• Title/Summary/Keyword: 면외변위 간섭법

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Quantitative Analysis of 3-D Displacements Measurement by Using Holospeckle Interferometry (홀로스펙클 간섭법을 이용한 3차원 변위측정의 정량적 연구)

  • 주진원;권영하;박승옥
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.17 no.5
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    • pp.1208-1217
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    • 1993
  • The simple and effective optical technique synthesizing holographic interferometry and speckle photography is presented. The optical system used in this experiment is based on image holography. A cantilever beam located on the precision translator is used to evaluate this measurement system. Experimental results agree well with the actual displacements within the error of 2.8%. As an its application, three dimensional contact deformation in the ball indentation is measured by using this optical system and compared with the numerical analysis by finite element method.

Quantitative Determination of Out-of-plane Displacement by Shearography (Shearography의 1차도함수로부터 면외변위의 정량적 추출)

  • Kim, Koung-Suk;Yoon, Hong-Seok;Park, Chan-Ju;Choi, Jung-Suk
    • Proceedings of the KSME Conference
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    • 2004.11a
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    • pp.772-776
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    • 2004
  • The paper describes the quantitative determination of out-of-plane displacement from result of Shearogrpahy, which can measure the first-order partial derivative of out-of-plane displacement directly. However, the differential sensitivity of Shearography is related to the amount of shearing, which is manually adjustable in optical interferometer and affects the quantitative determination. The relationship between those is inspected by comparing ESPI with Shearography. From the result, the amount of shearing plays a modulation factor of out-of-plane displacement and small amount of shearing gives good agreement with out-of-plane displacement.

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전자처리 스펠클 간섭법을 이용한 다점 용접 접합부의 면외 변위측정

  • 박영문;차용훈;성백섭;김일수;김하식
    • Proceedings of the Korean Institute of Industrial Safety Conference
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    • 2001.11a
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    • pp.124-129
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    • 2001
  • 점 용접부는 응력상태가 복잡하고, 피로균열은 판 두께, 너겟 직경, 용접 타점수, 부하 방식 등의 역학적인 인자와 재질, 화학성분, 표면 상태 등의 재료적인 인자, 그리고 용접전류, 가압력, 통전 시간등의 용접적인 인자의 영향을 동시에 받으며 3차원적으로 성장하므로 균열 성장 모드는 항상 혼합보드이고 균열이 박판 내면에서 발생. 성장하므로 검출이 곤란하여 균열 성장의 해석 및 예측이 어렵다/sup 1)/. 따라서 비접촉, 실시간, Whole-field, 레이저 파장 단위까지 측정이 가능하여 기존의 방법들의 문제점을 극복할 수 있고, 반도체와 같은 소형의 제품뿐만 아니라 기존에 측정하지 못했던 초고온, 대형 구조물의 변형도 정확하게 측정을 할 수 있는 ESPI법을 이용하여 일반가전 제품, 자동차 건축용에 많이 사용되고 있는 아연도금강판(SGCC)을 선택하여 단일 용접조건으로 점용접의 피치를 변화시켜 시험편을 제작하고 면외변위를 다각도로 측정하여 그 가능성을 검증하고자 한다.(중략)

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Measurement of Out-of-plane Displacement in a Spot Welded Canti-levered Plate using Laser Speckle Interferometry with 4-step Phase Shifting Technique (레이저스펙클 간섭법과 4단계 위상이동법에 의한 외팔보점용접부의 면외 변위측정)

  • 백태현;김명수;차병석;조성호
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2001.04a
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    • pp.226-230
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    • 2001
  • Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has advantage to be able to measure surface deformations of engineering components and materials in industrial areas with non-contact. The spekle patterns to be formed with interference phenomena of scattering phenomena measure the out-of-plane deformations, together with the use of digital image equipment to process the informations included in the speckle patterns and the display consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate analyzed by 4-step phase shifting method are close to the theoretical expectation. Also, out-0of-plane displacements of a spot welded canti-levered plate were measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded canti-levered plate is quite different from that of the canti-levered plate without spot welding.

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Measurement of Out-of-plane Displacement in a Spot Welded Canti-levered Plate using Laser Speckle Interferometry with 4-step Phase Shifting Technique (레이저스펙클 간섭법과 4단계 위상이동법에 의한 외팔보 점용접부의 면외 변위측정)

  • Baek, Tae-Hyun;Kim, Myung-Soo;Na, Eui-Gyun;Koh, Seung-Ki
    • Journal of the Korean Society for Precision Engineering
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    • v.19 no.3
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    • pp.66-72
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    • 2002
  • Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has advantage to be able to measure surface deformations of engineering components and materials in industrial areas with non-contact. The speckle patterns to be formed with interference and scattering phenomena can measure not only out-of-plane but also in-plane deformations, together with the use of digital image equipment to process the informations included in the speckle patterns and to display consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate analyzed by 4-step phase shifting method are close to the theoretical expectation. Also, out-of-plane displacements of a spot welded cacti-levered plate were measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded cacti-levered plate is quite different from that of the canti-levered plate without spot welding.

