• Title/Summary/Keyword: 반응성 이온 에칭

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Fabrication of the Silicon Nano Structure applicable to Non-volatile Memory Device using Block Copolymer (비휘발성 메모리 소자 응용을 위한 블록 공중합체를 이용한 실리콘 나노 구조 제작)

  • Jung, Sung-Wook;Kim, Hyun-Min;Park, Dae-Ho;Sohn, Byeong-Hyeok;Jung, Jin-Chul;Zin, Wang-Cheol;Parm, I.O.;Yi, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.95-96
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    • 2005
  • 나노 구조 제작을 위한 다양한 시도 중 블록 공중합체를 이용한 방법은 현재 활발한 연구가 진행되고 있는 분야이다. 본 연구에서는 비휘발성 메모리 소자의 용량 증가를 위하여 블록 공중합체 박막을 나노 마스크로 이용하고, 평행판헝 반응관 내에서 반응성 이온 에칭을 사용하여 나노 구조의 표면을 제작하였다. 에칭동안에 나노 마스크로서 사용할 블록 공중합체 박막은 PS-b-PMMA를 이용하여 제작하였고, UV를 주사하여 PMMA를 제거하고 수직적인 나노 흩을 구성하여 나노 패터닝이 가능하도록 하였다. 실험을 통하여 매우 균일한 나노 바늘 형태의 구조를 생성할 수 있으며, 반응기체와 유량의 조절을 통하여 다양한 표면 구조를 확인할 수 있었다. 블록 공중합체는 나노 마스크로서 뛰어난 기능을 나타내며, 이를 이용하여 나노 사이즈의 패터닝이 가능하고, 표면적 증가를 통하여 비휘발성 메모리 소자의 용량 증가에 기여할 수 있다.

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Reactive ion etching of InP using $Cl_2/CH_4/H_2$ discharges ($Cl_2/CH_4/H_2$ 혼합기체를 이용한 InP 소재의 반응성 이온 에칭에 관한 연구)

  • 최익수;이병택;김동근;박종삼
    • Journal of the Korean Vacuum Society
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    • v.6 no.3
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    • pp.282-286
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    • 1997
  • Reactive ion etching (RIE) characteristics of InP in the $Cl_2$/ CH_4/H_2$ discharges was investigated, as a function of the rf power, substrate temperature and gas composition. It was observed that the etch rate increased as the rf power, sample temperature and/or $Cl_2$ gas concentration increased. Etch rate of about 0.9$\mu\textrm{m}$/min was obtained at the optimum condition of 150W rf power, $180^{\circ}C$ substrate temperature and $10Cl_2$ /$5CH_4/85H_2$ gas ratio. Polymer formation was completely suppressed by adding $Cl_2$ to the $CH_4$ /$H_2$ discharges.

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Sputtering으로 증착된 금(Au) 박막과 사파이어(Al203) 모재사이의 입계반응

  • 박재원;이광원;최병호
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.142-142
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    • 1999
  • 열역학적 평형하에서 금(Au)은 사파이어(Sapphire: 다결정 Al203)와 반응을 하지 않으므로 접합성이 약하나 사파이어표면을 Ar 이온으로 에칭한후 금박막을 증착하였을 때 후 열처리 없이도 대단히 강한 접합(>70MPa)이 얻어졌다. 접합기구를 규명하기 위해 고 해상도 Auger 전자광분광기로 금/사파이어 쌍의 입계에 Ai-Al-O 화합물이 1-2 원자층 범위내에서 형성되어 있고 7KeV의 Ar 이온에너지로 3분간 조사하을 때 사파이어표면에 환원으로 인한 금속알루미늄이 형성되어 있음이 발견되었다. 이 이온조사로 인한 환원은 선택적 에칭으로 인한 것으로 TRIM 계산결과와도 일치하는 것이다. 따라서 금박막과 이온조사된 사파이어 사이의 강한 접합은 이온조사로 인한 사파이어 표면에 충돌할 때의 운동 에너지가 구동력이 되어 Au-Al-O 화합물의 형성으로 결론될 수 있다.

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A study on the E-beam resist characteristics of plasma polymerized styrene (플라즈마중합 스티렌 박막의 e-beam 레지스트 특성에 관한 연구)

  • 이덕출;박종관
    • Electrical & Electronic Materials
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    • v.7 no.5
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    • pp.425-429
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    • 1994
  • In this paper, we study on the plasma polymerized styrene as a negative electron-beam resist. Plasma polymerized thin film was prepared using an interelectrode inductively coupled gas-flow type reactor. We show that polymerization parameters of thin film affect sensitivity and etching resistance of the resist. Molecular weight distribution of plasma polymerized styrene is 1.41-3.93, and deposition rates of that are 32-383[.angs./min] with discharge power. Swelling and etching resistance becomes . more improved with increasing discharge power during plasma polymerization. Etch rate by RIE is higher than that by plasma etching.

