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http://dx.doi.org/10.13089/JKIISC.2022.32.5.965

Electromagnetic and Thermal Information Utilization System to Improve The Success Rate of Laser Fault Injection Attack  

Mun, HyeWon (Kookmin University)
Ji, Jae-deok (Korea Testing Certification)
Han, Dong-Guk (Kookmin University)
Publication Information
Journal of the Korea Institute of Information Security & Cryptology / v.32, no.5, 2022 , pp. 965-973 More about this Journal
Abstract
As IoT(Internet of Things) devices become common, many algorithms have been developed to protect users' personal information. The laser fault injection attack that threatens those algorithms is a side-channel analysis that intentionally injects a laser beam to the outside of a device to acquire confidential information or abnormal privileges of the system. There are many studies to determine the timing of fault injection to reduce the number of necessary fault injections, but the location to inject faults is only repeatedly searched for the entire area of the device. However, when fault injection is performed in an algorithm-independent area, the attacker cannot obtain the intended faulted statement or attempt to bypass authentication, so finding areas vulnerable to fault injection and performing an attack is an important consideration in achieving a high attack success rate. In this paper, we show that a 100% attack success rate can be achieved by determining the vulnerable areas for fault injection by using electromagnetic and thermal information generated from the device's chip. Based on this, we propose an efficient fault injection attack system.
Keywords
Fault Injection Attack; System; Laser; Electromagnetic emission; Heat emission;
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