• 제목/요약/키워드: 면외변위 간섭법

검색결과 11건 처리시간 0.032초

홀로스펙클 간섭법을 이용한 3차원 변위측정의 정량적 연구 (Quantitative Analysis of 3-D Displacements Measurement by Using Holospeckle Interferometry)

  • 주진원;권영하;박승옥
    • 대한기계학회논문집
    • /
    • 제17권5호
    • /
    • pp.1208-1217
    • /
    • 1993
  • 본 장치의 핵심은 상 홀로그래피(image holography)시스템을 구성하여 상을 확대시키고, 기준파(reference beam)의 세기를 일반적인 홀로그래피방법에 비해 매우 약하게 하여 홀로그램 기록시 확대된 영상에 스텍클 무늬를 선명하게 기록되도록 한 것이다. 물체에 미소변위를 가하여서 변형 전과후의 상태를 이중으로 기록한 홀로그 램을 얻은 후, 이로부터 확대된 홀로그래피 간섭무늬와 선명한 영의 무늬를 얻을 수 있었다. 본 시험장치로 구성된 홀로스펙클 방법의 신뢰성을 평가하기 위하여 이론적 인 변위량을 알고 있는 외팔보의 변형을 대상으로 하여 실험하였다. 외팔보에 면외 변위와 면내변위를 각각 발생시켜 이때 얻어지는 홀로그래피 간섭무늬와 영의 간섭무 늬의 간격으로부터 면위를 정량적으로 분석하였으며, 면외변위와 면내변위를 동시에 발생시켜 면내변위가 홀로그래피 간섭무늬에 미치는 영향과 면외변위가 영의 간섭무늬 에 미치는 영향을 분석하였다. 또한 홀로스펙클 방법을 이용하여 일반적인 방법으로는 는 측정이 어려운 볼 압입문제의 3차원 변형상태를 측정하고 유한요소법의 결과와 비교하였다.

Shearography의 1차도함수로부터 면외변위의 정량적 추출 (Quantitative Determination of Out-of-plane Displacement by Shearography)

  • 김경석;윤홍석;박찬주;최정석
    • 대한기계학회:학술대회논문집
    • /
    • 대한기계학회 2004년도 추계학술대회
    • /
    • pp.772-776
    • /
    • 2004
  • The paper describes the quantitative determination of out-of-plane displacement from result of Shearogrpahy, which can measure the first-order partial derivative of out-of-plane displacement directly. However, the differential sensitivity of Shearography is related to the amount of shearing, which is manually adjustable in optical interferometer and affects the quantitative determination. The relationship between those is inspected by comparing ESPI with Shearography. From the result, the amount of shearing plays a modulation factor of out-of-plane displacement and small amount of shearing gives good agreement with out-of-plane displacement.

  • PDF

전자처리 스펠클 간섭법을 이용한 다점 용접 접합부의 면외 변위측정

  • 박영문;차용훈;성백섭;김일수;김하식
    • 한국산업안전학회:학술대회논문집
    • /
    • 한국안전학회 2001년도 공동학술대회
    • /
    • pp.124-129
    • /
    • 2001
  • 점 용접부는 응력상태가 복잡하고, 피로균열은 판 두께, 너겟 직경, 용접 타점수, 부하 방식 등의 역학적인 인자와 재질, 화학성분, 표면 상태 등의 재료적인 인자, 그리고 용접전류, 가압력, 통전 시간등의 용접적인 인자의 영향을 동시에 받으며 3차원적으로 성장하므로 균열 성장 모드는 항상 혼합보드이고 균열이 박판 내면에서 발생. 성장하므로 검출이 곤란하여 균열 성장의 해석 및 예측이 어렵다/sup 1)/. 따라서 비접촉, 실시간, Whole-field, 레이저 파장 단위까지 측정이 가능하여 기존의 방법들의 문제점을 극복할 수 있고, 반도체와 같은 소형의 제품뿐만 아니라 기존에 측정하지 못했던 초고온, 대형 구조물의 변형도 정확하게 측정을 할 수 있는 ESPI법을 이용하여 일반가전 제품, 자동차 건축용에 많이 사용되고 있는 아연도금강판(SGCC)을 선택하여 단일 용접조건으로 점용접의 피치를 변화시켜 시험편을 제작하고 면외변위를 다각도로 측정하여 그 가능성을 검증하고자 한다.(중략)

  • PDF

레이저스펙클 간섭법과 4단계 위상이동법에 의한 외팔보점용접부의 면외 변위측정 (Measurement of Out-of-plane Displacement in a Spot Welded Canti-levered Plate using Laser Speckle Interferometry with 4-step Phase Shifting Technique)

  • 백태현;김명수;차병석;조성호
    • 한국정밀공학회:학술대회논문집
    • /
    • 한국정밀공학회 2001년도 춘계학술대회 논문집
    • /
    • pp.226-230
    • /
    • 2001
  • Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has advantage to be able to measure surface deformations of engineering components and materials in industrial areas with non-contact. The spekle patterns to be formed with interference phenomena of scattering phenomena measure the out-of-plane deformations, together with the use of digital image equipment to process the informations included in the speckle patterns and the display consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate analyzed by 4-step phase shifting method are close to the theoretical expectation. Also, out-0of-plane displacements of a spot welded canti-levered plate were measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded canti-levered plate is quite different from that of the canti-levered plate without spot welding.

