• Proceedings of the Korea Institutes of Information Security and Cryptology Conference
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• 2002.11a
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• pp.495-498
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• 2002

The need for network protection, accounting and resource management in foreign administrative domain requires appropriate security services. In this paper, we propose an access control protocol to support the authentication between mobile node and visiting subnet. Our hybrid way of approach aims to reduce computational overhead and minimize the use of network bandwidth. We also propose non-certificate based public-key cryptography to provide non-repudiation, which does not require CRL retrieval and certificate validation.

• Environmental Engineering Research
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• v.23 no.3
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• pp.265-270
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• 2018

This study was to measure the exposure of diesel vehicle drivers to elemental carbon (EC) as an indicator of diesel particulate matter (DPM) emitted from diesel vehicles in an underground coal mine over 3 years as per NIOSH Method 5040. Our study results (range $10{\mu}g/m^3-377{\mu}g/m^3$ for the loader drivers, $19{\mu}g/m^3-162{\mu}g/m^3$ for the SMV drivers) were similar or less than previous study results (range $5{\mu}g/m^3-2,200{\mu}g/m^3$) for normal mine operations. From this study results, it appeared that the exposures decreased in the second and the third year. It is thought that the reasons for the decreased personal DPM (EC) exposures over the 3 years were related to the following recommendations; more frequent monitoring and maintenance of the diesel vehicles and their DPM filtration systems, more consistent monitoring of the mine's ventilation system and changes of work practices such as minimizing the opening of diesel vehicle windows. An educational program on adverse health effects of exposure to DPM and use of respiratory protection (P2 respirators) also assisted in minimizing driver exposure to DPM.

• Korean Journal of Materials Research
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• v.34 no.2
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• pp.105-110
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• 2024

Scanning probe microscopy (SPM) has become an indispensable tool in efforts to develop the next generation of nanoelectronic devices, given its achievable nanometer spatial resolution and highly versatile ability to measure a variety of properties. Recently a new scanning probe microscope was developed to overcome the tip degradation problem of the classic SPM. The main advantage of this new method, called Reverse tip sample (RTS) SPM, is that a single tip can be replaced by a chip containing hundreds to thousands of tips. Generally for use in RTS SPM, pyramid-shaped diamond tips are made by molding on a silicon substrate. Combining RTS SPM with Scanning spreading resistance microscopy (SSRM) using the diamond tip offers the potential to perform 3D profiling of semiconductor materials. However, damage frequently occurs to the completed tips because of the complex manufacturing process. In this work, we design, fabricate, and evaluate an RTS tip chip prototype to simplify the complex manufacturing process, prevent tip damage, and shorten manufacturing time.