• Journal of IKEEE
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• v.25 no.3
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• pp.578-583
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• 2021

This paper describes acceleration tests for reliability of semiconductors. It also describes AEC-Q100, international test standard for reliability of automotive semiconductors. Semiconductors can be used for dozens of years. So acceleration tests are essential to test potential problems over whole period of product where test time is minimized by applying intensive stresses. AEC-Q100 is a typical acceleration test in automotive semiconductors, and it is designed to find various failures in semiconductors and to analyze their causes of occurance. So it finds many problems in design and fabrication as well as it predicts lifetime and reliability of semiconductors. AEC-Q100 consists of 7 test groups such as accelerated environmental stress tests, accelerated lifetime simulation tests, package assembly integrity tests, die fabrication reliability tests, electrical verification tests, defect screening tests, and cavity package integrity tests. It has 4 grades from grade 0 to grade 3 based on operational temperature. AEC-Q101, Q102, Q103, Q104, and Q200 are applied to discrete semiconductors, optoelectronic semiconductors, sensors, multichip modules, and passive components, respectively.

• Journal of the Institute of Electronics and Information Engineers
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• v.54 no.7
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• pp.61-70
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• 2017

In this paper, an Ethernet equalizer that compensates for automotive temperature variations within a broad range is presented. Communications in automotive systems have become increasingly important because of the many electronics in vehicles. Ethernet protocols are a good candidate for automotive communications. However, they should satisfy the AEC-Q100 requirements that stipulate an operational temperature range from -40 to $150^{\circ}C$. This paper proposes an Ethernet equalizer that can recover data up until 100 m length of CAT-5 cable adaptively within a temperature range of -40 to $150^{\circ}C$. To support the wide temperature range, a feedback system is used. The proposed equalizer has a bandwidth of 31.25 MHz with a fully-differential structure and is implemented in a Hynix $0.13{\mu}m$ BCDMOS technology.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.3
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• pp.82-88
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• 2015

This paper presents a design of the enable switch circuit, which is consist of discrete device at smart junction box(SJB) board. The Enable switch circuit, which receives ignition signal (IG) for input, sends a drive signal to linear regulator and other elements. The circuit design is carried out in a BCDMOS $0.18{\mu}m$ technology, and the performances are verified through simulations according to AEC-Q100 and ISO 7637-2. Die area of the designed Enable switch circuit is $1.67mm{\times}0.54mm$ in layout, and it is shown that the die can be housed in $3mm{\times}3mm$ HVSON8 package. The designed enable switch circuit is expected to be widely adopted in various automotive SJB's since it can significantly reduce the overall printed circuit board form factor.