• Journal of Korean Society of Industrial and Systems Engineering
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• 제31권4호
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• pp.153-161
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• 2008

신뢰성 평가 시험은 종종 성능 평가에 장기간의 시간이 요구되며, 전체 생산비용까지 증가시키는 문제점을 안고 있다 스트레스를 이용한 가속수명시험은 제품의 신뢰성 고장과 밀접한 관련이 있는 고장 메커니즘의 촉진을 통해 고장에 이르는 기간을 단축함으로써 신뢰성 평가의 효율성을 도모할 수 있다. 본 연구에서는 이러한 스트레스 가속 시험에 빈도가속(Usage-Rate Acceleration) 또는 판정가속(Tightening Critical-Values) 등을 결합하여 한층 높은 가속효과를 도모하는 방법을 제안하고, 국내에서 생산되고 있는 2차 전지 제품에 대한 실제 시험 사례분석을 통해 결합된 가속방법의 효과를 실증적으로 보여주고 있다.

• Proceedings of the KIEE Conference
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• 대한전기학회 2005년도 제36회 하계학술대회 논문집 A
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• pp.377-380
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• 2005

In this paper, accelerated stress test(AST) for Magnetic Switch (MS) are applied to assure specified reliability of the products. Magnetic contactor that functions with over-current relay is called MS. Magnetic contactor closes and opens the motor load with ON/OFF switch of electronic contactor. It is also used for protecting and controlling the load. Magnetic contactor detects the over-current flow in the load with a over-current relay and disconnects the load by opening its control power. In this study, AST for product assembly are developed in order to improve the weak point so that increase the product reliability. Also we will show the basic information for the accelerated life test(ALT). The proposed AST results and procedures may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably. Finally the results of this study will contribute to improving reliability of products and strengthening competitiveness of our products in the world markets.

• Journal of the Korea Institute of Military Science and Technology
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• 제13권2호
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• pp.336-341
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• 2010

The burning interruption between the initiator and the delay column in a Zr-Ni K1 delay system used for a K510 fuze occurs with long-time storage. About 10 % failure probability of 15-years stored delay systems shows the failure mode in open literature. This paper shows storage lifetime improvement results for the delay system through changing the single-base delay column into double-base ones and controlling the manufacturing processes especially the initial inclusion of humidity. The double-base delay columns was implemented by inserting one delay column of fast burning rates between the initiator and the previous delay column of slow burning rates. Accelerated aging tests of the delay systems with double-base columns, and then the firing tests were performed to evaluate the improved lifetime. The double-base delay columns shows improved storage lifetime of the delay system through preventing the failure mode.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.1
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• pp.13-16
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• 2004

The reliability of 1.550m-wavelength InGaAs mesa waveguide photodiodes(WGPDs), which developed for 40-Gbps optical receiver applications, fabricated by metal organic chemical vapor deposition is investigated. Reliability is examined by both high-temperature storage tests and the accelerated life tests by monitoring dark current and breakdown voltage. The median device lifetime and the activation energy of the degradation mechanism are computed for WGPD test structures. From the accelerated life test results, the activation energy of the degradation mechanism and median lifetime of these devices in room temperature are extracted from the log-normal failure model by using average lifetime and the standard deviation of that lifetime in each test temperature. It is found that the WGPD structure yields devices with the median lifetime of much longer than $10^6$ h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gbps optical receiver modules.

• Proceedings of the KIEE Conference
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• 대한전기학회 2004년도 하계학술대회 논문집 A
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• pp.560-562
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• 2004

$SF_6$ gas has been increasingly used as the insulating and arc-suppressing medium in switchgears which are used as the protection devices of power system. Nowadays, most of power companies adopted the $SF_6$ gas-type load break switch for increasing the reliability of distribution network by its superior durability against external environmental condition, in substitution for air-type and oil-type switches. But, it is important to establish the general estimation process for the testing and estimation for long-term reliability Accordingly, the national standard(RS C0031) was made for the reliability assessment of $SF_6$ gas load break switch and the testing facilities were also set in KERI(Korea Electrotechlology Research Institute). This paper presents the requirements of RS C0031 for reliability assessment of $SF_6$ gas load break switch and synopsis of the accelerated life testing facilities for $SF_6$ gas load break switch.

