• Proceedings of the Optical Society of Korea Conference
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• 2002.07a
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• pp.26-27
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• 2002

광학식 3차원 형상측정 기술은 산업현장과 의료분야에서 광범위하게 사용되어지고 있으며, 이에 대한 연구도 활발히 진행되고 있다. 본 연구에서는 비접촉식 3차원 형상측정 방법인 위상측정법(Phase Measuring Profilometry; PMP)을 실험적으로 구현하였으며 위상추출 알고리즘으로는 위상이동방법(Phase shifting method)과 푸리에 변환법(Fourier Transform)을 사용하여 그 결과를 비교 및 고찰하였다. (중략)

• Journal of the Korean Society for Precision Engineering
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• v.20 no.10
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• pp.12-21
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• 2003

• Proceedings of the Optical Society of Korea Conference
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• 2003.07a
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• pp.154-155
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• 2003

PMP(Phase Measuring Profilometry)측정법은 투영계와 기록계의 기하학적 구성과 광학계의 정렬적인 문제에 의해서 기본적으로 오차를 가지고 측정된다. 일반적으로 PMP 형상 측정에서 측정면과 광학계의 높이가 피 측정면에 비해서 상당히 큰 경우, CCD 카메라에서 높이 방향으로 측정영역이 작아지게됨으로써 측정위상이 기준면에서의 위치와 높이 방향에 따라서 다르게 나타나고 프로젝터가 측정면에 투영되는 간섭무의의 피치가 다르게 적용된다. (중략)

• Journal of the Korean Society for Precision Engineering
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• v.17 no.6
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• pp.210-217
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• 2000

Noncontact measuring methodology of 3-dimensional profile using CCD camera are very attractive because of it's high measuring speed and it's high sensitivity. Especially when projecting a grid pattern over the object, the captured image have 3 dimensional information of the object. Projection moire extract 3-D information with another grid pattern in front of CCD camera. However phase measuring profilometry(PMP) obtain similar results without additional grid pattern. In this paper, the projection moire are compared with the PMP mathematically, and it is shown that PMP can generate moire image with simple mathematical computations. Experimental works are also carried out showing the same results. It is shown that using a single gird pattern, moire image can be obtained directly without any mathematical operation when some conditions are satisfied.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.05a
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• pp.181-181
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• 2004

3 차원 형상측정기술(3-D Profile Measurement Method)은 가공품의 치수검사 및 형상측정 등의 공학분야뿐만 아니라 최근에는 의류산업 및 의학산업은 물론 오락산업의 가상현실 구현 등 여러 분야로 점차 사용이 확대되고 있다. 이러한 요구를 만족시킬 수 있는 광학을 바탕으로 한 비접촉 3 차원 형상측정방법(Non-contacting 3-D Profile Measuring Method)은 고속, 고정밀도 측정이 가능하기 때문에 활발히 연구되고 있다. 광학을 이용한 대표적인 3 차원 비접촉 측정방법의 하나인 영사식 무아레는 그림자식 무아레의 단점인 격자의 크기가 측정물체보다 커야 한다는 점과 측정물체와 격자사이의 거리 제한 문제를 해결하였으며, 위상이동법을 사용함으로서, 무아레 무늬 형태의 영향을 받지 않고 측정이 가능해졌다.(중략)

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.11
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• pp.3023-3030
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• 2009

In this paper, a prediction and compensation method for the error in the phase measured by using the proportionality between two wavelengths in the TW-PMP (Two-wavelength Phase Measuring Profilometry) is proposed and experimental results are shown to verify the usefulness of the proposed method. For sample object, firstly, a phase-shifting with a quite large number of steps is adopted in measurement, compared with the conventional phase-shifting method, secondly, a 3-3 step phase-shifting method is used to measure the same object which is applied to high-speed 3D shape measurement, and then, measured results from these two phase-shifting methods are compared to calculate measurement noises. From the experimental results applying the proposed compensation method to the measured beat phase and absolute phase, it has proven that noises are decreased by 90% and 17.2% for each case.

• Korean Journal of Optics and Photonics
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• v.4 no.4
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• pp.397-402
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• 1993

This paper presents a new computational algorithm of phase-shifting interferometry which can effectively eliminate the uncertainty errors of the reference phases encountered in obtaining multiple interferograms. The algorithm treats the reference phases as additional unknowns and determines their exact values by analyzing interferograms using numerical least square technique. A series of simulations prove that this algorithm can improve measuring accuracy being unaffected by the nonlinear and random errors of phase-shifters.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2003.04a
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• pp.240-244
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• 2003

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2003.04a
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• pp.278-281
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• 2003

• Korean Journal of Optics and Photonics
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• v.26 no.3
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• pp.147-154
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• 2015

We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual-wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and a bifocal lens is experimentally investigated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements.