• Proceedings of the Korean Nuclear Society Conference
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• 2005.05a
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• pp.359-360
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• 2005

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.10a
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• pp.421-424
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• 2002

The 3-D measurement using a sinusoidal grating pattern projection is very attractive because of its high measuring speed and high sensitivity. When a sinusoidal amplitude grating was projected on an object, the surface-height distribution of the object is translated into a phase distribution of the deformed grating image. The phase-acquisition algorithms are so sufficiently simple that high-resolution phase maps using a CCD camera can be generated in a short time. The PMP technique is discussed, and the analysis of the systematic errors, the calibration procedure designed to determined the optimal setting of the measurement parameters is illustrated. Results of measurements and calibrations on the measurement plane objects are described.

• Journal of the Optical Society of Korea
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• v.20 no.6
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• pp.784-793
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• 2016

We present a single shot low coherence white light Hilbert phase microscopy (WL-HPM) for quantitative phase imaging of Si optoelectronic devices, i.e., Si integrated circuits (Si-ICs) and Si solar cells. White light interferograms were recorded by a color CCD camera and the interferogram is decomposed into the three colors red, green and blue. Spatial carrier frequency of the WL interferogram was increased sufficiently by means of introducing a tilt in the interferometer. Hilbert transform fringe analysis was used to reconstruct the phase map for red, green and blue colors from the single interferogram. 3D step height map of Si-ICs and Si solar cells was reconstructed at multiple wavelengths from a single interferogram. Experimental results were compared with Atomic Force Microscopy and they were found to be close to each other. The present technique is non-contact, full-field and fast for the determination of surface roughness variation and morphological features of the objects at multiple wavelengths.

• Proceedings of the Optical Society of Korea Conference
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• 2002.07a
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• pp.26-27
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• 2002

광학식 3차원 형상측정 기술은 산업현장과 의료분야에서 광범위하게 사용되어지고 있으며, 이에 대한 연구도 활발히 진행되고 있다. 본 연구에서는 비접촉식 3차원 형상측정 방법인 위상측정법(Phase Measuring Profilometry; PMP)을 실험적으로 구현하였으며 위상추출 알고리즘으로는 위상이동방법(Phase shifting method)과 푸리에 변환법(Fourier Transform)을 사용하여 그 결과를 비교 및 고찰하였다. (중략)

• Journal of the Korea Academia-Industrial cooperation Society
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• v.20 no.6
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• pp.598-603
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• 2019

Three-dimensional shape measurement technology is used in various industries. Among them, optical three-dimensional shape measurement techniques based on the optical trigonometry are mainly used in the field of semiconductor product inspection, where large quantities of three-dimensional shape measurements are made daily in factories and fine measurements are also required. The light source and the drive circuit, which are components of three-dimensional measurement equipment based on this optical trigonometry, produce heat generated by prolonged operation, and may be exposed to conditions where the ambient temperature is not constant, resulting in temperature-induced measurement errors. In this study, the compensation method of the Thermal Errors for Phase Measuring Profilometry is proposed. Three-Dimensional Shape Measurement Equipment based on Phase Measuring Profilometry is implemented to measure the height of an object and ambient temperature for 10 Hours, and a regression line was obtained line by making simple linear regression using measured temperature and height values. This regression line was used to correct the error of the height measurement according to the temperature, and thermal error was from 139.88 um(Micrometer) to 13.12 um.

• Proceedings of the Optical Society of Korea Conference
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• 2003.02a
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• pp.94-95
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• 2003

광학식 3차원 형상측정 기술은 산업현장과 의료분야 등에서 광범위하게 사용되어지고 있으며, 이에 대한 연구도 활발히 진행되고 있다. 본 연구에서는 푸리에 변환법에 의한 위상정보 추출 기술을 개발하고, 주파수 영역에서의 창함수 필터에 따른 위상추출 특성을 분석하였다. 광조사 장치로는 LCD 프로젝터를 이용한 투영방식(그림 1)과 레이저 간섭계 투영방식(그림 2)을 사용하였다. (중략)

• Proceedings of the Optical Society of Korea Conference
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• 2003.07a
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• pp.296-297
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• 2003

본 연구에서는 푸리에 변환법에 의한 위상정보 추출 기술을 개발하고, 주파수 영역에서의 창함수 필터에 따른 위상추출 특성을 분석하였다. 푸리에 변환법은 위상이동법과는 달리 정현파 패턴이 투영된 하나의 영상만을 이용하여 3차원 형상정보를 추출할 수 있는 장점이 있다. 획득된 영상은 오일러 공식으로부터 다음과 같이 표현할 수 있다. (중략)

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.11
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• pp.3023-3030
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• 2009

In this paper, a prediction and compensation method for the error in the phase measured by using the proportionality between two wavelengths in the TW-PMP (Two-wavelength Phase Measuring Profilometry) is proposed and experimental results are shown to verify the usefulness of the proposed method. For sample object, firstly, a phase-shifting with a quite large number of steps is adopted in measurement, compared with the conventional phase-shifting method, secondly, a 3-3 step phase-shifting method is used to measure the same object which is applied to high-speed 3D shape measurement, and then, measured results from these two phase-shifting methods are compared to calculate measurement noises. From the experimental results applying the proposed compensation method to the measured beat phase and absolute phase, it has proven that noises are decreased by 90% and 17.2% for each case.

• Journal of Institute of Control, Robotics and Systems
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• v.22 no.1
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• pp.59-65
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• 2016

As modern electronic devices get smaller and smaller, high-resolution, large Field-Of-View (FOV), fast, and cost-effective 3-dimensional (3-D) measurement is requested more and more. In particular, defect inspection machines using machine-vision technology nowadays require 3-D inspection as well as the conventional 2-D inspection. Phase Measuring Profilometry (PMP) is one of the fast non-contact 3-D shape measuring methods currently being extensively investigated in the electronic component manufacturing industry. The PMP system is well known and is successfully applied to measuring complex surface profiles with varying reflectance properties. However, for highly reflective surfaces, such as Ball Grid Arrays (BGAs), it has difficulty accurately measuring 3-D shapes. In this paper, we propose a new fast optical system that can eliminate the highly reflective saturated regions in BGA ball images. This is achieved by utilizing four Low Intensity Grating (LIG) images together with the conventional High Intensity Grating (HIG) images. Extensive experiments using BGA samples show a repeatability of under ${\pm}20um$ in standard deviation, which is suitable for most 3-D shape measurements of BGAs.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 1999.05a
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• pp.187-192
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• 1999

Noncontact measuring methodology of 3-dimensional profile using CCD camera are very attractive because of it's high measuring speed and its's high sensitivity. Especially when projecting a grid pattern over the object, the captured image have 3 dimensional information of the object. Projection moire extract 3-D information with another grid pattern in front of CCD camera. However phase measuring profilometry(PMP) obtain similar results without additional grid pattern. In this paper, the projection moire are compared with the PMP mathematically, and it is shown that PMP can generate moire image with simple mathematical computations. Experimental works are also carried out showing the same results. It is shown that using a single gird pattern, moire image can be obtained directly without any mathematical operation when some conditions are satisfied.