• Title/Summary/Keyword: 불량 태그 검출

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The development of an EPC Code Auto-Writing and Fault Detection Algorithm for Manufacturing Process of a RFID TAG (RFID 태그 생산 공정 자동화를 위한 부적합품의 자동 검출 및 EPC Code Auto-Writing 알고리즘 개발)

  • Jung, Min-Po;Hwang, Gun-Yong;Cho, Hyuk-Gyu;Lee, Won-Youl;Jung, Deok-Gil;Ahn, Gwi-Im;Park, Young-Sik;Jang, Si-Woong
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2009.05a
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    • pp.321-325
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    • 2009
  • The detection process of defective tags in most of Korean domestic RFID manufacturing companies is handled or treated by on-hand processing after the job of chip bonding, so it has been requesting to reduce the time and cost for manufacturing of RFID tags. Therefore, in this paper, we design and implement the system to perform the functionality of detection of defective tags after the process of chip bonding, and so provide the basis of a related software to establish the foundation of a automation system for the detection of defected RFID tags which is requested in the related Korean domestic industrial field. The developed system in this paper shows the enhancement of 700% in processing speed and 100% in detection rate of defective tags, comparing to the method of on-hand processing.

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The Implementation of the Detection System of RFID Defective Tags Using UML and LabVIEW OOP (UML과 LVOOP를 활용한 RFID 불량 검출 시스템의 구현)

  • Jung, Min-Po;Cho, Hyuk-Gyu;Jung, Deok-Gil
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2011.10a
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    • pp.382-386
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    • 2011
  • It has been required to develop a defect detection system to perform defect detection capabilities after the bonding process in the production of RFID tags. However, we are difficult to design a system with understanding the characteristics of RFID tags and design concepts. Also we are difficult to modify even minor changes in features. In this paper, we design the defect RFID detection system using UML and object-oriented design techniques. We suggest the method for apply the UML Diagram to LabVIEW OOP and the technique for redesign the effect detection system's changes.

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An Implementation of the Fault Detection System in the RFID Tag Manufacturing Automation (RFID 태그 생산 공정 자동화를 위한 부적합품 검출 시스템의 구현)

  • Jung, Min-Po;Cho, Hyuk-Gyu;Jung, Deok-Gil
    • Journal of the Korea Society of Computer and Information
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    • v.16 no.2
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    • pp.47-53
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    • 2011
  • The detection process of defective tags in most of Korean domestic RFID manufacturing companies is treated by on-hand processing after the job of chip bonding, so it has been requested to reduce the time and cost for manufacturing of RFID tags. Therefore, in this paper, we implement the system to perform the detection of defective tags after the process of chip bonding, and so provide the basis of software to establish the foundation of automation system for the detection of defected RFID tags which is requested in the related Korean domestic industrial field. We have developed the system by using UML in modeling phase and JAVA in implementation phase to reduce the cost of development of program and make it easy to maintain. The developed system in this paper shows the very enhanced performance in processing speed and perfect detection rate of defective tags, comparing to the method of on-hand processing.