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Effects of various Pretreatments on the Nucleation of CVD Tungsten (전처리가 CVD 텅스텐의 핵 생성에 미치는 영향)

  • Kim, Eui-Song;Lee, Chong-Mu;Lee, Jong-Gil
    • Korean Journal of Materials Research
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    • v.2 no.6
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    • pp.443-451
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    • 1992
  • Effects of various pretreatments on the nucleation of CVD-W deposited on the reactively sputter-deposited TiN was investigated. Incubation period of nucleation and deposition rate decreased by the pretreatment of Ar rf-sputter etching for the depth below 300k, but they increased for the etchig depth over 200A. The preteatment of Ar ion implantation decreased the incubation period of nucleation, but increased deposition rate. Also Si$H_4$flushing pretreatment decreased the incubation period of nucleation slightly due to the absorption of Si by TiN surface.

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Reactive Ion Etching of InP Using $CH_4/H_2$ Inductively Coupled Plasma ($CH_4/H_2$유도결합 플라즈마를 이용한 InP의 건식 식각에 관한 연구)

  • 박철희;이병택;김호성
    • Journal of the Korean Vacuum Society
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    • v.7 no.2
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    • pp.161-168
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    • 1998
  • Reactive ion etching process for InGaAs/InP using the CH4/H2 high density inductively coupled plasma was investigated. The experimental design method proposed by Taguchi was utilized to cover the whole parameter range while maintaining reasonable number of actual experiments. Results showed that the ICP power mainly affects surface roughness and verticality of the sidewall, bias power does etch rate and verticality, CH4 gas concentraion does the verticality and etch rate, and the distance between the induction coil and specimen mostly affects the surface roughness. It was also observed that the chamber pressure is the dominant parameter for the etch rate and verticality of the sidewall. The optimum condition was ICP power 700W, bias power 150 W, 15% $CH_4$, 7.5 mTorr, and 14 cm distance, resulting in about 3 $\mu\textrm{m}$/hr etch rate with smooth surfaces and vertical mesa sidewalls.

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A Study on Electrochemical Regeneration of Waste Iron-chloride Etchant and Copper Recovery (전기화학 반응에 의한 염화철 폐식각액의 재생 및 구리 회수에 관한 연구)

  • Kim, Seong-En;Lee, Sang-Lin;Kang, Sin-Choon;Kim, I-Cheol;Sheikh, Rizwan;Park, Yeung-Ho
    • Clean Technology
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    • v.18 no.2
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    • pp.183-190
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    • 2012
  • Electrochemical regeneration of the iron chloride waste solution from PCB etching reduces environmental contamination and produces copper as by-product, so the economic feasibility is high. But iron chloride waste solution contains iron and copper and the reactions occurring in the electrolytic cell are complicated. In this work, the oxidation of iron chloride and copper deposition were examined through batch electrolysis and the optimum conditions of the process parameters were found. The oxidation of ferrous chloride was achieved easily to the desired level. The copper deposition efficiency was high in the reaction using the carbon cathode when the copper density was 12 g/L with the electric current density of $350mA/cm^2$, and the ratio of the $Fe^{2+}$ ion was high. In addition, the possibility of the scale-up was confirmed in continuous operation of bench reactor using the optimum conditions obtained.

Study of On-chip Liquid Cooling in Relation to Micro-channel Design (마이크로 채널 디자인에 따른 온 칩 액체 냉각 연구)

  • Won, Yonghyun;Kim, Sungdong;Kim, Sarah Eunkyung
    • Journal of the Microelectronics and Packaging Society
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    • v.22 no.4
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    • pp.31-36
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    • 2015
  • The demand for multi-functionality, high density, high performance, and miniaturization of IC devices has caused the technology paradigm shift for electronic packaging. So, thermal management of new packaged chips becomes a bottleneck for the performance of next generation devices. Among various thermal solutions such as heat sink, heat spreader, TIM, thermoelectric cooler, etc. on-chip liquid cooling module was investigated in this study. Micro-channel was fabricated on Si wafer using a deep reactive ion etching, and 3 different micro-channel designs (straight MC, serpentine MC, zigzag MC) were formed to evalute the effectiveness of liquid cooling. At the heating temperature of $200^{\circ}C$ and coolant flow rate of 150ml/min, straight MC showed the high temperature differential of ${\sim}44^{\circ}C$ after liquid cooling. The shape of liquid flowing through micro-channel was observed by fluorescence microscope, and the temperarue differential of liquid cooling module was measuremd by IR microscope.