• Proceedings of the Korean Society of Computer Information Conference
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• 2015.07a
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• pp.1-4
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• 2015

현재 고해상도 디스플레이 제품 생산은 대량 생산 공정 시스템으로 가동하고 있으며, 대량 생산 과정에서 WAFER의 제작 불량률을 낮추는 것이 생산업체에서 무엇보다도 주요한 목표이며 이와 함께 불량 제품을 정확하고 빠르게 검출하는 것이 매우 중요하다. 본 논문에서는 불량 WAFER을 정확하게 검출하기 위한 검출시스템으로 멀티 포인트 온도 검출 방법으로 구현된 면적형 온도 센서 기능과 검출된 데이터를 유/무선 통신방식으로 상위의 관리/모니터링 시스템으로 전송 할 수 있는 기능을 가진 마스터 콘트롤러 시스템을 제안한다.

• Proceedings of the Korean Information Science Society Conference
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• 2004.04b
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• pp.697-699
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• 2004

LCD의 생산이 많아짐에 따라 LCD의 불량 검출이 중요해 지고 있다. 불랑 검사는 눈으로 확인할 수 있는 범위에서 검사가 이루어지고 있으며, 만약 눈으로 식별이 불가능한 경우 적외선 카메라나 초음파 센서를 사용하여 검사가 이루어진다. 본 논문에서는 카메라를 이용하여 LCD 패널의 표면에 있는 불량 검출을 위하여 각 Dot에 대한 R, G, B 값을 추출한 후, 추출된 픽셀을 제안된 알고리즘에 적용하여 불량을 검출하는 것을 목적으로 하고 있다.

• Journal of KIISE:Software and Applications
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• v.37 no.5
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• pp.386-393
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• 2010

A defect in an image is a set of pixels forming an irregular shape. Since a defect, in most cases, is not easy to be modeled mathematically, the defect detection problem still resides in a research area. If a given image, however, composed by certain patterns, a defect can be detected by the fact that a non-defect area should be explained by another patch in terms of a rotation, translation, and noise. In this paper, therefore, the defect detection method for a repeated multi-patterned image is proposed. The proposed defect detection method is composed of three steps. First step is the interest point detection step, second step is the selection step of a appropriate patch size, and the last step is the decision step. The proposed method is illustrated using SEM images of semiconductor wafer samples.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2011.10a
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• pp.382-386
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• 2011

It has been required to develop a defect detection system to perform defect detection capabilities after the bonding process in the production of RFID tags. However, we are difficult to design a system with understanding the characteristics of RFID tags and design concepts. Also we are difficult to modify even minor changes in features. In this paper, we design the defect RFID detection system using UML and object-oriented design techniques. We suggest the method for apply the UML Diagram to LabVIEW OOP and the technique for redesign the effect detection system's changes.

• Journal of KIISE:Software and Applications
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• v.34 no.5
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• pp.447-454
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• 2007

TFT-LCD(Thin Film transistor liquid crystal display) has become actively used front panel display technology with increasing market. Intrinsically there is region of non uniformity with low contrast that to human eye is perceived as defect. As the gray level difference between the defect and the background is hardly distinguishable, conventional thresholding and edge detection techniques cannot be applied to detect the defect. Between the patterned and un-patterned LCD defects, this paper deals with un-patterned LCD defects by using independent component analysis, adaptive thresholding and skewness. Our method showed strong results even on noised LCD images and worked successfully on the manufacturing line.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2014.10a
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• pp.316-319
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• 2014

People's interests in coffee are increasing with the expansion of coffee market. In this trend, people's taste becomes more luxurious and coffee bean's quality is considered to be very important. Currently, bean defects are mainly detected by experienced specialists. In this paper, a detection system of bean defects using machine learning is presented. This system concentrates on detecting two main defect types : bean's shape and insect damage. Convolutional Neural Networks are used for machine learning. The neural networks are comprised of two neural networks. The first neural network detects defects in the bean's shape, and the second one detects the bean's insect damage. The development of this system could be a starting point for automated coffee bean defects detection. Later, further research is needed to detect other bean defect types.

• Journal of Korea Society of Industrial Information Systems
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• v.18 no.5
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• pp.45-50
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• 2013

Recently, as the market for SMART TV expands, the camera is embedded for providing various user experience. However, this leads to occurrence of camera failure due to TV power up sequence problem, which are usually not detectable in conventional test equipments. Although the failure-detection can be possible by re-generating control signals for audio interface with new equipment, it is expensive and also requires much time to test. In this paper, for SMART TV, FPGA(Field Programmable Gate Array)-based failure-detection system is proposed which can lead to reduction of both cost and time for test.

• Proceedings of the Korean Society of Computer Information Conference
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• 2021.01a
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• pp.69-70
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• 2021

본 논문은 PPM으로 관리되고 있는 자동차 부품 제조 공정에서 검사자의 육안검사 방법을 대체하기 위해 머신비전 및 CNN 기반 불량 검출 시스템으로 제안되었던 방식들의 단점을 개선하기 위하여 기존 머신 비전 기술에 합성곱 오토인코더 모델을 적용하여 단점을 해결하였다. 본 논문에서 제시한 오토인코더를 이용하는 방법은 정상 생산품의 이미지만으로 학습을 진행하고, 학습된 모델은 불량 부위가 포함된 이미지를 입력받아 정상 이미지로 출력한다. 이 방법을 사용하여 불량의 부위와 크기를 알 수 있었으며 불량 여부의 판단은 임계치에 의한 불량 부위의 화소 수 계산으로 판단하였다.

• Journal of the Institute of Convergence Signal Processing
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• v.8 no.4
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• pp.237-243
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• 2007

In this paper, we propose the Real-time Dead-Pixel Detection and Compensation System for mobile camera and its hardware architecture. The CMOS image sensors as image input devices are becoming popular due to the demand for miniaturized, low-power and cost-effective imaging systems. However a conventional Dead-Pixel Detection Algorithm is disable to detect neighboring dead pixels and it degrades image quality by wrong detection and compensation. To detect dead pixels the proposed system is classifying dead pixels into Hot pixel and Cold pixel. Also, the proposed algorithm is processing line-detector and $5{\times}5$ window-detector consecutively. The line-detector and window-detector can search dead pixels by using one-dimensional(only horizontal) method in low frequency area and two-dimensional(vertical and diagonal) method in high frequency area, respectively. The experimental result shows that it can detect 99% of dead pixels. It was designed in Verilog hardware description language and total gate count is 23K using TSMC 0.25um ASIC library.

• Proceedings of the Korea Information Processing Society Conference
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• 2021.11a
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• pp.132-135
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• 2021

국내에서 유통되는 일회용 가스라이터 점유율의 약 절반은 국내 유일의 한 공장에서 생산하고 있다. 저렴한 외국산 가스라이터로부터 국내 사업을 보호하기 위해 품질 향상과 원가경쟁력 확보의 중요성이 매우 커진 것이 현실이다. 본 논문에서는 YOLOv4 머신러닝 객체인식 모델과 OpenCV 실시간 이미지 처리 오픈소스를 활용해 개발한 불량품 자동 검출 시스템을 제안한다. 대표적인 불량인 '액화가스 부피 불량품'을 검출하는 시스템을 개발하고 실험을 통해 그 정확성을 검증하였다. 제안한 시스템은 97%의 정확도로 상태를 분류하였으며, 이를 통해 100%의 불량을 검출할 수 있었다.