• Title/Summary/Keyword: Angular Spectrum Method

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Impedance Analysis of DGS Slot in Spectral Domain and Its Application of LPF(Low Pass Filter) (스펙트럴 영역에서 DGS 슬롯 임피던스 특성 해석 및 LPF 응용)

  • Rhee, Seung-Yeop;Kim, On;Chang, Jae-Soo;Go, Jin-Hyun;Ha, Jae-Kwon
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.19 no.4
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    • pp.418-426
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    • 2008
  • In this paper, investigations on the impedance characteristics of a DGS(Defected Ground Structure) slot in the groud plane of microstripline are presented in spectral domain and applied to the characteristic improvement of stepped impedance microstrip low pass filter(LPF). In this method, expressions for the impedance of a DGS slot are derived from self-reaction of the angular spectrum of plane waves and the discontinuity in the modal voltage. The numerical results are compared with those of the rigorous full-wave method and are shown to produce reasonably accurate data. And the stepped impedance microstrip low pass filter is designed and fabricated with the uniform and nonuniform DGS slots for improving the frequency responses. The experiments show that the proposed filter with slots in the ground plane has a wider stopband and sharper cutoff response.

Gesture based Input Device: An All Inertial Approach

  • Chang Wook;Bang Won-Chul;Choi Eun-Seok;Yang Jing;Cho Sung-Jung;Cho Joon-Kee;Oh Jong-Koo;Kim Dong-Yoon
    • International Journal of Fuzzy Logic and Intelligent Systems
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    • v.5 no.3
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    • pp.230-245
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    • 2005
  • In this paper, we develop a gesture-based input device equipped with accelerometers and gyroscopes. The sensors measure the inertial measurements, i.e., accelerations and angular velocities produced by the movement of the system when a user is inputting gestures on a plane surface or in a 3D space. The gyroscope measurements are integrated to give orientation of the device and consequently used to compensate the accelerations. The compensated accelerations are doubly integrated to yield the position of the device. With this approach, a user's gesture input trajectories can be recovered without any external sensors. Three versions of motion tracking algorithms are provided to cope with wide spectrum of applications. Then, a Bayesian network based recognition system processes the recovered trajectories to identify the gesture class. Experimental results convincingly show the feasibility and effectiveness of the proposed gesture input device. In order to show practical use of the proposed input method, we implemented a prototype system, which is a gesture-based remote controller (Magic Wand).

Damage Measurement for Molybdenum Thin Film Using Reflection-Type Digital Holography (반사형 디지털 홀로그래피를 이용한 Molybdenum 박막의 손상 측정)

  • Kim, Kyeong-Suk;Jung, Hyun-Il;Shin, Ju-Yeop;Ma, Hye-Joon;Kwon, Ik-Hwan;Yang, Seung-Pill;Hong, Chung-Ki;Jung, Hyun-Chul
    • Journal of the Korean Society for Nondestructive Testing
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    • v.35 no.2
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    • pp.141-149
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    • 2015
  • In the fabrication of electronic circuits used in electronic products, molybdenum thin films are deposited on semiconductors to prevent oxidation. During the deposition, the presence of a particle or dust at the interface between the thin film and substrate causes the decrease of adhesion, performance, and life cycle. In this study, a damage measurement targeting two kinds of glass substrate, with and without particles, was performed in order to measure the change in the molybdenum thin film deposition area in the presence of a particle. Clean and dirty molybdenum thin film specimens were fabricated and directly deposited on a substrate using the sputtering method, and a reflection-type digital holographic interferometer was configured for measuring the damage. Reflection-type digital holography has several advantages; e.g., the configuration of the interferometer is simple, the measurement range can be varied depending on the magnification of a microscopic lens, and the measuring time is short. The results confirm that reflection-type digital holography is useful for the measurement of the damage and defects of thin films.