• Journal of Applied Reliability
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• 제5권4호
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• pp.487-500
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• 2005

MEMS devices usually have micro actuators contained in a cavity, If the pressure level of testing chamber is higher than that of cavity, moisture will ingress into the cavity, which may cause critical failure such as stiction of the moving parts. To design an accelerated life test based on high temperature and high humidity, such a phenomena should be considered. In this study, a throughput model that can estimate the amount of moisture ingress is used to decide the testing time and conditions of a high temperature and high humidify test.

• Transactions of the Korean Society of Mechanical Engineers A
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• 제36권6호
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• pp.707-712
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• 2012

Very high cycle fatigue (VHCF) behavior of aerospace components has emerged much attention due to their long service life. In this study, a piezoelectric ultrasonic fatigue testing (UFT) system has been developed by Mbrosiatec Co., Ltd. to study the high cycle fatigue (HCF) strength of Ti-6Al-4V alloy. Hourglass-shaped specimens have been investigated in the range from $10^6$ to $10^9$ cycles at room temperature under completely reversed R = -1 loading conditions,. Scanning electron microscopy (SEM) analysis revealed that failures occurred in the entire range up to the gigacycle regime, and the fractures have beenfound to be initiated from the surface, unlike in steels. However, it was found from the SEM microgprahs that microcracks transformed into intergranular fractures. Thus, it can be concluded from according to the results that this test method can be applicable to commercialized automotive and railroad parts that require high cycle fatigue strength.

• Polymer(Korea)
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• 제32권5호
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• pp.440-445
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• 2008

The failure mechanism and failure morphology of linear low density polyethylene (LLDPE) tubing under hydrostatic pressure were investigated. Microscopic observations using video microscope and scanning electron microscope indicate that the failure mode is a brittle fracture including cracks propagated from inner wall to outer wall. In addition, oxidation induction time and Fourier transform infrared spectroscopy results show the presence of exothermic peak and the increase in carbonyl index on the surface of fractured LLDPE tubing, due to thermal-degradation. An accelerated life test methodology and testing system for LLDPE tubing are developed using the relationship between stresses and life characteristics by means of thermal acceleration. Statistical approaches using the Arrhenius model and Weibull distribution are implemented to estimate the long-term life time of LLDPE tubing under hydrostatic pressure. Consequently, the long-term life time of LLDPE tubing at the operating temperature of $25^{\circ}C$ could be predicted and also be analyzed.

• Journal of Korean Society of Industrial and Systems Engineering
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• 제21권47호
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• pp.1-10
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• 1998

Testing high reliability devices under nomal operating condition is difficult, because the devices are not likely to fail in the relatively short time available for tests. For most applications it is necessary to accelerate the causes of failure by increasing a stress above its nomal value. Previous accelerated life test(ALT) plans have shown how to find optimum allocation, lowest stress and sample size subject to minimizing the variance of mean life estimator. In these ALT plans, the highest acceptable test-stress was assumed to be specified in advance by the experimenter but there is no guidance for selecting it. This assumption is, however, inappropriate for many applications. Testing devices at too-high stress levels can invalidate the extrapolation model, or introduce failure mechanisms that are not anticipated under nomal operating conditions. In this paper, we propose new 4:2:1 compromise plans using Min-Max method to minimize this risk and present minimized test-stress levels(max, middle, min), and find sample allocation based on Min-Max 4:2:1 compromise plans. In result, we compare previous 4:2:1 compromise plans specified maximum test-stress with Min-Max 4:2:1 compromise plans minimized maximum test-stress.

• Journal of Applied Reliability
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• 제16권4호
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• pp.331-337
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• 2016

Purpose: The purpose of this study is the analysis of the failure mechanisms effect of circuit design characteristics of the ballast for LED Lamp Methods: Recently, electronic circuit of ballasts for LED lamp are being occurred on various failure mechanisms (whiskers, ion migration, heat dissipation problem, switching element damage) because electronic ballast circuit design characteristics are becoming more and more diverse. Results: we analysis failure mechanisms that occurs in accordance with the circuit design characteristics The ballast for LED lamp were divided into three different types (Type A, Type B, Type C) considering circuit design characteristics (thermal design, PCB patten spacing, element material) and it was experimented in the acceleration test conditions ($85^{\circ}C$, 85% R.H). Conclusion: We confirmed that failure mechanism of the ballast for LED Lamp had occurred differently in accordance with the circuit design characteristics.