• Textile Coloration and Finishing
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• v.16 no.5
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• pp.35-41
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• 2004

Poly(ethylene terephthalate), polyimide(Kapton), and polypropylene surfaces were modified with argon low temperature plasma by RF glow discharge at 240m Torr, 40W to investigate the surface morphological changes due to the plasma treatment using atomic force microscopy(AFM). Analysis of the AFM images and Ra(average roughness) revealed that the plasma treatment resulted in significant ablation on the surfaces. The morphological changes and surface roughness, however, were different depending on material characteristics such as heat stability, presence of amorphous region, swelling phenomenon, and molecular structure of repeating unit. It was assumed that polypropylene due to its tertiary hydrogen was ablated easily compared to poly(ethylene terephthalate), and that polyimide was more resistant to the ablation than PET due to rigid skeleton of imide and stable phenyl ring structure.

• Analytical Science and Technology
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• v.18 no.6
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• pp.460-468
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• 2005

The biotin-avidin complex, as a model recognition system, has been constructed through N-hydroxysuccinimide(NHS) reaction on a variety of substrates such as a smooth Au film, electrochemically roughened Au electrode and chemically modified mica. Stepwise self-assembled monolayers (SAMs) of biotin-avidin system were characterized by surface-enhanced resonance Raman scattering (SERRS) spectroscopy, atomic force microscopy (AFM) and surface plasmon resonance (SPR). A strong SERRS signal of rhodamine tags labeled in avidin from the SAMs on a roughened gold electrode indicated the successful complex formation of stepwise biotin-avidin recognition system. AFM images showed the circular shaped avidin aggregates (hexamer) with ca. $60{\AA}$ thick on the substrate, corresponding to one layer of avidin. The surface coverage and concentration of avidin molecules were estimated to be 90% and $7.5{\times}10^{-12}mol/cm^2$, respectively. SPR technique allowed one to monitor the surface reaction of the specific recognition with high sensitivity and precision.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.10a
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• pp.568-571
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• 2005

This paper introduces a correlation-based surface matching algorithm that can be used to reconstruct the surface topography of an object that is scanned from multiple overlapping regions by an AFM. The image matching technique is applied to two neighboring images intentionally overlapped with each other. To account for the inaccuracy of the coarse stage implemented in AFM, all the six axes including the rotational degrees of freedom are successively matched to maximize the correlation coefficient. The results show that the proposed 6-axes image matching method is useful for expanding the measurement range of AFM.

• Journal of the Microelectronics and Packaging Society
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• v.7 no.1
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• pp.35-40
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• 2000

Teflon-like fluorocarbon thin film was deposited on various substrates by vapor deposition using PFDA (perfluorodecanoic acid). The fluorocarbon films were characterized by static/dynamic contact angle analysis, VASE (Variable-angle Spectroscopic Ellipsometry) and AFM/LFM (Atomic/Lateral Force Microscopy). Based on Lewis Acid/Base theory, the surface energy ($S_{E}$) of the films was calculated by the static contact angle measurement. The work of adhesion (WA) between de-ionized water and substrates was calculated by using the static contact data. The fluorocarbon films showed very similar values of the surface energy and work of adhesion to Teflon. All films showed larger hysteresis than that of Teflon. The roughness and relative friction force of films were measured by AFM and LFM. Even though the small reduction of surface roughness was found on film on $SiO_2$surface, the large reduction of relative friction farce was observed on all films. Especially the relative friction force on TEOS was decreased a quarter after film deposition. LFM images showed the formation of "strand-like"spheres on films that might be the reason far the large contact angle hysteresis.

• Macromolecular Research
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• v.12 no.1
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• pp.134-140
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• 2004

Semi-crystalline poly(ethylene terephthalate) (PET) film surfaces were modified with argon and oxygen plasmas by radio-frequency (RF) glow discharge at 240 mTorr/40 W; the changes in topography and surface structure were investigated by atomic force microscopy (AFM) in conjunction with specular reflectance of infrared microspectroscopy (IMS). Under our operating conditions, analysis of the AFM images revealed that longer plasma treatment results in significant ablation on the film surface with increasing roughness, regardless of the kind of plasma used. The basic topographies, however, were different depending upon the kind of gas used. The specular reflectance analysis showed that the ablative mechanisms of the argon and oxygen plasma treatments are entirely different with one another. For the Ar-plasma-treated PET surface, no observable difference in the chemical structure was observed before and after plasma treatment. On the other hand, the oxygen-plasma-treated PET surface displays a significant decrease in the number of aliphatic C-H groups. We conclude that a constant removal of material from the PET surface occurs when using the Ar-plasma, whereas preferential etching of aliphatic C-H groups, with respect to, e.g. , carbonyl and ether groups, occurs upon oxygen plasma.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.25 no.7
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• pp.1047-1054
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• 2001

