• Title/Summary/Keyword: 평균제곱오차법

Search Result 81, Processing Time 0.016 seconds

Assembly and Testing of a Visible and Near-infrared Spectrometer with a Shack-Hartmann Wavefront Sensor (샤크-하트만 센서를 이용한 가시광 및 근적외선 분광기 조립 및 평가)

  • Hwang, Sung Lyoung;Lee, Jun Ho;Jeong, Do Hwan;Hong, Jin Suk;Kim, Young Soo;Kim, Yeon Soo;Kim, Hyun Sook
    • Korean Journal of Optics and Photonics
    • /
    • v.28 no.3
    • /
    • pp.108-115
    • /
    • 2017
  • We report the assembly procedure and performance evaluation of a visible and near-infrared spectrometer in the wavelength region of 400-900 nm, which is later to be combined with fore-optics (a telescope) to form a f/2.5 imaging spectrometer with a field of view of ${\pm}7.68^{\circ}$. The detector at the final image plane is a $640{\times}480$ charge-coupled device with a $24{\mu}m$ pixel size. The spectrometer is in an Offner relay configuration consisting of two concentric, spherical mirrors, the secondary of which is replaced by a convex grating mirror. A double-pass test method with an interferometer is often applied in the assembly process of precision optics, but was excluded from our study due to a large residual wavefront error (WFE) in optical design of 210 nm ($0.35{\lambda}$ at 600 nm) root-mean-square (RMS). This results in a single-path test method with a Shack-Hartmann sensor. The final assembly was tested to have a RMS WFE increase of less than 90 nm over the entire field of view, a keystone of 0.08 pixels, a smile of 1.13 pixels and a spectral resolution of 4.32 nm. During the procedure, we confirmed the validity of using a Shack-Hartmann wavefront sensor to monitor alignment in the assembly of an Offner-like spectrometer.