• 제목/요약/키워드: 0-th order diffraction

검색결과 16건 처리시간 0.027초

A study on the Variable Elimination of the 0-th order Diffraction Using the Fourier Transform in the Digital Holography Microscope System

  • Choi, Kyu-Hwan;Kim, Sung-Kyu
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.1357-1360
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    • 2009
  • In this study, the 0-th order diffraction could be efficiently removed with the obtained data for one hologram using the numerical reconstruction method. This method has a reduced data acquisition and processing time compared with the existing method wherein the data for two or more phase holograms are obtained for regeneration, and efficiently eliminates the 0-th order diffraction.

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디지털 홀로그래피에서 퓨리어 변환을 이용한 0차 회절광의 제거와 위상홀로그램의 생성에 대한 전산 모사 (Computer simulation of the removal of the 0-th order diffraction by using fourier transform in digital holography)

  • 김성규;박민철;이석;김재순;손정영
    • 한국광학회지
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    • 제15권1호
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    • pp.39-45
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    • 2004
  • CCD의 입력면에서의 물체광과 참조광의 간섭을 수치적 방법으로 생성한 광 강도 분포 홀로그램을 대상으로 퓨리어 변환방법을 이용한 0차 회절광의 제거를 전산 모사 방법으로 구현하였고, 0차 회절광 성분이 제거된 광 강도 분포와 위상을 갖는 홀로그램을 생성하였다. 그리고 그 결과를 수치적 재생 방법을 사용하여 0차 회절광 성분의 제거를 확인하였다. 그리고 퓨리어 변환 방법에 의한 0차 회절광 성분이 제거된 위상홀로그램의 생성이 가능하다. 0차 회절광을 제거하기 위한 제거 함수를 도입하였고 제거 영역에 따른 0차 회절광의 제거와 재생되는 실상의 정보 손실 정도를 비교하였고, 기존의 방법에 비하여 효과적임을 증명하였다.

비대칭 격자구조에 기초한 플라즈마 편광 빔 분리기의 구현 (Implementation of Plasmonic Polarization Beam Splitter based on an Asymmetric Grating Profile)

  • 호광춘
    • 한국인터넷방송통신학회논문지
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    • 제24권2호
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    • pp.155-160
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    • 2024
  • 편광 선택적 빔 분리 격자는 수많은 광학 정보처리 시스템에서 널리 사용되고 있다. 본 논문에서는 고효율 플라즈마 편광 빔 분리기 (PBS)를 설계하기 위하여 Littrow 구조에서 Ag 금속 층으로 구성된 소자를 구현하였다. 구현한 PBS는 투과되는 0차 TE 편광과 반사되는 0차 TM 편광에서 높은 회절효율을 달성할 수 있도록 격자깊이 및 격자 비율을 정확한 모드 전송선로 이론 (Modal Transmission-Line Theory)을 사용하여 최적화하였다. 최적화된 결과로부터 PBS는 입사 파장과 각도에 대한 광대역 특성의 장점을 가지고 있으며, TE, TM 편광 모두에 대하여 95% 보다 높은 효율을 나타내었다. 그러므로, 높은 흡광비를 갖는 이 고효율 PBS 광대역 격자는 우수한 광 회절 장치로 사용될 수 있다.

Analysis on Design and Fabrication of High-diffraction-efficiency Multilayer Dielectric Gratings

  • Cho, Hyun-Ju;Lee, Kwang-Hyun;Kim, Sang-In;Lee, Jung-Hwan;Kim, Hyun-Tae;Kim, Won-Sik;Kim, Dong Hwan;Lee, Yong-Soo;Kim, Seoyoung;Kim, Tae Young;Hwangbo, Chang Kwon
    • Current Optics and Photonics
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    • 제2권2호
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    • pp.125-133
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    • 2018
  • We report an in-depth analysis of the design and fabrication of multilayer dielectric (MLD) diffraction gratings for spectral beam combining at a wavelength of 1055 nm. The design involves a near-Littrow grating and a modal analysis for high diffraction efficiency. A range of wavelengths, grating periods, and angles of incidence were examined for the near-Littrow grating, for the $0^{th}$ and $-1^{st}$ diffraction orders only. A modal method was then used to investigate the effect of the duty cycle on the effective indices of the grating modes, and the depth of the grating was determined for only the $-1^{st}$-order diffraction. The design parameters of the grating and the matching layer thickness between grating and MLD reflector were refined for high diffraction efficiency, using the finite-difference time-domain (FDTD) method. A high reflector was deposited by electron-beam evaporation, and a grating structure was fabricated by photolithography and reactive-ion etching. The diffraction efficiency and laser-induced damage threshold of the fabricated MLD diffraction gratings were measured, and the diffraction efficiency was compared with the design's value.

