• Title/Summary/Keyword: 아레니우스 모형

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Conditional Confidence Intervals for Accelerated Life Testing in Modified Arrhenius Model (수정 아레니우스 모형에서 가족수명시험에 대한 조건부 신뢰구간)

  • 박병구
    • Journal of Korean Society for Quality Management
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    • v.25 no.3
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    • pp.1-10
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    • 1997
  • In the context of accelerated life tests, procedures are given for estimating the parameters in the modified Arrhenius model and for estimating mean life at a given future stress level. The conditional confidence intervals are obtained by conditioning on ancillary statistics and pivotal quantity. Using the data of Tobias and Trindada(1986), we illustrate conditional confidence interval for parameters under use condition in the modified Arrhenius model.

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Accelerated Lifetime Data Analysis Using Quantile Regression (분위수 회귀를 이용한 가속수명시험 자료 분석)

  • Roh, Chee-Youn;Kim, Hee-Jeong;Na, Myung-Hwan
    • The Korean Journal of Applied Statistics
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    • v.21 no.4
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    • pp.631-638
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    • 2008
  • Accelerated Lifetime Test is a method of estimation of lifetime quality characteristics under operation condition with the accelerated lifetime data obtained under accelerated stress. In this paper we propose estimation method with accelerated lifetime data using quantile regression. We apply the method to real data with Arrhenius and Inverse power model.

The Acclerated Life Test of Hard Disk In The Environment of PACS (PACS 환경에서 하드디스크의 가속 수명시험)

  • Cho, Euy-Hyun;Park, Jeong-Kyu;Chae, Jong-Gyu
    • Journal of Digital Contents Society
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    • v.16 no.1
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    • pp.63-70
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    • 2015
  • In this paper, we estimate the life cycle from acceleration life test about the hard disk of disk array of image storage of PACS. Webuil distribution was selected by the Anderson-Darling goodness-of-fit test with data of down time at $50^{\circ}C$ and $60^{\circ}C$. The equality test of shape parameter and scale parameter was conducted, so that the probability distribution estimated from data of down time at $50^{\circ}C$ and $60^{\circ}C$ was not statistically significant. The shape parameter was 1.0409, The characteristic life was 24603.5 hours at normal user condition($30^{\circ}C$) by the analysis of weibull-arrhenius modeling which included the acceleration factor of temperature, and The activation energy was 0.5011 eV through arrhenius modeling. The failure analysis of the failure samples of acceleration test and the samples of market return was conducted, so that the share percentage of failure mode was detail difference but the rank of share percentage was almost same. This study suggest the test procedure of acceleration test of hard disk drive in PACS using environment, and help the life estimation at manufacture and use.

A Study on the Over-current Characteristics of IV Insulated Wire Sheath According to Accelerated Degradation (가속열화에 따른 IV절연전선 피복의 과전류 특성에 관한 연구)

  • Kim, Si-Kuk;Choi, Su-Gil
    • Fire Science and Engineering
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    • v.32 no.2
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    • pp.48-56
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    • 2018
  • This paper reports the results of a study on the over-current characteristics of IV insulated wire sheath according to accelerated degradation. In order to examine the degradation of a IV insulated wire sheath through insulation, acceleration degradation experiments were performed using the Arrhenius equation of acceleration life test models; test samples with equivalent lives of 0, 10, 20, 30 and 40 years were prepared. Then allowed currents with over-current of 100%~500% were introduced to measure the times of first generation of smokes and carbonization in the wire sheath, and it was found that the times of first generation of smokes and carbonization in the wire sheath decreased as the equivalent life increased. In more detail, when 270% over-current is applied, the electrical fire risk of equivalent life of 40 years increased by approximately 3.2 times based on equivalent life of 0 years. Also, when the over-current was 255% and 260%, carbonization occurred only in the equivalent life of 40 years, and the fire risk according to the accelerated degradation was increased dramatically. In addition, FT-IR and SEM analyzes were used to confirm the characteristics and surface changes of IV insulated wire sheath according to the equivalent life.

