• Journal of the Korea Institute of Information Security & Cryptology
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• v.32 no.5
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• pp.965-973
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• 2022

As IoT(Internet of Things) devices become common, many algorithms have been developed to protect users' personal information. The laser fault injection attack that threatens those algorithms is a side-channel analysis that intentionally injects a laser beam to the outside of a device to acquire confidential information or abnormal privileges of the system. There are many studies to determine the timing of fault injection to reduce the number of necessary fault injections, but the location to inject faults is only repeatedly searched for the entire area of the device. However, when fault injection is performed in an algorithm-independent area, the attacker cannot obtain the intended faulted statement or attempt to bypass authentication, so finding areas vulnerable to fault injection and performing an attack is an important consideration in achieving a high attack success rate. In this paper, we show that a 100% attack success rate can be achieved by determining the vulnerable areas for fault injection by using electromagnetic and thermal information generated from the device's chip. Based on this, we propose an efficient fault injection attack system.

• Journal of Advanced Navigation Technology
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• v.14 no.2
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• pp.233-238
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• 2010

In this paper, we applied the forward and backward error recovery techniques to a reduced instruction set computer (risc) processor to develop two fault-tolerant processors, namely, fetch redundant risc (FRR) processor and a redundancy execute risc (RER) processor. To evaluate the fault-tolerance capability of three target processors, we developed the base risc processor, FRR processor, and RER processor in SystemC hardware description language. We performed fault injection experiment using the three SystemC processor models and the SystemC-based simulation fault injection technique. From the experiments, for the 1-bit transient fault, the failure rate of the FRR, RER, and base risc processor were 1%, 2.8%, and 8.9%, respectively. For the 1-bit permanent fault, the failure rate of the FRR, RER, and base risc processor were 4.3%, 6.5%, and 41%, respectively. As a result, for 1-bit fault, we found that the FRR processor is more reliable among three processors.

• Journal of Auto-vehicle Safety Association
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• v.16 no.3
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• pp.7-17
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• 2024

Ensuring an automated fallback strategy in response to malfunctions during the execution of the Dynamic Driving Task (DDT) is imperative for Level 4 autonomous driving systems. While Triple Modular Redundancy (TMR) represents a prominent Fail-Operational structure, its practical application to multiple systems is constrained by the substantial increase in costs. In this paper, we propose a pragmatic Fail-Operational safety concept utilizing on-board camera sensors and the Vehicle-to-Infrastructure (V2I) communication module, known as the On-Board Unit (OBU), to provide traffic signal information within the vehicle. The viability of the designed safety concept is validated through error injection simulations. This approach addresses the practical limitations associated with applying Fail-Operational functionality to numerous systems due to the considerable cost escalation. Leveraging camera sensors and V2I communication modules presents a practical and cost-effective solution for maintaining operational safety in Level 4 autonomous driving systems, particularly when responding to malfunctions in the DDT.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.21 no.9
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• pp.144-150
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• 2020

This study examined the current status of ATE in the development stage of the domestic guided weapons field, including the re-establishment of automatic test equipment (ATE), and attempted to develop methods to verify the validity of ATE in the defense sector. This study includes methods for confirming the repeatability and reproducibility of newly manufactured or replaced ATE. An error injection test is required for validation in the development phase. And pre-inspection steps are required for validation. When developing ATE, the use of an international standard testing script language ensures efficient validation and SW reliability. This ensures interoperability between the main and test equipment, and the tester can secure a test system platform that supports standardized testing methods, which is considered to be effective in validating specific ATE for each weapon system.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.14 no.6
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• pp.1429-1434
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• 2010

Generally, the simulator for mobile device tests automatically an application software after instilling again the event, which is saved in log file according to an event generation sequence, into the application software of device. But, the simulator performance for mobile device can be different according to a extraction layer even if the events are same. And, the sequence of events extracted from an application is changeable in the environment that multiple applications are operated concurrently. Therefore, even though the same applications is executed to the same sequence, the generation sequence of events is revised in accordance with the state of mobile device system, and whether the errors occur according to circumstances or not. This kind of application software error is very difficult to perform a debugging operation. In this paper, the execution state of various applications is verifiable through the re-editing of events after analyzing the events which is generated in application, kernel, middleware layer, and the event arrange/editor is designed and implemented to understand efficiently the influence on application, kernel, and middleware layer for events.

• Analytical Science and Technology
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• v.19 no.5
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• pp.400-406
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• 2006

Hydrogen analysis by elastic recoil detection has been performed utilizing polyimide film as a reference sample of known hydrogen content assuming the soundness of ion beam current integration. However beam current integration at higher incidence angle is not reliable. Scattering yield per unit fluence by current integration which is normalized per unit path length decreases as the sample tilt angle is getting higher. Moreover because beam current integration at high tilt angle is incomplete, hydrogen evaluation is very risky by direct comparison of sequentially collected recoil spectra between reference and target sample. In this study, primary ion beam dose is determined by backscattering spectrum that is collected simultaneously with recoil spectrum instead of ion beam current integration in order to reduce uncertainty arising in the process of current integration and to enhance the reliability of quantitative analysis. Three test samples are selected $-7.6{\mu}m$ polyimide film, hydrogen implanted silicondioxide and Au deposited carbon wafer- and analyzed by two methods and compared.