• 제목/요약/키워드: Automatic Inspection

검색결과 525건 처리시간 0.024초

머신비전 자동검사를 위한 대상객체의 인식방향성 개선 (Recognition Direction Improvement of Target Object for Machine Vision based Automatic Inspection)

  • 홍승범;홍승우;이규호
    • 한국정보통신학회논문지
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    • 제23권11호
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    • pp.1384-1390
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    • 2019
  • 본 논문은 머신비전기반 자동검사를 위한 대상객체의 인식방향성 개선 연구로서, 영상카메라에 의한 자동 비전검사의 과정에서 제한성이 따르는 대상 객체의 인식방향성을 개선하는 방법을 제안한다. 이를 통하여 머신비전 자동검사에서 시험대상물의 위치와 방향에 상관없이 검사대상의 영상을 검출할 수 있게 함으로써 별도 검사지그의 필요성을 배제하고 검사과정의 자동화 레벨을 향상시킨다. 본 연구에서는 검사대상으로서 와이어 하네스 제조과정에서 실제 적용할 수 있는 기술과 방법을 개발하여 실제 시스템으로 구현한 결과를 제시한다. 시스템구현 결과는 공인기관의 평가를 통하여, 정밀도, 검출인식도, 재현률 및 위치조정 성공률에서 모두 성공적인 측정결과를 얻었고, 당초 설정하였던 10종류의 컬러구별 능력, 1초 이내 검사시간, 4개 자동모드 설정 등에서도 목표달성을 확인하였다.

차체 부품 누락 방지를 위한 자동검사 시스템 개발 (A Development Auto Inspection System for Prevent an Omission of Motor Body Units)

  • 이용중;이형우;김기대
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2002년도 춘계학술대회 논문집
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    • pp.146-148
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    • 2002
  • An automatic inspection vision systems whose development was the industry applications motor rear side member. This system are connected to the 9 ea camera fur the process inspection the bolt, nuts, units in the rear side member product. This automatic inspection vision systems can perform inspection of not attached the bolt, nuts, units, etc fast and accuracy in react time fashion. And then perform very sophisticated inspection which human workers can not perform.

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LCD모듈의 측면검사 알고리즘의 개발 (Development of Automatic Side-View Inspection Algorithm for LCD Modules)

  • 이재혁
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2006년 학술대회 논문집 정보 및 제어부문
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    • pp.425-427
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    • 2006
  • In this paper, an automatic side-view inspection algorithm for LCD modules is proposed. Until now, most parts of inspection is performed by human inspectors, which means very high product costs. So inspection automation is the very hot issue in the LCD industries. However, it is not easy problem to replace the human by computer vision system. In the many inspections which are based on the human eyes, side-view inspection is most hard problem to solve. In this paper, an image morphing algorithm is developed, which will help to enable the automation of the side-view inspection process.

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컴퓨터용 Lead Screw의 자동검사 시스템 개발 (Development of Automatic Inspection System for Lead Screw of Computer)

  • 배진호;나승우;유필상;김성관
    • 한국산학기술학회논문지
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    • 제11권11호
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    • pp.4115-4120
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    • 2010
  • 컴퓨터용 Lead Screw는 검사방식이 수동검사로 이루어져 작업자의 주관적 판단으로 인한 미검출과 과검출이 발생하고, 생산성이 저하되는 단점이 있다. 따라서 본 연구에서는 이러한 단점을 보완하고자 Lead Screw 자동검사 시스템을 개발했다. 검사시스템은 Lead Screw 자동공급 및 이송을 위한 공급 이송 장치와, 표면검사를 위한 $360^{\circ}$ 회전장치, 치수검사를 위한 머신비젼 부분으로 구성된다. Lead Screw 자동검사 시스템으로 표면과 치수 측정결과, 오검률 및 미검률이 수동검사 결과보다 우수함을 보였다.

머신비전을 이용한 PWM Shaft의 자동검사 시스템 개발 (Development of an Automatic Inspection System for PWM Shaft Using Machine Vision)

  • 배진호;김성관
    • 한국생산제조학회지
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    • 제22권1호
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    • pp.125-130
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    • 2013
  • In this paper, in order to overcome shortcomings of manual inspection for the automotive PWM Shaft, we developed an automated inline inspection system. The automated inline inspection system consists of the work feeder unit, conveying unit, outer diameter check unit, run-out and roundness check unit, machine vision, defective separation unit and status alarm unit. We used the machine vision system for automatic inspection process and designed the inline systems for automatic feeding and selecting process. Also the repeated operation test was performed in order to verify the precision and reliability of the proposed automated inline inspection system.

