• Title/Summary/Keyword: 상악동 측벽의 두께

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Morphological Analysis of the Sinus Lateral Wall using Computed Tomography (전산화단층촬영법을 이용한 상악동 측벽의 형태학적 분석)

  • Kim, Yong-Gun
    • Journal of Dental Rehabilitation and Applied Science
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    • v.27 no.3
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    • pp.285-292
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    • 2011
  • The purpose of thise study was to measure the thickness of the sinus lateral wall using computed tomography (CT), and to find the most suitable vertical position for lateral window opening prior to sinus elevation. Thirty patients requiring sinus elevation had CT images taken with Philips Brilliance iCT. The thickness of the sinus lateral wall was measured according to its vertical position against the sinus inferior border, and its mean was calculated through three repeated measurements. When measured 2 mm above the sinus inferior border (SIB+2), the thickness of the sinus lateral wall was observed to be more than 2 mm. When measured 3 mm above the sinus inferior border (SIB +3), the sinus lateral wall was less than 2 mm in thickness. It is recommended that the lateral wall window be made 3 mm above the sinus inferior border when performing sinus elevation using the lateral approach.

Morphological Analysis of the Sinus Lateral Wall Using Cone-Beam Computed Tomography (콘빔형 전산화단층영상을 이용한 상악동 측벽의 형태학적 분석)

  • An, Seo-Young;Kim, Yong-Gun
    • Journal of Dental Rehabilitation and Applied Science
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    • v.28 no.4
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    • pp.349-357
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    • 2012
  • The purpose of this study was to measure the thickness of the sinus lateral wall using cone-beam computed tomography (CBCT), and to find the most suitable vertical position for lateral window opening prior to sinus elevation. Fifty three patients requiring sinus elevation had CBCT scans acquired by CB MercuRay (Hitachi, Medico, Tokyo, Japan) from July, 2010 to June, 2012. The thickness of the sinus lateral wall was measured according to its vertical position against the sinus inferior border (SIB), and its mean was calculated through two repeated measurements. The thickness of the sinus lateral wall was more than 2 mm at 2 mm above the sinus inferior border (SIB+2), however, it was less than 2 mm at 3 mm above the sinus inferior border (SIB+3). In conclusion, it is recommended that the inferior border of lateral wall window be made 3 mm above the sinus inferior border during sinus elevation using the lateral approach considering the thickness of the sinus lateral wall.