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Morphological Analysis of the Sinus Lateral Wall Using Cone-Beam Computed Tomography  

An, Seo-Young (Department of Oral and Maxillofacial Radiology, School of Dentistry, Kyungpook National University)
Kim, Yong-Gun (Department of Periodontology, School of Dentistry, Kyungpook National University)
Publication Information
Journal of Dental Rehabilitation and Applied Science / v.28, no.4, 2012 , pp. 349-357 More about this Journal
Abstract
The purpose of this study was to measure the thickness of the sinus lateral wall using cone-beam computed tomography (CBCT), and to find the most suitable vertical position for lateral window opening prior to sinus elevation. Fifty three patients requiring sinus elevation had CBCT scans acquired by CB MercuRay (Hitachi, Medico, Tokyo, Japan) from July, 2010 to June, 2012. The thickness of the sinus lateral wall was measured according to its vertical position against the sinus inferior border (SIB), and its mean was calculated through two repeated measurements. The thickness of the sinus lateral wall was more than 2 mm at 2 mm above the sinus inferior border (SIB+2), however, it was less than 2 mm at 3 mm above the sinus inferior border (SIB+3). In conclusion, it is recommended that the inferior border of lateral wall window be made 3 mm above the sinus inferior border during sinus elevation using the lateral approach considering the thickness of the sinus lateral wall.
Keywords
Cone-Beam Computed Tomography; Maxillary Sinus; Lateral Wall Thickness;
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