• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.102-102
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• 2010

수 Tera Watt급의 가속기 및 펄스파워 시스템은 다수의 스위치를 사용하고 있으며, 이와 같은 가속기 및 시스템의 성능은 기체방전 스위치의 성능에 직접적으로 관련되어 있다. 일반적으로 이와 같은 기체방전, 액체방전 고출력 스위치는 다목적으로 많은 연구와 개발에 응용되고 있다. 예를 들어 천둥 펄스전자빔 발생장치는 12개의 Marx gap 및 3개의 100 kV 펄스충전 전기트리거 gap을 가지고 있다. 기체 방전 또는 액체 방전 펄스 충전 갭 스위치의 음극에 펄스 고전압이 인가되면 이로 인하여 음극에서 전자빔이 발생한다. 내부에는 전자빔이 양극과 충돌하는 순간 양극표면에 플라스마가 형성된다. 이와 같은 플라스마 sheath는 축 방향 이극관 안에서 양극충전 에서 음극으로 팽창하면서 전파하며, 또한 거의 동시에 음극표면에도 플라스마가 형성되어 음극에서 양극으로도 팽창하여 전파하게 된다. 이와 같은 펄스충전 고출력 갭 스위치 안에서 발생되는 방전 플라스마의 특성에 관한 갭 breakdown 과정에 대한 특성연구를 한다. 고출력스위치의 특성 조건으로는 방전전압, 방전시간, jitter 등이 있다. 본 연구에서는 최대전압 600 KV, 최대전류 88 KA, 펄스 폭 60 ns의 특성을 가지는 고전압펄스 시스템 '천둥'을 이용하여 방전 챔버에 고전압 펄스를 인가하고 N2와 SF6 혼합기체 종류와 압력에 따른 방전 현상을 연구하였다. 전극은 구리텅스텐 합금재질의 표준전극을 사용하였고, 전극 간격은 20 mm로 고정하였다. 방전 챔버 압력을 100 torr에서 4 기압까지 변화시켜가며 실험을 진행하였고, N2에 대한 SF6의 혼합비율을 0%~100%까지 변화시키며 실험을 진행하였다. 방전 챔버에는 C-dot probe와 B-dot probe를 설치하여 전압과 전류를 측정하였고, C-dot probe 와 B-dot probe는 각각 Northstar사의 10000:1 고전압 probe와 rogowiski coil을 이용하여 시준 하였다. 실험결과 방전전압은 압력이 증가함에 따라 증가하다가 2 기압 이상에서는 완만히 증가하는 경향을 보였고, SF6 혼합비율은 0~10%까지 급격히 증가하고, 그 이상의 혼합비율에서는 완만히 증가하였다. 방전개시시간은 혼합기체 압력에 따라 증가하며 1기압 이상에서는 급격히 증가 하였다. SF6 혼합비율에 따라서는 1 기압 조건까지는 큰 차이가 없었으나 2 기압부터는 급격히 증가하였다. 안정성을 나타내는 jitter는 SF6 100%일 때 가장 컸으나 혼합기체의 변화에 따른 큰 차이는 없었다.

• Korean Journal of Optics and Photonics
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• v.13 no.2
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• pp.105-112
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• 2002

We studied the optical and structural properties of conventional and ion-beam-assisted-deposition (IBAD) Nb$_2$O$_{5}$ films which were evaporated by an electron beam gun. The vacuum-to-air spectral shift and the cross sectional SEM images of the Nb$_2$O$_{5}$ films were investigated. The results show that the IBAD Nb$_2$O$_{5}$ films have a higher packing density than the conventional Nb$_2$O$_{5}$ films. The average refractive index of IBAD Nb$_2$O$_{5}$ films was increased, while the extinction coefficient was decreased compared with the conventional films. As the oxygen flow was increased, the average refractive index and extinction coefficient of the conventional and IBAD films decreased. Both the conventional and IBAD Nb$_2$O$_{5}$ films showed inhomogeneity in refractive index, and the degree of inhomogeneity of the IBAD Nb$_2$O$_{5}$ films became larger as the ion current density was increased. All Nb$_2$O$_{5}$ films were found to be amorphous by x-ray diffraction (XRD) analysis, and hence the crystal structure of Nb$_2$O$_{5}$ films was not changed by IBAD.