신경망 데이타 압축과 JPEG(표준정지영상압축기법)에 의한 원거리에 위치한 제조공정의 온라인 자동검사 (An Automatic On-Line Inspection of the Remotely Located Manufacturing Process Based on Neural Network Data Compression and Joint Photographic Experts Group)

  • 김상철;왕지남
    • 한국정밀공학회지
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    • 제13권2호
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    • pp.37-47
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    • 1996
  • This paper presents an automatic tele-inspection scheme for the remotely manufacturing process. The remote-manufacturing process is continuously monitored and a crucial process is captured by CCD Camera. The captured image is compressed by neural network and JPEG, and it is sent directly to the assembly plant for incoming inspection. Massive image data require broadband channel to transmit them to remote distance, but sender is able to transmit them to receiver in use common channel by compressing massive image data in the high ratio. After the receiver reconstructs the compressed image to be transmitted, the reconstructed image is also directly used for automatic inspection of the process. The Experimental results show that the proposed inspection mechanism could be effectively implemented for real applications.

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패턴이 있는 TFT-LCD 패널의 결함검사를 위하여 근접패턴비교와 경계확장 알고리즘을 이용한 자동광학검사기(AOI) 개발 (Development of AOI(Automatic Optical Inspection) System for Defect Inspection of Patterned TFT-LCD Panels Using Adjacent Pattern Comparison and Border Expansion Algorithms)

  • 강성범;이명선;박희재
    • 제어로봇시스템학회논문지
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    • 제14권5호
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    • pp.444-452
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    • 2008
  • This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.

비젼프로브를 이용한 CRT 전자총의 자동치수 검사 (Automatic Inspection of Assembly Tolerances of Cathod Ray Electron Guns by Vision Probe)

  • Park, H.G.;Park, M.C.;Kim, S.W.
    • 한국정밀공학회지
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    • 제14권10호
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    • pp.28-34
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    • 1997
  • This paper describes an automatic measurement method for the in-line inspection of assembly tolerances of cathod ray electron guns. The method uses an optical microscope with a CCD camera as a probe. An automatic gap recognition algorthm with digital image processing and a new software autofocus algorithm based on using an optimal edge detector have been developed to improve the measuring accuracy. An inspection system has been proposed and practically implemented for in-line inspection to a real factory automation line. The inspection system consists of a gap inspection part and an eyelet. Total time consumed for inspecting all measuring items is about 10 seconds and the repeatability is below .+-. 5 .mu. m

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원단 불량 검사기의 자동 마킹 시스템 개발 (Development of an Automatic Marking System for Fabric Inspection Machine)

  • 김재연;이재용
    • 한국기계가공학회지
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    • 제21권6호
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    • pp.22-29
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    • 2022
  • In this study, an automatic marking system for fabric inspection machines was developed. The main objectives of the study were to promote intelligence and automation for the inspection process, as well as to increase textile industrial productivity. Generally, when a worker manually inspects and marks a fabric, human error and reduced efficiency are unavoidable. To overcome these problems, we developed an automatic marking system that uses robots. This system incorporates a vision camera to automatically recognize defects, and an optical fiber sensor to detect the side of the fabric. To verify the performance, the control system sends a command directly to the robot to mark the fabric. Finally, the actual production confirmed that the proposed system could perform the desired motion.

솔더 페이스트 자동검사를 위한 2-D/3-D 복합 알고리즘 (2-D/3-D Combined Algorithm for Automatic Solder Paste Inspection)

  • 조상현;이상윤;임쌍근;최흥문
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2002년도 춘계학술대회 논문집
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    • pp.173-176
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    • 2002
  • In this paper, we present the combined 2-D and 3-D algorithms for automatic solder paste inspection. For automatic inspection, optical system for the combined inspection and driving unit is made. One-pass run length algorithm that has fast and efficient memory space is applied to the input image fur extracting solder paste patterns. The path of probe movement is then calculated for an automatic inspection. For a fast 3-D inspection, the phase shift algorithm based on Moire interferometry is also used. In addition, algorithms used in this paper are coded by $MMX^{TM}$. A probe system is manufactured to simultaneously inspect 2-D and 3-D for 10mm$\times$10mm field of view, with resolutions of 10 $\mu\textrm{m}$for both x, y axis and 17 $\mu\textrm{m}$for z axis, and then, experiments on several PCBs are conducted. The processing times of 2-D and 3-D, excluding an image capturing, is 0.039 sec and 0.047 sec, respectively. The credible result with $\pm$ 1$\mu\textrm{m}$uncertainty can be also achieved.

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