The Accelerated Life Test of 2.5 Inch Hard Disk In The Environment of PC using (PC 사용 환경의 2.5 인치 하드디스크의 가속 수명 시험)

  • Cho, Euy-Hyun;Park, Jeong-Kyu;Seo, Hui-Don
    • Journal of Digital Contents Society
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    • v.15 no.1
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    • pp.19-27
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    • 2014
  • In order to estimate the life of 2,5 inch HDD which is adopted by PC environment, make the test plan which reflect the failure mode of market, make the test model of accelerated life test which reflect the stress of temperature. after an analysis of the environment of PC using, test procedure was decided that operation was write 50 % and read 50 %, and then access method was sequential 50 % and random 50%. The acceleration life test was executed on condition that temperature was $50^{\circ}C$ and $60^{\circ}C$, performance was 95 % in max performance, test time was 1000 hours. by the test of goodness of fit of anderson-darling of the failure data during test, it was confirmed that the distribution of failure fellow weibull. test for shape and scale was equal, and shape parameter was 0.7177, characteristic life was 429434 hours at normal user condition($30^{\circ}C$) by the analysis of weibull-arrhenius modeling. It made no difference about the statistics when equality test was executed. The activation energy was 0.2775eV. In analyzing between the failure samples of acceleration test and the samples of market return even though there is detail difference about the share of failure mode, the rank of share was almost same. This study suggest the test procedure of acceleration test of 2.5 inch HDD in PC using environment, and help the life estimation at manufacture and user.

A Study on the Performance Change of Insulation Sheath Due to Accelerated Degradation of IV and HIV Insulated Wire (IV 및 HIV 절연전선의 가속열화에 따른 절연피복의 성능변화에 관한 연구)

  • Choi, Su-Gil;Kim, Si-Kuk
    • Fire Science and Engineering
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    • v.33 no.2
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    • pp.114-123
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    • 2019
  • The paper relates to a study on the changes in performance of insulation sheath resulting from accelerated degradation of IV and HIV insulated wire. To assume insulation degradation of IV and HIV insulated wire, accelerated life tests using Arrhenius equation were conducted among accelerated life test models, and experimental samples of 0 year, 10 years, 20 years, 30 years, and 40 years in equivalent life were produced. Whereas the maximum tensile load were increased as accelerated degradation of IV and HIV insulated wire progressed, elongation percentage, rupture time, and flexibility of insulated wires were found to be gradually reduced. According to the additional surface analysis results for the insulated wires per equivalent life using a scanning electron microscope, mechanical properties of the insulator were observed to be reduced as insulation degradation resulting from aging progressed since phenomena such as formation of crystalline structures and perforation, etc. occurred on the sample surface with progression of accelerated degradation. Consequently, institutional replacement of insulated wires and preparation of repair times considering performance degradation of the insulator installed inside buildings are considered necessary in order to prevent in advance the risks of electrical fire resulting from degradation in insulation performance.

Life assessment of monitoring piezoelectric sensor under high temperature at high-level nuclear waste repository (고준위방사성폐기물 처분장 고온 환경 조건에 대한 모니터링용 피에조 센서의 수명 평가)

  • Changhee Park;Hyun-Joong Hwang;Chang-Ho Hong;Jin-Seop Kim;Gye-Chun Cho
    • Journal of Korean Tunnelling and Underground Space Association
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    • v.25 no.6
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    • pp.509-523
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    • 2023
  • The high-level nuclear waste (HLW) repository is exposed to complex environmental conditions consisting of high temperature, high humidity, and radiation, resulting in structural deterioration. Therefore, structural health monitoring is essential, and piezo sensors are used to detect cracks and estimate strength. However, since the monitoring sensors installed in the disposal tunnel and disposal container cannot be replaced or removed, the quantitative life of the monitoring sensor and its suitability must be assessed. In this study, the life of a piezo sensor for monitoring was assessed using an accelerated life test (ALT). The failure mode and mechanism of the piezo sensor under high temperature conditions were determined, and temperature stress's influence on the piezo sensor's life was analyzed. ALT was conducted on temperature stress and the relationship between temperature stress and piezo sensor life was suggested. The life of the piezo sensor was assessed using the Weibull probability distribution and the Arrhenius acceleration model. The suggested relationship can be used in multiple stress ALT designs for more precise life assessment.