• Journal of the Korean Ceramic Society
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• v.40 no.10
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• pp.967-972
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• 2003

The inner-diameter 5 cm cold hollow cathode ion source was designed for the high current density and the homogeneous beam profile of ion beam. The ion source consisted of a cylindrical cathode, a generation part of magnetic field, a plasma chamber, convex type ion optic system with two grid electrode, and DC power supply system. The cold hollow cathode ion sources were classified into standard type (I), electron output electrode modified type (II). The operation of the ion source was done with discharge current, ion beam potential and argon gas flow rate. The modification of electron output electrode resulted in uniform plasma generation and uniform area of ion beam was extended from 5 cm to 20 cm. Improved ion source was evaluated with beam uniformity, ion current, team extraction efficiency, and ionization efficiency.

• Journal of the Korean Vacuum Society
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• v.19 no.3
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• pp.199-205
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• 2010

The electrical properties and defect states in ZnO substrates were studied during high-energy electron beam irradiations. 1 MeV and 2 MeV electron-beam with dose of $1{\times}10^{16}$ electrons/$cm^2$ were irradiated on Zn-surface of the sample. In the sample irradiated by 1 MeV, the leakage current was increased by electron-beam induced surface defects, while the enhancement of on/off property and the decrease of leakage current appeared in the 2 MeV irradiated sample. From the deep level transient spectroscopy measurements for these samples, it showed that the defect states with the activation energies of $E_c$-0.33 eV and $E_v$+0.8 eV are generated during the high energy electron-beam irradiation. Especially, it considered that the $E_c$-0.33 eV state related with O-vacancy affects to their electrical properties.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.19 no.11
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• pp.2689-2696
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• 2015

Radioactive isotopes which are manufactured using a cyclotron in a radioisotope used for radiation diagnosis is affected by the production yield according to size and shape of the beam and beam uniform degree from irradiated location when the proton beam investigated the target by cyclotron. Therefore, in this paper developed the BPM(Beam Profile Monitor) device capable of measuring the beam cross-section at the cyclotron beam line. It was configured so as to be able to remote control the BPM device in LabView and used the BPM program it was to be able to easily monitor and display to analyze the graph of two-dimensional graph and a three-dimensional beam distribution numerical information of the beam obtained while scanning the tungsten wire to the X and Y axis. The time it takes to measure the beam can be confirmed 37seconds when step motor driving speed was 2000pps. Through a beam readjusted based on the measured beam distribution information by optimizing the beam distribution it can be made to maximize the RI production yield and contribute supply stabilization.

• The Journal of The Korea Institute of Intelligent Transport Systems
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• v.3 no.1 s.4
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• pp.75-83
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• 2004

This paper describes the design, fabrication, and measurement of a low side lobe antenna for RSE base station of the ETCS which is one of the ITS services. The antenna is installed on the gantry of road side and provides the wireless communication lint between vehicles and RSE. The required characteristics of ETCS base station antenna are low sidelobe and specific beam pattern by the road and install environment and installed place of OBU. To minimize the affects of multipath signal by reflection, Circular polarization is required. To get low sidelobe of antenna, array configuration and weighting factor by Taylor distribution in radiator elements are applied. The measured results of fabricated antenna are as follows; return loss of 130MHz by -10dB, an axial ratio of 2.6dB, and a gain of 17dBi. It is found that the measured beam patterns are similar to design results.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2005.05a
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• pp.324-328
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• 2005

