• Title/Summary/Keyword: Al evaporation

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Evaporation Heat Transfer Characteristics of $CO_2$ in a Horizontal Tube

  • Lee Dong-Geon;Son Chang-Hyo;Oh Hoo-Kyu
    • Journal of Advanced Marine Engineering and Technology
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    • v.29 no.3
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    • pp.297-305
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    • 2005
  • The evaporation heat transfer coefficient of $CO_2$ (R-744) in a horizontal tube was investigated experimentally. The experiments were conducted without oil in a closed refrigerant loop which was driven by a magnetic gear pump. The main components of the refrigerant loop are a receiver. a variable-speed pump. a mass flow meter. a pre-heater and evaporator (test section). The test section consists of a smooth. horizontal stainless steel tube of 7.75 mm inner diameter. The experiments were conducted at mass flux of 200 to $500\;kg/m^{2}s$. saturation temperature of $-5^{\circ}C\;to\;5^{\circ}C$. and heat flux of 10 to $40\;kW/m^2$. The test results showed the evaporation heat transfer of $CO_2$ has greatly effect on more nucleate boiling than convective boiling. The evaporation heat transfer coefficients of $CO_2$ are highly dependent on the vapor quality. heat flux and saturation temperature. The evaporation heat transfer coefficient of $CO_2$ is very larger than that of R-22 and R-134a. In making a comparison between test results and existing correlations. the present experimental data are the best fit for the correlation of Jung et al. But it was failed to predict the evaporation heat transfer coefficient of $CO_2$ using by the existing correlation. Therefore. it is necessary to develop reliable and accurate predictions determining the evaporation heat transfer coefficient of $CO_2$ in a horizontal tube.

Evaporation Heat Transfer Characteristics of $CO_2$ in a Horizontal Tube

  • Son Chang-Hyo;Kim Dae-Hui;Choi Sun-Muk;Kim Young-Ryul;Oh Hoo-Kyu
    • International Journal of Air-Conditioning and Refrigeration
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    • v.13 no.4
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    • pp.167-174
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    • 2005
  • The evaporation heat transfer coefficient of $CO_2$ (R-744) in a horizontal tube was investigated experimentally. The experiments were conducted without oil in a closed refrigerant loop which was driven by a magnetic gear pump. The main components of the refrigerant loop are a receiver, a variable-speed pump, a mass flow meter, a pre-heater and evaporator (test section). The test section consists of a smooth horizontal stainless steel tube of 7.75 mm inner diameter. The experiments were conducted at mass flux of 200 to $500kg/m^2s$, saturation temperature of $-5^{\circ}C\;to\;5^{\circ}C$, and heat flux of 10 to $40kW/m^2$. The test results showed the evaporation heat transfer of $CO_2$ has greater effect on nucleate boiling than convective boiling. The evaporation heat transfer coefficient of $CO_2$ is highly dependent on the vapor quality, heat flux and saturation temperature. The evaporation heat transfer coefficient of $CO_2$ is very larger than that of R-22 and R-134a. In comparison with test results and existing correlations, the best fit of the present experimental data is obtained with the correlation of Jung et al. But the existing correlations failed to predict the evaporation heat transfer coefficient of $CO_2$. Therefore, it is necessary to develop reliable and accurate predictions determining the evaporation heat transfer coefficient of $CO_2$ in a horizontal tube.

Investigation of Al Back Contact and BSF Formation by In-situ TEM for Silicon Solar Cells

  • Park, Sungeun;Song, Jooyoung;Tark, Sung Ju;Kim, Young Do;Choi, Chel-Jong;Kwon, Soonwoo;Yoon, Sewang;Kim, Donghwan
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.11a
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    • pp.38.1-38.1
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    • 2010
  • The trend to thinner crystalline silicon solar wafers in production of solar cells investigates re-evolution of back surface field (BSF) formation. We have studied mechanisms of back contact formation in Al evaporation and screen printed Al paste for Si solar cells by TEM analysis. We observed that Si diffuse into Al during heat up. The Si diffusion process made vacancies in Si wafer. The Al began to seep into the Si wafer (Al spike). During heat down, the Al spike were shrink which causes the doped region (BSF).

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A Study on the Etching Effect and the Capacitance of Aluminum Oxide Thin Film by Oxygen Ion Beam (산소 이온 빔에 의한 산화 알루미늄 박막의 식각 효과 및 정전 용량 특성에 관한 연구)

  • Cho, E.S.;Kwon, S.J.
    • Journal of the Korean Vacuum Society
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    • v.22 no.1
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    • pp.26-30
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    • 2013
  • For the realization of high-k insulator, aluminum oxide ($Al_2O_3$) was deposited by using an oxygen ion beam assisted deposition (IBAD) during e-beam evaporation. From the thickness of the $Al_2O_3$ layer evaporated with IBAD process, it was possible to investigate the etching effect of ion beam at higher energies during e-beam evaporation. It was also possible to obtain a higher capacitance as a result of IBAD in spite of the reduced thickness of $Al_2O_3$.

Structures and properties of vacuum-evaporated Zn thin films with various seed layers (진공증착된 Zn박막의 seed layer에 따른 구조와 특성)

  • 민복기;김인성;송재성;이병윤;박경엽;위상봉
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.11a
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    • pp.328-331
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    • 2000
  • The effect of the constituent elements and their composition of the seed layer on the properties of the evaporated Zn thin films was investigated. It was carried out by the analysis of the preferred orientation and the grain size, and the corrosion characteristics. Seed layers were prepared by evaporation of Al and AlCu respectively, and here the Cu content as additives of the source materials of seed layers were designed 5 a/o to 20 a/o. The values of full width at half maximum (FWHM) of the (002) x-ray diffraction peaks of Zn decreased by increasing the amount of the additives on Al seed layer, as a results, the grain sizes also decreased. In order to characteristics of Zn thin films evaporated on the various seed layers, electrical resistivity changes with a function of time at the temperature of 40$^{\circ}C$ and the relative humidity of 80%, as a result, the relative resistivity changes were increased by decreasing the grain size and the FWHM values of (002) peaks of Zn.