Atomic Force Microscope (AFM) was used to study cross sectional profiles and dimensions of fatigue striations in 2017-T351 aluminum alloy. Their widths(SW) and heights (SH, SH(sub)h, SH(sub)ι) were measured from the cross sectional profiles of three-dimension AFM images. The following results that will be helpful to understand the fatigue crack growth mechanism were obtained. (1) The relation of SH=$\alpha$(SW)(sup)1.2 was obtained. (2) The ratio of the striation height to its width SH/SW, SH(sub)h/SW and SH(sub)ι/SW did not depend on the stress intensity factor range ΔK and the stress ratio R( =P(sub)min/P(sub)max = K(sub)min/K(sub)max). (3) Effect of precipitate on the morphology of striation was changed by the relative dimensional difference between the striation width SW and the precipitates. From these results, the applicability of the AFM to nano-fractography is discussed.

• Journal of the Korean Applied Science and Technology
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• v.32 no.3
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• pp.522-527
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• 2015

We applied a displacement current measurement technique for the study of L-${\alpha}$-dilauryl phosphatidylcholine (DLPC) monolayer. Displacement current was generated at the DLPC monolayer on the water surface, while induced by compression and expansion of the monolayer. Generation of Maxwell displacement current (MDC) was observed when surface areas per DLPC molecule were approximately $200{\AA}^2$ and $40{\AA}^2$. We investigated MDC for monolayer compression cycles, and found that MDC reached the maximum at the molecular area, which was measured right before surface pressure began to increase during compression cycles. The monolayer surface morphology of Langmuir-Blodgett (LB) films was characterized using atomic force microscope (AFM). As a result, we measured the result from the microscopic properties shown in the AFM images of LB films that molecules in the monolayer were in good orientations and the thickness of the monolayer ranged from 5 to 10 nm.

• Applied Microscopy
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• v.42 no.3
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• pp.129-135
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• 2012

In this study, the changes in hair quality before and after Magic straight perm have been evaluated through a hair damage measurement method. For this, a healthy high school student's (age18 years) wavy hair was selected and permed on the left and right sides. Then, the changes caused by physical methods which were applied during the fl at iron-based Magic straight perm were evaluated based on the hair damage measurement method before and after the Magic straight perm. According to the protein release test after the Magic straight perm, 1.26% in average and 0.14% was observed in Cool Magic straight perm sample. In a field emission scanning electron microscopy (FE-SEM) test, saw teeth-shaped partial desquamation of cuticle cells and impurities were observed in the warm-treated hair sample. In atomic force microscope (AFM), line-profile is a method to represent roughness data on hair. According to analysis on 3-dimensional (3D) images, the hair with Cool Magic straight perm was lower than the hair with Warm Magic perm in terms of the color change of 3D images. In addition, vertical changes were observed in the hair with Cool Magic perm. As a result, irregular surface roughness was observed. This study proposed a method to minimize hair damage by cooling down the heat with the cool hair straightener as soon as the Warm Magic was finished.

• 한국초전도학회:학술대회논문집
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• v.10
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• pp.66-69
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• 2000

We have observed the morphology of YBCO thin films grown on the SrTiO$_3$(100) substrates by the Pulsed Laser Deposition method. AFM and SEM images show that the YBCO grains grow spirally from their own seeds whereas outgrowths are considered to remain unchained as the film thickness increases. The images of various stages of film growth suggest that the outgrowths of 1000${\sim}$2000 ${AA}$ size are mainly formed at the very early stage of film growth. The results of XRD measurement clearly show that even a film of about 10 ${AA}$ thickness already forms orthorhombic YBCO structure although common superconducting resistivity behavior is known to be observed for the films with thickness above 100 ${AA}$.

• International Journal of Precision Engineering and Manufacturing
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• v.6 no.2
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• pp.50-54
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• 2005

We report a simple, low cost, and reliable method for assembling a multi-walled nanotube (MWNT) to the end of a metal coated scanning probe microscopy (SPM) tip. By dropping the MWNT solution and applying an electric field between an SPM tip and an electrode, MWNTs which were dispersed into a dielectric solution were directly assembled onto the apex of the SPM tip due to the attraction by the dielectrophoretic force. The effective measurement of a MWNT -attached SPM tip was demonstrated by direct comparison with AFM images of a standard sample with a bare AFM tip.