스핀 밸스 트랜지스터를 소형화 할 수 있는 공정 기술을 소개한다. 스핀 밸브 트랜지스터는 두 개의 실리콘 에미터, 컬렉터 사이에 다층 자성 금속 박막이 존재하는 구조를 갖고 있는 스핀트로닉스 소자이다. SU8을 절연층으로 사용한 접촉 패드의 도입, 실리콘 온 인슐레이터의 사용, 그리고 이온빔/습식 복합에칭 공정의 적용으로 수 ${\mu}m$까지 소형화 할 수 있었다. 트랜지스터의 소형화에 따른 특성 변화는 관찰되지 않았으며, 기존의 트랜지스터와 동일한 $240\%$의 자기전류값을 나타내었다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.538-541
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• 2002

탄소나노튜브 (CNT)가 도포된 평면형 에미터와 원형 개구의 게이트 전극을 가지는 삼전극 전계방출 소자의 전계방출 특성을 시뮬레이션하였다. 체계적인 시뮬레이션을 위해 소자 내 전위의 공간적 분포 특정을 결정하는 전계형상인자 $\gamma$를 정의하고 이 값에 따른 전위분포의 특성과 방출 전자의 궤적을 계산하였다. 계산 결과$\gamma$ > 1 인 전압조건에서는 에미터의 가운데를 중심으로 강한 전자방출이 발생하고 전자빔이 구조의 축 방향으로 자체 집속됨을 알 수 있었다. 이렇게 되면 에미터와 게이트의 정렬이 전혀 필요하지 않게 되며 또한 별도의 전자집속회로 없이도 에미터와 양극에 있는 형광체가 1:1 로 대응하는 획기적인 디스플레이 구조를 가능하게 해 준다 적정 전압조건에서 CNT의 전계강화인자 $\beta$의 변화에 따른 총 전류를 계산한 결과，$\beta$ >3000인 CNT를 사용할 경우 실제 소자로서 구현이 가능함을 확인하였다.

• Journal of the Korean Vacuum Society
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• v.11 no.3
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• pp.176-182
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• 2002

Amorphous $TiO_2$ thin films were deposited on glass substrates by ion beam sputtering in which the ratio of $O_2$/Ar gas used as discharged gas was varied from 0 to 2. After optical and microstructure properties and chemical composition of thin films was analyzed, antireflection coating layers were fabricated with $SiO_2$/$TiO_2$ multi-layers. Thin films deposition was performed at room temperature and ion beam voltage and ion current density for sputtering of target were fixed at 1.2 kV and 200 $\mu\textrm{A}/\textrm{cm}^2$, respectively. Refractive indexs of the deposited $TiO_2$films were 2.40-2.45 at a wavelength of 633 nm. $TiO_2$films had high transmission and stoichiometry when ratio of $O_2$/Ar was 1. Rms roughness of deposited $TiO_2$ film was below 7 $\AA$. In excessive $O_2$ environments, however Rms roughness increased over 50 $\AA$. Transmittance decreased by scattering of rough surface. Reflectance of $SiO_2$/$TiO_2$multi-layers was below 1% in visible light.

• Journal of Sensor Science and Technology
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• v.5 no.5
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• pp.1-10
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• 1996

Solar cells made of the edge-defined film-fed growth Si are characterized using current-voltage, surface photovoltage, electron beam induced current, electron microprobe, scanning electron microscopy, and electron backscattering. The weak temperature dependence of the I-V curves in the EFG solar cells is due to a voltage variable shunt resistance giving higher diode ideality factors than the ideal one. The voltage variable shunt resistance is modeled by a modified recombination mechanism which includes carrier tunneling to distributed impurity energy states in the band gap within the space-charge region. The junction integrity and the substrate quality are characterized simultaneously by combining I-V and surface photovoltage (SPV) measurements. The diode ideality factors and the surface photovoltages characterize the junction integrity while the SPV diffusion lengths characterizes the substrate quality. Most of the measured samples show the voltage variable shunt resistance although how serious it is depends on the solar cell efficiency. The voltage variable shunt resistance is understood as one of the most important factors of the degradation of EFG solar cells.