  • PDF

레이저스펙클 간섭법과 4단계 위상이동법에 의한 외팔보 점용접부의 면외 변위측정 (Measurement of Out-of-plane Displacement in a Spot Welded Canti-levered Plate using Laser Speckle Interferometry with 4-step Phase Shifting Technique)

  • 백태현;김명수;나의균;고승기
    • 한국정밀공학회지
    • /
    • 제19권3호
    • /
    • pp.66-72
    • /
    • 2002
  • Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has advantage to be able to measure surface deformations of engineering components and materials in industrial areas with non-contact. The speckle patterns to be formed with interference and scattering phenomena can measure not only out-of-plane but also in-plane deformations, together with the use of digital image equipment to process the informations included in the speckle patterns and to display consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate analyzed by 4-step phase shifting method are close to the theoretical expectation. Also, out-of-plane displacements of a spot welded cacti-levered plate were measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded cacti-levered plate is quite different from that of the canti-levered plate without spot welding.

ESPI를 이용한 반도체 패키지 내부결함 검사에 관한 연구 (A Study on the Inner Defect Inspection for Semiconductor Package by ESPI)

  • 정승택;김경석;양승필;정현철;이유황
    • 대한기계학회:학술대회논문집
    • /
    • 대한기계학회 2003년도 추계학술대회
    • /
    • pp.1442-1447
    • /
    • 2003
  • Computer is a very powerful machine which is widely using for data processing, DB construction, peripheral device control, image processing etc. Consequently, many researches and developments have progressed for high performance processing unit, and other devices. Especially, the core units such as semiconductor parts are rapidly growing so that high-integration, high-performance, microminiat turization is possible. The packaging in the semiconductor industry is very important technique to de determine the performance of the system that the semiconductor is used. In this paper, the inspection of the inner defects such as delamination, void, crack, etc. in the semiconductor packages is studied. ESPI which is a non-contact, non-destructive, and full-field inspection method is used for the inner defect inspection and its results are compared with that of C-Scan method.

  • PDF

면외변위 측정을 위한 홀로그래피 간섭게에서 발산빔과 원통표면에 대한 오차해석 (The Analysis on the Error of Diverging Beam and Cylindrical Surface in Holographic Interferometer for Measuring out-of-plane Displacement.)

  • 강영준;문상준
    • 한국정밀공학회지
    • /
    • 제14권6호
    • /
    • pp.128-134
    • /
    • 1997
  • Holographic interferometry is a useful whole-field nondestructive tesing method for measuring deformations and vibrations of engineering structure. In practical way most holographic interferometer uses a diverging beam, a point light source. When an oject is relatively small, the optical arrangement using a collimated light source has no difficulty technically but for a large object the collimated beam connot be applied anymore practically. In this paper we calculate the error of measured displacement from the sensi- tivity vector dominated by the geometry of optical arrangement for holographic interferometer and show the result with 2-D plots. A plane surface and a cylindrical surface were chosen as objects to be measured and the results from the cases of a diverging and a collimated beams were compared and analyzed.

  • PDF

전단간섭법을 이용한 감육 곡관부의 변형 계측 (Deformation Measurement of Well Thinning Elbow by Using Shearography)

  • 정현철;김경석;장호섭;정성욱;강기수
    • 비파괴검사학회지
    • /
    • 제26권5호
    • /
    • pp.321-328
    • /
    • 2006
  • 본 논문에서는 전단간섭계를 이용하여 감육 곡관부의 변형을 계측하고 내부 감육 결함의 위치를 찾고자 하였다. 전단간섭법은 비파괴검사(NDT)와 응력/변형률 해석에 적용되어왔던 광학적 방법의 한가지이다. 이 기술은 간섭계에서 tilt mirror를 조작함으로써 조절이 가능한 민감도를 갖는 변위의 1차 도함수를 직접 측정할 수 있다는 이점을 지니고 있다. 본 논문에서는, 국부적으로 감육이 발생한 탄소강 곡관부에 대해 실험하였으며, 전단간섭법을 곡관부의 변형량 측정과 내부 감육결함 검사에 적용하였다. 실험 결과로부터, 이 기술이 내부 결함이 있는 배관부에도 적용이 가능함을 확인하였다.

Modulating Laser를 이용한 ESPI System algorithm 개발에 관한 연구 (Research about ESPI System Algorithm Development that Use Modulating Laser)

  • 김성종;강영준;박낙규;이동환
    • 한국정밀공학회지
    • /
    • 제26권7호
    • /
    • pp.65-72
    • /
    • 2009
  • Laser interferometry is widely used as a measuring system in many fields because of its high resolution and its ability to measure a broad area in real-time all at once. In conventional laser interferometry, for example out-of-plane ESPI (Electronic Speckle Pattern Interferometry), in plane ESPI, shearography and holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include nonlinear errors and limited time of use. In the present study, a new type of laser interferometry using a laser diode is proposed. Using Laser Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can be directly modulated by controlling the laser diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact. This paper reports on a new approach to the LD (Laser Diode) Modulating interferometry that involves four-frame phase shift method. This study proposes a four-frame phase mapping algorithm, which was developed to have a guaranteed application, to stabilize the system in the field and to be a user-friendly GUI. In this paper, the theory for LD wavelength modulation and sinusoidal phase modulation of LD modulating interferometry is shown. Using modulating laser and research of measurement algorithm does comparison with existent ESPI measurement algorithm. Algorithm measures using GPIB communication through most LabVIEW 8.2. GPIB communication does alteration through PC. Transformation of measurement object measures through modulating laser algorithm that develops. Comparison of algorithm of modulating laser developed newly with existent PZT algorithm compares transformation price through 3-D. Comparison of 4-frame phase mapping, unwrapping, 3-D is then introduced.