Characteristics of Hillock Formation in the Al-1%Si Film by the Effect of Ion Implantation and Substrate Temperature (이온 주입과 기판 온도 효과에 의한 Al-1%Si 박막의 Hillock 형성 특성)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.27 no.1
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- pp.8-13
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- 2014