• Title/Summary/Keyword: 슬림강유전체

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A Study on Electrical Characteristics of the PLZT Thin Film Acorrding to Thickness for DRAM Capacitor (DRAM소자용 PLZT 박막의 두께에 따른 전기적 특성에 관한 연구)

  • 박용범;장낙원;마석범;김성구;최형욱
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.278-281
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    • 1999
  • PLZT thin films on Pt/Ti/SiO$_2$/Si substrate were fabricated with different Thickness by pulsed laser deposition. 14/50/50 PLZT thin film showed a maximum dielectric constant value of $\varepsilon$$_{t}$=985 at 5000$\AA$, and $\varepsilon$$_{t}$=668 at 2000A. P-EI hysteresis loop of 14/50/50 PLZT thin film was slim ferroelectric. Leakage current density of 14/50/70 PLZT thin film was 10$^{-8}$ A/$\textrm{cm}^2$ at 2000$\AA$.EX>.

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