photoelectron diffraction(XPD), low-energy ion scattering (LEIS), and low-energy electron diffraction(LEED), together with computer simulations using embedded atom potentials, to study solid-solid interface structure for thin films of Ni, Fe, Co, Pd, Ti, and Ag on Al(001), Al(110) and Al(111) surfaces. Considerations of lattice matching, surface energies, or compound formation energies alone do not adequately predict our result, We find that those metals with metallic radii smaller than Al(e.g. Ni, Fe, Co, Pd) tend to form alloys at the TM-Al interface, while those atoms with larger atomic radii(e.g. Ti, Ag) form epitaxial overlayers. Thus we are led to consider models in which the strain energy associated with alloy formation becomes a kinetic barrier to alloying. Furthermore, we observe the formation of metastable fcc Ti up to a critical thickness of 5 monolayers on Al(001) and Al(110). For Ag films we observe arbitrarily thick epitaxial growth exceeding 30 monolayers with some Al alloying at the interface, possible driven by interface strain relief. Typical examples of these interface structures will be discussed.

• The Bulletin of The Korean Astronomical Society
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• v.43 no.1
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• pp.72.2-72.2
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• 2018

The Opposition Effect (OE) is an enhancement of the brightness of a reflecting light as the phase angle (the Sun-target-observer angle) approaches zero. The mechanisms have been studied both theoretically and experimentally and nowadays recognized that there are two major mechanisms, namely, coherent backscattering OE (CBOE) and shadow hiding OE (SHOE). From data analyses of an S-type asteroid Itokawa taken with the Hayabusa spacecraft onboard camera, it is suggested that the CBOE would be dominant at phase angle smaller than ~ 1.4 deg, while SHOE dominates at larger phase angles (M. Lee & M. Ishiguro, under review). The study on the physical parameters which affect the OE, such as size and composition, will lead us to find a way to disentangle each of them from observation. The experiments in lab, however, faces two major difficulties: (a) the detector blocks the incident light if phase angle is nearly zero and (b) incident and emission angles must be controlled with high angular resolution to prevent blurring of OEs at different phase angles in one measurement. In this presentation, we introduce a new apparatus which has been installed at Seoul National University to investigate the OE in our lab, and summarize the initial results. It will be a valuable starting point to establish infrastructure in Korea, and will shed light on the investigation of OE physics using laboratory simulants.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.25 no.1
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• pp.6-14
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• 2012

For integrated complementary metal oxide semiconductor (CMOS) circuits, the lateral spread for two-dimensional (2-D) impurity distributions are very important for the analyzing the devices. The measured two-dimensional SEM data obtained using the chemical etching-method matched very well with the results of the Gauss model for boron implanted samples. But the profiles in boron implanted silicon were deviated from the Gauss model. The profiles in boron implanted silicon were shown a little bit steep profile in the deep region due to backscattering effect on the near surface from the bombardments of light boron ions. From the simulated 3-D data obtained using an analytical model, the 1-D and 2-D data were compared with the experimental data and could be verified the justification from the experimental data. The data of 3-D model were also shown good agreements with the experimental and the simulated data. It can be used in the 3-D chip design and the analysis of microelectro-mecanical system (MEMS) and special devices.

• Transactions of the Korean Society of Mechanical Engineers
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• v.19 no.7
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• pp.1691-1701
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• 1995

Two aspects of Large-Eddy Simulation(LES) are investigated in order to improve its performance. The first one is on how to determine the model coefficient in conjunction with a dynamic subgrid-scale model, and the second one is on a wall-layer model(WLM) which allows one to skip near-wall regions to save a large number of grid points otherwise required. Especially, a WLM suitable for a separated flow is considered. Firstly, an averaging technique to calculate the model coefficient of dynamic subgrid-scale modeling(DSGSM) is introduced. The technique is based on the concept of local averaging, and useful to stabilize numerical solution in conjunction with LES of complex turbulent flows using DSGSM. It is relatively simple to implement, and takes very low overhead in CPU time. It is also able to detect the region of negative model coefficient where the "backscattering" of turbulence energy occurs. Secondly, a wall-layer model based on a local turbulence intensity is considered. It locally determines wall-shear stresses depending on the local flow situations including separation, and yields better predictions in separated regions than the conventional WLM. The two techniques are tested for a turbulent obstacle flow, and show the direction of further improvements.rovements.

• Atmosphere
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• v.21 no.3
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• pp.285-300
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• 2011

To discriminate and eliminate chaff echoes in radar measurements, a new removal algorithm in two-dimensional reflectivity composite at the height of 1.5 km has been developed by using the brightness temperature($T_B$) obtained from MTSAT-1R. This algorithm utilizes the fact that chaffs are not appeared in infrared satellite data of MTSAT-1R, but detected in radar measurements due to their significant backscattering in the given radar wavelength. The algorithm is evaluated for three different situations: chaff only, chaff mixed with convective storms, and chaff covered with clouds. The algorithm shows excellent performance for the cases of chaff only and chaff mixed with convective storms. However, the performance of the algorithm significantly depends on the presence of clouds. Thus, the statistical analysis of $T_B$ is performed in order to optimize the monthly threshold.