A Study on the Inner Defect Inspection for Semiconductor Package by ESPI (ESPI를 이용한 반도체 패키지 내부결함 검사에 관한 연구)

  • Jung, Seung-Tack;Kim, Koung-Suk;Yang, Seung-Pil;Jung, Hyun-Chul;Lee, You-Hwang
    • Proceedings of the KSME Conference
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    • 2003.11a
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    • pp.1442-1447
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    • 2003
  • Computer is a very powerful machine which is widely using for data processing, DB construction, peripheral device control, image processing etc. Consequently, many researches and developments have progressed for high performance processing unit, and other devices. Especially, the core units such as semiconductor parts are rapidly growing so that high-integration, high-performance, microminiat turization is possible. The packaging in the semiconductor industry is very important technique to de determine the performance of the system that the semiconductor is used. In this paper, the inspection of the inner defects such as delamination, void, crack, etc. in the semiconductor packages is studied. ESPI which is a non-contact, non-destructive, and full-field inspection method is used for the inner defect inspection and its results are compared with that of C-Scan method.

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The Analysis on the Error of Diverging Beam and Cylindrical Surface in Holographic Interferometer for Measuring out-of-plane Displacement. (면외변위 측정을 위한 홀로그래피 간섭게에서 발산빔과 원통표면에 대한 오차해석)

  • Kang, Young-June;Moon, Sang-Joon
    • Journal of the Korean Society for Precision Engineering
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    • v.14 no.6
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    • pp.128-134
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    • 1997
  • Holographic interferometry is a useful whole-field nondestructive tesing method for measuring deformations and vibrations of engineering structure. In practical way most holographic interferometer uses a diverging beam, a point light source. When an oject is relatively small, the optical arrangement using a collimated light source has no difficulty technically but for a large object the collimated beam connot be applied anymore practically. In this paper we calculate the error of measured displacement from the sensi- tivity vector dominated by the geometry of optical arrangement for holographic interferometer and show the result with 2-D plots. A plane surface and a cylindrical surface were chosen as objects to be measured and the results from the cases of a diverging and a collimated beams were compared and analyzed.

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Deformation Measurement of Well Thinning Elbow by Using Shearography (전단간섭법을 이용한 감육 곡관부의 변형 계측)

  • Jung, Hyun-Chul;Kim, Koung-Suk;Chang, Ho-Sub;Jung, Sung-Wook;Kang, Ki-Soo
    • Journal of the Korean Society for Nondestructive Testing
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    • v.26 no.5
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    • pp.321-328
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    • 2006
  • In this study, the deformation oi wall thinning elbow is measured and the position of the internal thinning defect is found out by shearography. Shearography is an optical method which has applied to nondestructive testing (NDT) and the strain/stress and deformation analysis. This technique has the merit of the directly measuring the first derivative of displacement with sensitivity which can be adjusted by handling the tilt mirror in the interferometer. In this paper, we tested carbon steel pipe locally wall thinned and loaded internal pressure and the shearography was applied to measure the out-of-plane deformation of wall thinning elbow and to investigate the internal thinning defect of it. From the results, it was confirmed that this technique is proper to the practical application on the pipe line system with internal defect.

Research about ESPI System Algorithm Development that Use Modulating Laser (Modulating Laser를 이용한 ESPI System algorithm 개발에 관한 연구)

  • Kim, Seong-Jong;Kang, Young-June;Park, Nak-Kyu;Lee, Dong-Hwan
    • Journal of the Korean Society for Precision Engineering
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    • v.26 no.7
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    • pp.65-72
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    • 2009
  • Laser interferometry is widely used as a measuring system in many fields because of its high resolution and its ability to measure a broad area in real-time all at once. In conventional laser interferometry, for example out-of-plane ESPI (Electronic Speckle Pattern Interferometry), in plane ESPI, shearography and holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include nonlinear errors and limited time of use. In the present study, a new type of laser interferometry using a laser diode is proposed. Using Laser Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can be directly modulated by controlling the laser diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact. This paper reports on a new approach to the LD (Laser Diode) Modulating interferometry that involves four-frame phase shift method. This study proposes a four-frame phase mapping algorithm, which was developed to have a guaranteed application, to stabilize the system in the field and to be a user-friendly GUI. In this paper, the theory for LD wavelength modulation and sinusoidal phase modulation of LD modulating interferometry is shown. Using modulating laser and research of measurement algorithm does comparison with existent ESPI measurement algorithm. Algorithm measures using GPIB communication through most LabVIEW 8.2. GPIB communication does alteration through PC. Transformation of measurement object measures through modulating laser algorithm that develops. Comparison of algorithm of modulating laser developed newly with existent PZT algorithm compares transformation price through 3-D. Comparison of 4-frame phase mapping, unwrapping, 3-D is then introduced.