• Proceedings of the Optical Society of Korea Conference
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• 2008.07a
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• pp.169-171
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• 2008

마이켈슨 간섭계 시스템에 두 개의 Convex Lens를 추가함으로서 평면파 참조광을 유지 시키며, 물체에 조사되는 물체광의 조사면적을 변화시킬 수 있는 새로운 형태의 마이켈슨 간섭계를 제작 하였다. 새로운 형태의 마이켈슨 간섭계를 반사형 디지털 홀로그래피 현미경 시스템(Digital Holography Microscope System)에 적용하여 촬상소자(CCD: Charge Couple Device)에 홀로그램 기록 시 기록 가능한 CCD의 유효 영역과 재생 가능 영역에 대해 연구를 하였다

• Journal of the Korean Society for Nondestructive Testing
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• v.35 no.2
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• pp.141-149
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• 2015

In the fabrication of electronic circuits used in electronic products, molybdenum thin films are deposited on semiconductors to prevent oxidation. During the deposition, the presence of a particle or dust at the interface between the thin film and substrate causes the decrease of adhesion, performance, and life cycle. In this study, a damage measurement targeting two kinds of glass substrate, with and without particles, was performed in order to measure the change in the molybdenum thin film deposition area in the presence of a particle. Clean and dirty molybdenum thin film specimens were fabricated and directly deposited on a substrate using the sputtering method, and a reflection-type digital holographic interferometer was configured for measuring the damage. Reflection-type digital holography has several advantages; e.g., the configuration of the interferometer is simple, the measurement range can be varied depending on the magnification of a microscopic lens, and the measuring time is short. The results confirm that reflection-type digital holography is useful for the measurement of the damage and defects of thin films.

• Korean Journal of Optics and Photonics
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• v.17 no.4
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• pp.335-341
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• 2006

A modified Michelson interferometer type digital holography microscopy system is developed. There is a problem about recording and numerical reconstruction area at the microscopy application of Michelson type interferometer structure in the digital holography field. In this paper, to overcome this problem, we developed a new reflection type digital holography microscope system and increased recording and numerical reconstruction area of target object.

• Proceedings of the Optical Society of Korea Conference
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• 2007.07a
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• pp.269-270
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• 2007

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.19 no.1
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• pp.19-28
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• 2020

The spacer, which is located between the bucket and the arm of an excavator, has a role in preventing damage to the excavator arm during excavation work. When the durability of the spacer is increased, the lifetime of the arm can be extended and the processing costs can be reduced. To increase the durability of the spacer, tungsten carbide (WC) coating was applied on the surface of a spacer using the plasma transferred arc (PTA) process. The confirm the durability, a wear test using a pin-on disk type of wear testing machine was done under the given conditions and the wear amount on the surface of a tested specimen was measured using reflective digital holography. The results were compared with that of ALPHA-STEP.

• Korean Journal of Optics and Photonics
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• v.22 no.5
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• pp.214-218
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• 2011

In this paper we have applied self-reference hologram to DHM (digital holography microscopy) to remove phase aberration. We have constructed an off-axis reflection- type digital holography microscope. We have extracted a low spatial frequency hologram from the conjugated hologram and used it as a reference hologram. Experimentally we show that distortion of image and aberration of phase in a measurement system are removed using the self-reference hologram.

• Korean Journal of Optics and Photonics
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• v.25 no.2
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• pp.85-89
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• 2014

In this paper, we present a speckle-free digital hologram with conversion to an off-axis horizontal-parallax-only (HPO) hologram. First, we record the speckle-free hologram using optical scanning holography. Second, we digitally convert the full-parallax hologram to a horizontal-parallax-only hologram. Third, we convert the horizontal-parallax-only hologram to an off-axis hologram. Finally, we show that the off-axis HPO hologram can be numerically reconstructed in space.

• Korean Journal of Optics and Photonics
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• v.21 no.3
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• pp.91-96
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• 2010

The size of a reconstructed image depends on the reconstruction distance and wavelength. The double fourier transform method is proposed to eliminate the dependence on the reconstruction distance and wavelength. We can get a fixed reconstructed image size by using the double fourier transform method. Two wavelength digital holography is proposed to measure the step height, which is larger than a single wavelength. The two image size of different wavelength holograms should be the same in order to apply two wavelength digital holography. We use two wavelength digital holography and double fourier transforms to measure the step height. The measured data were reasonable and we found that the double fourier transform is useful in two wavelength digital holography.