• KIPS Transactions on Software and Data Engineering
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• v.2 no.3
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• pp.151-160
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• 2013

iOS applications refer to the apps operating on iOS, a mobile OS developed by Apple. As iOS provides graphic user interfaces based on touch screens, most of iOS apps support GUIs. GUIs become increasingly important for iOS apps. So are GUI tests. As GUI functions are performed by event handlers, faulty event handlers could cause defects in GUIs. Hence, this study detects faults in event handlers as a way to test GUIs for iOS apps, and suggests how to generate test cases by re-defining input domains of event handlers.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.15 no.10
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• pp.5906-5911
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• 2014

Currently, there are many processes of package assembly and inspections of real fields that examine whether a manufactured semiconductor can be operated regularly and can endure low humidity or high temperatures. As the inspection equipment of a semiconductor test handler picker has been used at the inspection process, these inspection equipment frames were modelled in 3D and these models were analyzed using 3 kinds of fatigue loadings. As the analysis result, maximum deformation occurred at the midparts of the frames at cases 1 and 2. Among the cases of nonuniform fatigue loads, the 'SAE bracket history' with the severest change in load became the most unstable but the 'Sample history' became the most stable. Fatigue analysis result can be used effectively with the design of an inspecting equipment frame of a semiconductor test handler picker to examine the prevention and durability against damage.

• Transactions of the Korean Society of Mechanical Engineers
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• v.18 no.10
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• pp.2606-2615
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• 1994

Sorting time is one of the most important issues for auto IC test handling systems. In actual system, because of too much path, reducing the computing time for finding a sorting path is the key way to enhancing the system performance. The exhaustive path search technique can not be used for real systems. This paper proposes heuristic sorting algorithm to find the minimal sorting time. The suggested algorithm is basically based on the best-first search technique and multi-level search technique. The results are close to the optimal solutions and computing time is greately reduced also. Therefore the proposed algorthm can be effectively used for real-time sorting process in auto IC test handling systems.

• Proceedings of the KIEE Conference
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• 2006.10c
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• pp.123-126
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• 2006

We propose a new-focusing method for test handlers of compact camera module (CCM), The MMD (max-min difference) method is applied to calculate the focus value quickly considering the noisy output of CCM. Also, the fuzzy search method is applied to find the maximum focus value effectively. We design a fuzzy processor to control the lens position by focus values and brightness values, which improves the focusing performance in the sense of speed and processor memory. The proposed method is implemented by program and installed at the CCM test handler machines. The simulation results are presented to verify the usefulness of the proposed method.

• The Science & Technology
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• v.30 no.1 s.332
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• pp.88-89
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• 1997

반도체 검사장비를 제조하는 전문 벤처기업 (주)미래산업은 창업 15년만에 '테스트 핸들러'라는 장비를 개발, 돈방석에 앉았다. 공직생활 18년을 끝내고 중소기업현장에 뛰어들었다가 퇴직금 사기당하고, 18억원 들인 '완전자동웨이퍼 검사기' 개발마저 실패하는 등의 역경을 딛고 새로운 기술개발로 벤처기업의 신화를 창조했다.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.35S no.10
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• pp.77-84
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• 1998

The temperature difference occurs at the test points of chamber, because the traditional Test Handler consists of a heater and a fan. To reduce the temperature variation at different points in the chamber, we divided the heater to three parts which are controlled independently. First, we identified the chamber's parameter and then designed a LQG controllers by the identification model. RTD sensors and VME system were used to construct the temperature control system. In our experiment for the proposed control system, the temperature variation was reduced from ${\pm}1.5^{\circ}C$ to ${\pm}0.35^{\circ}C$ at 50$^{\circ}C$ ${\cdot}$ 80$^{\circ}C$ and 120$^{\circ}C$.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.15 no.8
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• pp.4815-4820
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• 2014

As semiconductor chips are on a small scale, large content and high integratation, it is essential to develop the device of pick and place at the system of the semiconductor test handler to ensure its high precision and durability. In this study, inspection equipment frame model of a semiconductor test handler picker was investigated by vibration analysis with the property of the natural frequency and harmonic response. As 3 kinds of analysis case models, the device of pick and place was located at the left side (Case 1), the center (Case 2) and the right side (Case 3) of the upper guideline. The range of natural frequencies until the 6th order on this frame model ranges from 80Hz to 500Hz. As the analysis of the harmonic response when the frame is resonant, Case 2 showed the maximum equivalent stress of 52.802 MPa more than Cases 1 or 3. Case 2 was the most intensive among the three cases. Using the analysis result of this study, the design of the frame model, which can be applied to the safe working environment of the system is believed to be possible.

• 제어로봇시스템학회:학술대회논문집
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• 1997.10a
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• pp.73-76
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• 1997

The temperature control system for semiconductor test handler is designed. We controlled the temperature of chamber using 3-wire RTD sensor and MVME EMbedded controller. VxWorks that is a real-time operating system is used and heater is controlled by PWM. Temperature fluctuation of chamber is decreased within 0.3.deg. C, which is about one-half of that of commercial controller.

• 제어로봇시스템학회:학술대회논문집
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• 1997.10a
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• pp.77-80
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• 1997

In this paper presented is a temperature controller for a semiconductor test handler. Using ARMAX model and least square method, the chamber model for the design of a controller is identified through experiment. With the identified model an LQG/LTR controller is designed. Experiment with a real test handler demonstrated good performance in that its overshoot is small and response time is fast.

• Journal of Institute of Control, Robotics and Systems
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• v.13 no.11
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• pp.1112-1118
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• 2007

We propose a new-focusing method for test handlers of compact camera module (CCM), The MMD (max-min difference) method is applied to calculate the focus value quickly considering the noisy output of CCM. Also, the fuzzy search method is applied to find the maximum focus value effectively. We design a fuzzy processor to control the lens position by focus values and brightness values, which improves the focusing performance in the sense of speed and processor memory. The proposed method is implemented by computer program and installed at the CCM test handler machines. The simulation results are presented to verify the usefulness of the proposed method.