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Deposition of an Intermediate Layer on an Ultrapermeable Ceramic Support by Evaporation-Driven Self-Assembly (증발유도 자기조립을 이용한 고투과도 세라믹 지지체의 중간층 제조)

  • Kwon, Hyuk Taek;Kim, Jinsoo
    • Membrane Journal
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    • v.31 no.1
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    • pp.80-85
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    • 2021
  • In this study, we developed an evaporation-driven self-assembly coating method for an ceramic intermediate layer on an ultrapermeable ��-Al2O3 support with large pore size of ~1.5 ㎛. The method led to the formation of a ceramic intermediate layer with higher surface homogeneity and less surface roughness than the conventional dip-coating method. A mesoporous ��-Al2O3 layer was deposited on the support to evaluate support quality. A supported ��-Al2O3 membrane was defect-free even without repeated coating. Furthermore, the membrane showed 2.3 times higher nitrogen permeance than one prepared on a macroporous support with pore size range of 100~200 nm, which is widely used for ceramic membrane coating.

The Optical Properties of MgF2/Cr/MgF2, MgF2/Cu/MgF2, MgF2/Al/MgF2 Multi-Layered Thin Films (MgF2/Cr/MgF2, MgF2/Cu/MgF2, MgF2/Al/MgF2 다층박막의 광학적 특성)

  • Jang, Kang-Jae;Jang, Gun-Eik
    • Journal of the Korean institute of surface engineering
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    • v.40 no.5
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    • pp.241-244
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    • 2007
  • $MgF_2$/Cr/$MgF_2$, $MgF_2$/Cu/$MgF_2$ and $MgF_2$/Al/$MgF_2$ multi-layered thin films were fabricated by evaporation system. $MgF_2$ and Cr(Cu, And Al) was selected as a low refractive index material and mid reflector layer, respectively. Optical properties including color effect were systematically studied in terms of different film layer by using spectrophotometer. Experimental results were compared to the simulation result. The films consistings of $MgF_2$/Cr/$MgF_2$, $MgF_2$/Cu/$MgF_2$, $MgF_2$/Al/$MgF_2$ multi-layered thin films showed wavelength range of $430{\sim}780nm$, typically color range between greenish yellow and orange at view angle of $45^{\circ}$. It was confirmed that this experimental result was well matched with simulation result.

Electrical Characteristics of Organic Light-emitting Diodes Fabricated by Varying a Hole-size in Evaporation Boat

  • Kim, Weon-Jong;Park, Young-Ha;Cho, Kyung-Soon;Hong, Jin-Woong;Shin, Jong-Yeol;Kim, Tae-Wan
    • Transactions on Electrical and Electronic Materials
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    • v.9 no.3
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    • pp.105-109
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    • 2008
  • Electrical characteristics of organic light-emitting diodes were investigated by varying a hole-size in evaporation boat in the device structure of ITO/tris(8-hydroxyquinoline) aluminum$(Alq_3)$/Al. The device was manufactured using a thermal evaporation under a base pressure of $5{\times}10^{-6}$ Torr. The $Alq_3$ emitting organics were evaporated to be a thickness of 100 nm at a deposition rate of $1.5{\AA}/s$. A cylindrical-shaped evaporation boat was made out of stainless steel with a small size of hole on top of the boat. Several evaporation boats were made having a different hole size on top; 0.8 mm, 1.0 mm, 1.5 mm, and 3.0 mm. We found that when the hole size on top of the evaporation boat is 1.0 mm, the average roughness is rather smoother compared to the other ones. Also, luminance and external quantum efficiency are superior to the others. Compared to the ones from the devices made with the hole-size of 0.8 mm boat. The luminance and external quantum efficiency of the device made with the hole-size of 1.0 mm boat were improved by a factor of seventy and thirty three, respectively. Also operating voltage is reduced to 2 V.

실리콘 태양전지 후면 전계 형성 메카니즘 연구

  • Park, Seong-Eun;Song, Ju-Yong;Choe, Cheol-Jong;Tak, Seong-Ju;Kim, Hyeon-Ho;Kim, Seong-Tak;Gang, Min-Gu;Gwon, Sun-U;Yun, Se-Wang;Kim, Dong-Hwan
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2010.05a
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    • pp.38.2-38.2
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    • 2010
  • We have studied mechanisms of back contact formation in Al evaporation and screen printed Al paste for Si solar cells by TEM analysis. We observed that Si diffuse into Al during heat up. The Si diffusion process made vacancies in Si wafer. The Al began to seep into the Si wafer (Al spike). During heat down, the Al spike were shrink which causes the doped region (BSF).

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Surface Migration in Al and Cu Films (알루미늄 및 구리 박막에서의 표면전자이주)

  • 박종원;김윤태;이진호
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1994.11a
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    • pp.106-108
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    • 1994
  • Electromigration(EM) tests were carried out on Al and Cu films in HV systems to study surface migration. The Al films were made on oxidized silicon wafers by thermal evaporation, in-situ annealed at 300$^{\circ}C$, patterned, and EM tested at 260$^{\circ}C$ and 4.5MA/$\textrm{cm}^2$. SEM observation with back scattered electron mode on the EM tested Al films disclosed that thinning took place under the native Al oxide. In the case of Cu films, tested using in-situ TEM, thinning was also observed at the early stage of void formation even though the thinned areas were much less than those of the Al films.