• Ocean and Polar Research
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• v.25 no.spc3
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• pp.399-408
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• 2003

The behavior of Suspended Sediment Concentrations (SSC) around a silt screen in a microtidal coastal area was hydrodynamically measured. The current speed at the mid-layer about 30m downstream of the screen reduces to about half that at the same distance upstream. It was caused by the contraction of the vertical section due to the screen. Even during a relatively weak storm period the SSC increases to that of the value caused by dredging. Section-averaged SSC at the downstream of the screen is higher by about 60% than that at the upstream, suggesting that the silt screen plays an adverse effect rather than a constructive role in the reduction of SSC generated by dredging.

• Korean Journal of Remote Sensing
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• v.28 no.6
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• pp.653-660
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• 2012

This study classified paddy fields according to rice varieties and monitored temporal changes in rice growth using SAR backscatter coefficients (${\sigma}^{\circ}$). A growing period time-series of backscatter coefficients was set up for nine fine-beam mode RADARSAT-1 SAR images from April to October 2005. The images were compared with field-measured rice growth parameters such as leaf area index (LAI), plant height, fresh and dry biomass, and water content in grain and plants for 45 parcels in Dangjin-gun, Chungnam Province, South Korea. The average backscatter coefficients for early-maturing rice varieties (13 parcels) ranged from -18.17 dB to -6.06 dB and were lower than those for medium-late maturing rice varieties during most of the growing season. Both crops showed the highest backscatter coefficient values at the heading stage (late July) for early-maturing rice, and the difference was greatest before harvest for early-maturing rice. The temporal difference in backscatter coefficients between rice varieties may play a key role in identifying early-maturing rice fields. On the other hand, comparisons with field-measured parameters of rice growth showed that backscatter coefficients decreased or remained on a plateau after the heading stage, even though the growth of the rice canopy had advanced.

• Proceedings of the KSRS Conference
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• 1998.09a
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• pp.128-133
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• 1998

To assess the flood damages and to provide necessary information for preventing future catastrophe, it is necessary to appraise the inundated area with more accurate and rapid manner. This study attempts to evaluate the potential of satellite synthetic aperture radar (SAR) data for mapping of flood inundated area in southern part of Korea. JERS L-band SAR data obtained during the summer of 1997 were used to delineate the inundated areas. In addition, Landsat TM data were also used for analyzing the land cover condition before the flooding. Once the two data sets were co-registered, each data was separately classified. The water surface areas extracted from the SAR data and the land cover map generated using the TM data were overlaid to determine the flood inundated areas. Although manual interpretation of water surfaces from the SAR image seems rather simple, the computer classification of water body requires clear understanding of radar backscattering behavior on the earth's surfaces. It was found that some surface features, such as rice fields, runaway, and tidal flat, have very similar radar backscatter to water surface. Even though satellite SAR data have a great advantage over optical remote sensor data for obtaining imagery on time and would provide valuable information to analyze flood, it should be cautious to separate the exact areas of flood inundation from the similar features.

• Journal of the Korean Vacuum Society
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• v.3 no.3
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• pp.316-321
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• 1994

Rate of mixing of Cu particles to polyimide substrate at interfaces under different thermal treatments was analyzed by Rutherford Backscattering spectroscopy using 2.0 MeV He+ ions. T he mixing rate was a function of annealing temperature and time and was constant at afioxed temperature. The amount of mixing increased linearly with time and the mixing rate increased with temperature. The activation energy for interface mixing between Cu and polyimide was 2.6 kcal/mol. The X-ray studies showed the Cu(111) plane peak changed with annealing time at fixed temperature. The mixing of Cu to polyimide was explained with segmental motion of PI chain and with interaction between functional group of the chain and metal electron donor. The comparisons were made bewteen the mixing induced by ion irradiation and by thermal treatment. The various factors affecting the interface mixing are discussed.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.347-347
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• 2011

Secondary ion mass spectrometry (SIMS) was fascinated by a quantitative analysis and a depth profiling and it was convinced of a in-depth analysis of multi-layer films. Precision determination of the interfaces of multi-layer films is important for conversion from the original SIMS depth profiling to the compositional depth profiling and the investigation of structure of multi-layer films. However, the determining of the interface between two kinds of species of the SIMS depth profile is distorted from original structure by the several effects due to sputtering with energetic ions. In this study, the feasibility of 50 atomic % definition for the determination of interface between two kinds of species in SIMS depth profiling of multilayer films was investigated by Si/Ge and Ti/Si multi-layer films. The original SIMS depth profiles were converted into compositional depth profiles by the relative sensitivity factors from Si-Ge and Si-Ti alloy reference films. The atomic compositions of Si-Ge and Si-Ti alloy films determined by Rutherford backscattering spectroscopy (RBS).