• Journal of the Korean Institute of Intelligent Systems
• /
• v.23 no.4
• /
• pp.286-291
• /
• 2013

In this paper, in-line type flip chip bump 3D inspection equipment, using white light interferometer with large F.O.V., which is aimed to be used in flip chip bump test process is developed. Results of flip chip bump height measurement in many substrates and repeatability test results for the bumps in fixed location of each substrate are shown. Test results from test bench and those from developed flip chip bump 3D inspection equipment are compared and as a result repeatability is improved by reducing the impact of system vibration. A valuation basis for the testing quality of flip chip bump 3D inspection equipment is proposed.

• Korean Journal of Optics and Photonics
• /
• v.16 no.4
• /
• pp.319-325
• /
• 2005

A signal processing method for white light interferometry (WLI), which performs a series of analog signal processing steps to locate the central interference fringe position at high speed: is developed and applied to a WLI temperature sensor system. We found that the new method has random walk of $0.019^{\circ}C/\sqrt{Hz}$ with good linearity. However, the temperature change in the path-matching interferometer results in drift of the measured sensor output. The temperature dependence of drift in the WLI temperature sensor system, was calculated to be $1.42{\mu}m/^{\circ}C$. It is also found that the relationship between the peak spacing in the interferogram and the spacing measured by the method can be nonlinear when the fringe spacing is comparable to the coherence length of the source.

• Proceedings of the IEEK Conference
• /
• 2000.09a
• /
• pp.975-978
• /
• 2000

본 논문에서는 고밀도 광 기록 시스템에서 코드율이 2/3인 (1,7) 코드를 사용하여 부분 응답의 목표를 다양하게 변화시켜 여러 가지 목표 응답에 대해 잡음의 대부분을 차지하는 지터(jitter) 성분만을 고려했을 때와 이에 부가적인 백색잡음(AWGN)만을 고려하였을 경우의 성능을 각각 비교, 분석하였다. 또한, 이 실험 결과를 토대로 고밀도 광 기록 채널에 적용시킬 수 있는 가능한 부분 응답들을 조사하였고, 그 결과 PR(6,6,8,4,3) ML 코드가 고밀도 기록 시스템에서 좋은 데이터 검출 능력을 나타냄을 보였다.

• Journal of the Korean Society of Manufacturing Process Engineers
• /
• v.7 no.3
• /
• pp.81-86
• /
• 2008

I present a 3-D profiler specially devised for the profile measurement of specular surfaces that requires precision shape accuracy up to a few nanometer. A profile is reconstructed from the curvature of a test part of the surface at several locations along a line. The local curvature data are acquired with White-light Scanning Interferometry. Test measurement proves that the proposed profiler is well suited for the specular surface inspection like precision mirror.

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2006.10a
• /
• pp.5-6
• /
• 2006

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2006.10a
• /
• pp.1-2
• /
• 2006

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2006.10a
• /
• pp.7-8
• /
• 2006

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2003.06a
• /
• pp.276-279
• /
• 2003

The phase change upon reflection from target surfaces in white-light interferometer induces measurement errors when target surfaces are composed of dissimilar materials. We prove that this phase change on reflection considered of the polarization of the white-light causes the shift of both envelope peak position and fringe peak position of several tens of nanometer. In addition, we propose a new equation of white-light interference fringe pertinent to the polarization of source.

• Proceedings of the Optical Society of Korea Conference
• /
• 2003.02a
• /
• pp.292-293
• /
• 2003

최근 생체의 단층영상 촬영기법으로 각광을 받고 있는 OCT (Optical Coherence Tomography)는 백색광 간섭계를 근간으로 하여 생체의 깊이 정보를 얻어낸다. 2-D 또는 3-D의 입체영상을 얻기 위해서는 1축 또는 2축의 횡방향 스캔이 필요하다. 횡방향 스캔 기법은 SEM (Scanning electron microscope)이나 공초점현미경 (Confocal microscope) 등에서 널리 사용되고 있으므로 기술적인 흥미는 적으나 축방향 (깊이 방향)의 정보 취득 방법은 OCT만의 특징으로 아직 기술적으로 해결 되어야될 부분이 많다. (중략)

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
• /
• v.18 no.4
• /
• pp.15-21
• /
• 2004

The optical characteristics; luminous flux, correlated color temperature, and CIE -chromaticity coordinate etc., of HB LED(high brightness light emitting diode) of yellow/green/white SMD(surface mounted device) type were tested with integrating sphere photometer and monochromator, and the results were comparatively evaluated And, for the white LED, color rendering indices were considered to analyze.