• Journal of Korean Institute of Industrial Engineers
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• v.28 no.4
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• pp.425-434
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• 2002

Mobility of service users makes location update and paging (L/P) procedures indispensable features in mobile communication networks. Importance of optimizing the configuration of L/P areas has been increased by the growth of L/P related signaling. In this study, we deal with the L/P configuration which an LA (Location Area) may contain multiple PAs (Paging Areas). Given the network topology, L/P related parameters, and traffics generated by each cell, is provided the problem of finding optimal LA/PA configuration minimizing the amount of L/P related signaling. The optimization problem is solved using a simulated annealing, and detailed computational results are conducted to capture the effects of mobility, call arrival patterns and boundary crossing rate on the LA and PA configurations.

• Journal of Korean Institute of Industrial Engineers
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• v.27 no.3
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• pp.315-327
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• 2001

This paper considers the problem of operation sequencing in nonlinear process planning, which is the problem of selecting and sequencing operations required to produce a part with the objective of minimizing the sum of operation processing costs and machine, setup and tool change costs. Main constraints are the precedence relations among operations. The problem can be decomposed into two subproblems: operation selection and operation sequencing. We suggest four simulated annealing algorithms, which solve the two subproblems iteratively until a good solution is obtained. Here, the operation selection problem can be solved using a shortest path algorithm. Application of the algorithms is illustrated using an example. Also, to show the performances of the suggested algorithms, computational experiments were done on randomly generated test problems and the results are reported. In particular, one of the suggested algorithms outperforms an existing simulated annealing algorithm.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.12
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• pp.79-90
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• 2005

In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST to improve the embedding probabilities of random-pattern-resistant-patterns. The proposed method uses a scan-cell reordering technique based on the signal probabilities of given test cubes and specific hardware blocks that increases the embedding probabilities of care bit clustered scan chain test cubes. We have developed a simulated annealing based algorithm that maximizes the embedding probabilities of scan chain test cubes to reorder scan cells, and an iterative algorithm for synthesizing the CRIN hardware. Experimental results demonstrate that the proposed CRIN BIST technique achieves complete fault coverage with lower storage requirement and shorter testing time in comparison with the conventional methods.