밀리구조물의 다자유도 미세 변위 측정법에 대한 연구 (A study on multi degrees of freedom fine motion measurement for milli-structure)

  • 배의원;김종안;김수현;곽윤근
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2000년도 추계학술대회 논문집
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    • pp.39-42
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    • 2000
  • Cutrent technological development toward miniaturization requires smaller components. These components usually generate complex multi-DOF motions other than simple 1-DOF motlon. Therefore it is essential to develop measurement methodology for 6-DOF motions. In this paper, a new 6-DOF measurement system for milli-struchlre is presented. This methodology basically employs the Optical Beam Deflection Method (OBDM) with a diffraction grating. A laser beam is emitted toward the difliaction grating which could be attached on the surface of a milli-structue and the incident ray is dif'||'&'||'acted in several directions. Among these difliacted beams, $0^{th}$ and $\pm$ $1^{th}4" order difkicted rays are detected by 4 Quadrant Photodiodes. From coordinate values fram each detector, we can get information for 6-DOF motions with lineariration method, Required resolutions for milli-struchue measurement are suh-micrometer in translation and arcsec in rotation. Experimental results indicate that proposed system has possibility to satisfy this requirement.

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대역 내 기준 파장을 갖는 근적외선 그리즘 실리콘 광 면 센서 분광기 설계 및 제작 (Design and Fabrication of an NIR Grism Si Optical Area Sensor Spectrometer with In-band Reference Wavelength)

  • 송재원
    • 센서학회지
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    • 제26권1호
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    • pp.28-34
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    • 2017
  • An NIR grism Si optical area sensor spectrometer with in-band reference wavelength is designed and fabricated. It is composed of a transmission type diffraction grating (spatial density 300 line/mm), a rectangular N-BK7 prism (apex angle 30 degree), NIR filter(cutoff wavelength 720 nm), an imaging convex lens(focal length 50 mm F1.8) and an IR modified DSLR camera (Canon EOS40D) of Si optical area sensor ($3,888{\times}2,592$ pixels, pixel size $5.710{\mu}m$). "In-band reference wavelength function" is implemented using non-dispersive 0th diffraction order optical beam. The NIR grism spectrometer is tested in a laboratory using a halogen lamp and a Neon lamp. And the spectrometer is used in an astronomy field for obtaining the planet Jupiter NIR spectrum. In-band reference wavelength i.e. un-deviation wavelength is 846 nm, an wavelength resolution is 0.3027 nm/pixel, an wavelength resolving power is 2,794 and an wavelength range is 650~1,000 nm.

다이아몬드 엔빌 셀을 이용한 Donor doped Pb(Zr0.52Ti0.48)O3 세라믹스의 상전이 압력 연구 (The Study on Phase Transition Pressure of Donor doped Pb(Zr0.52Ti0.48)O3 Ceramics with Diamond Anvil Cell)

  • 조경호;고영호;서창의;김광주
    • 한국세라믹학회지
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    • 제48권5호
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    • pp.471-478
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    • 2011
  • Investigations of crystal structure and phase transition of $Pb(Zr_{0.52}Ti_{0.48})O_3$ ceramics doped with A-site substitution impurity (La, Nd) or B-site substitution impurity (Sb, Nb) at 2 mol% concentration were carried out. X-ray diffraction patterns of impurities doped $Pb(Zr_{0.52}Ti_{0.48})O_3$ ceramics have been measured at pressures up to ~5 GPa with diamond anvil cell and synchrotron radiation. The patterns were obtained at room temperature using methanol-ethanol mixture as pressure-transmitting media. In order to refine the crystal structure, Rietveld analysis has been performed. The structures of impurities doped $Pb(Zr_{0.52}Ti_{0.48})O_3$ ceramics are tetragonal in space group P4mm at ambient pressure and are transformed into a cubic phase in space group Pm$\bar{3}$m as the pressure increases. In this study, when A-site substitution donor $La^{3+}$ or $Nd^{3+}$ ion was added to $Pb(Zr_{0.52}Ti_{0.48})O_3$ ceramics, the phase transition phenomena showed up at the pressure of 2.5~4.6 GPa, but when B-site substitution donor $Nb^{5+}$ or $Sb^{5+}$ ion was added to it, the phase transition appeared at relatively lower pressure of 1.7~2.6 GPa.

Analysis of Surface Plasmon Resonance on Periodic Metal Hole Array by Diffraction Orders

