• Communications for Statistical Applications and Methods
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• v.18 no.3
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• pp.377-389
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• 2011

A higher quality level is generally perceived by customers as improved performance by assigning a correspondingly higher satisfaction score. The third generation index $C_{pmk}$ is more powerful than two useful indices $C_p$ and $C_{pk}$ that have been widely used in six sigma industries to assess process performance. In actual manufacturing industries, process capability analysis often entails characterizing or assessing processes or products based on more than one engineering specification or quality characteristic. Since these characteristics are related, it is a risky undertaking to represent the variation of even a univariate characteristic by a single index. Therefore, the desirability of using vector-valued process capability index(PCI) arises quite naturally. In this paper, we consider more powerful vector-valued process capability index $C_{pmk}$ = ($C_{pmkx}$, $C_{pmky}$)$^t$ that consider the univariate process capability index $C_{pmk}$. First, we examine the process capability index $C_{pmk}$ and plug-in estimator $\hat{C}_{pmk}$. In addition, we derive its asymptotic distribution and variance-covariance matrix $V_{pmk}$ for the vector valued process capability index $C_{pmk}$. Under the assumption of bivariate normal distribution, we study asymptotic confidence regions of our vector-valued process capability index $C_{pmk}$ = ($C_{pmkx}$, $C_{pmky}$)$^t$.

• Communications for Statistical Applications and Methods
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• v.16 no.3
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• pp.449-461
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• 2009

Higher sigma quality level is generally perceived by customers as improved performance by assigning a correspondingly higher satisfaction score. The process capability indices and the sigma level $Z_{st}$ ave been widely used in six sigma industries to assess process performance. Most evaluations on process capability indices focus on statistical estimation under normal process which may result in unreliable assessments of process performance. In this paper, we consider statistical estimation for bivariate VPCI(Vector-valued Process Capability Index) $C_{pkl}=(C_{pklx},\;C_{pklx})$ under Marshall and Olkin (1967)'s bivariate exponential process. First, we derive some limiting distribution for statistical inference of bivariate VPCI $C_{pkl}$. And we propose two asymptotic normal confidence regions for bivariate VPCI $C_{pkl}$. The proposed method may be very useful under bivariate exponential process. A numerical result based on our proposed method shows to be more reliable.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.20 no.2
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• pp.321-328
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• 2019

A military shelter for communication and information is necessary to optimize the integrated combat ability of weapon systems in the network centric warfare. Therefore, the military shelter is required for EMI shielding performance. This study examines the stable measurement points for EMI shielding effectiveness of a military shelter for communication and information. The measurement points were found by analyzing the EMI shielding effectiveness measurement data with data mining technique and process capability analysis. First, a support vector machine was used to separate the measurement point that has stable EMI shielding effectiveness according to set condition. Second, this process was conducted with process capability analysis. Finally, the results of data mining technique were compared with those of process capability analysis. As a result, 24 measurement points with stable EMI shielding effectiveness were found.

• Journal of Korean Society for Quality Management
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• v.30 no.4
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• pp.44-57
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• 2002

In this paper we study two vector-valued process capability indices $C_{p}$＝($C_{px}$, $C_{py}$ ) and $C_{pk}$＝( $C_{pkx}$, $C_{pky}$) considering process capability indices $C_{p}$ and $C_{pk}$. First, we derive two asymptotic distributions of plug-in estimators (equation omitted) and (equation omitted) under. some proper. conditions. Second, we examine the performance of asymptotic confidence regions of our process capability indices $C_{p}$＝( $C_{px}$ , $C_{py}$ ) and $C_{pk}$＝( $C_{pkx}$, $C_{pky}$) under BN($\mu$$_{x}$, $\mu$$_{y}$, $\sigma$$^2$$_{x}$, $\sigma$$^2$$_{y}$,$\rho$)$\rho$)EX>)EX>)EX>)