  • 황정우;윤수진;강상우;노삼규;이상준
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.176-177
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    • 2013
  • Surface plasmon polaritons (SPPs) have attracted the attention of scientists and engineers involved in a wide area of research, microscopy, diagnostics and sensing. SPPs are waves that propagate along the surface of a conductor, usually metals. These are essentially light waves that are trapped on the surface because of their interaction with the free electrons of conductor. In this interaction, the free electrons respond collectively by oscillating in resonance with the light wave. The resonant interaction between the surface charge oscillation and the electromagnetic field of the light constitutes the SPPs and gives rise to its unique properties. In this papers, we studied theoretical and experimental extraordinary transmittance (T) and reflectance (R) of 2 dimensional metal hole array (2D-MHA) on GaAs in consideration of the diffraction orders. The 2d-MHAs was fabricated using ultra-violet photolithography, electron-beam evaporation and standard lift-off process with pitches ranging from 1.8 to $3.2{\mu}m$ and diameter of half of pitch, and was deposited 5-nm thick layer of titanium (Ti) as an adhesion layer and 50-nm thick layer of gold (Au) on the semiinsulating GaAs substrate. We employed both the commercial software (CST Microwave Studio: Computer Simulation Technology GmbH, Darmstadt, Germany) based on a finite integration technique (FIT) and a rigorous coupled wave analysis (RCWA) to calculate transmittance and reflectance. The transmittance was measured at a normal incident, and the reflectance was measured at variable incident angle of range between $30^{\circ}{\sim}80^{\circ}$ with a Nicolet Fourier transmission infrared (FTIR) spectrometer with a KBr beam splitter and a MCT detector. For MHAs of pitch (P), the peaks ${\lambda}$ max in the normal incidence transmittance spectra can be indentified approximately from SP dispersion relation, that is frequency-dependent SP wave vector (ksp). Shown in Fig. 1 is the transmission of P=2.2 um sample at normal incidence. We attribute the observation to be a result of FTIR system may be able to collect the transmitted light with higher diffraction order than 0th order. This is confirmed by calculations: for the MHAs, diffraction efficiency in (0, 0) diffracted orders is lower than in the (${\pm}x$, ${\pm}y$) diffracted orders. To further investigate the result, we calculated the angular dependent transmission of P=2.2 um sample (Fig. 2). The incident angle varies from 30o to 70o with a 10o increment. We also found the splitting character on reflectance measurement. The splitting effect is considered a results of SPPs assisted diffraction process by oblique incidence.

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컴퓨터로 설계한 2 위상 흘로그램 광 저대역 필터에서 위상차가 필터의 MTF 특성에 미치는 영향 (Effects of the Phase Error on the MTF Characteristics of Binary-phase Hologram Optical Low-pass Filter)

  • 고춘수;오용호
    • 한국전기전자재료학회논문지
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    • 제18권8호
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    • pp.739-746
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    • 2005
  • When we design a binary phase holographic optical low-pass filter (HOLF), the phase difference is generally set to be $\pi$ to optimize the diffraction efficiency. However, the phase difference of real HOLF mostly deviate from $\pi$ by the error in the fabrication process. The deviation causes the (0,0)-th order diffracted beam to increase, which results In raising the diffraction efficiency. To study the effects of the phase error on the performance of HOLF, we calculated the MTF of HOLF for various phase differences. The results show that the phase error of 10 $\%$ makes little change in the filtering characteristics of HOLF. Considering the filtering by lens and CCD, the effects of the phase error becomes much smaller. To confirm it experimentally, we fabricated HOLFs for various phase differences. After installing it in a digital camera, we take picture of test targets and observe the Moire fringes and the resolution. The results agree with our prediction.

$NdFe_{10.7}TiM{0.3}(M\;=\;B,\;Ti)$$M\"{o}ssbauer$ 연구 ($M\"{o}ssbauer$ studies of $NdFe_{10.7}TiM{0.3}(M\;=\;B,\;Ti)$)

  • 김철성;이용종;김윤배;김창석
    • 한국자기학회지
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    • 제5권1호
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    • pp.64-70
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    • 1995
  • $ThMn_{12}$ 구조를 갖는 $NdFe_{10.7}TiM_{0.3}(M=B,\;Ti)$의 결정학적 및 자기적 성질을 X선 회절법과 VSM, $M\"{o}ssbauer$분광법으로 연구하였다. $NdFe_{10.7}TiM_{0.3}(M=B,\;Ti)$합금은 알곤가스 분위기의 아크 용해로에서 제조하였다. $NdFe_{10.7}TiM_{0.3}$의 결정구조는 순수 단일상의 tetragonal구조를 갖고 있으며 $a_{0}=8.587\;{\AA},\;c_{0}=4.788\;{\AA}$의 격자상수를 결정하였다. $M\"{o}ssbauer$ spectrum은 13 K 부터 770 K 영역까지 취하였으며 Curie 온도는 $NdFe_{10.7}TiM_{0.3}$의 경우 $570{\pm}3\;K$로 결정하였다. $NdFe_{10.7}TiM_{0.3}(M=B,\;Ti)$$8i_{1},\;8i_{2},\;8j_{1},\;8j_{2}$ 및 8f의 5 set의 Fe 이온의 subspectra로 분석하였다. $NdFe_{10.7}TiM_{0.3}$의 실온에서 Fe-site $8i_{1},\;8i_{2},\;8j_{1},\;8j_{2}$ 및 8f는 16.4, 8.2, 14.8, 21.3 및 39.3%의 면적비를 각각 가지고 있었다. 초미세자기장은 $H_{hf}(8i)>H_{hf}(8j)>H_{hf}(8f)$비로 감소함을 알았다.

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