• Progress in Medical Physics
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• v.6 no.2
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• pp.35-40
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• 1995

Purpose: We have developed new film dosimetry algorithm for personal dosimetry and examined its characteristics. Materials and methods: Agfagaevart personal monitoring 2/10 films are used. Films which are in the film badges filtered with Cu 0.3mm, plastic 1.5mm, Aluminum 0.6mm and tin 0.8mm, were exposed by standard dosimetry laboratory. Irradiated energy categories are ANSI N13.1l Category III, and IV. Manual type film precessor and X-rite film densitometor was used. Filtered densities to energy relations and does to transformed densities relations can be obtained ofter transformation of H＆D curves to linear shape by polynomal fitting. Reults : Personal dose be determined within 25％ error for category m and 15％ for category IV. And we are able to evaluate the exposed energy. Conclusion : New algorithm developed in this study is good for personal dosimetry within 30％ error range for catergory III and IV. It is expectd to be complete personal dosimetry algorithm with further study for categrory, I, Dand II V.

• Journal of Advanced Navigation Technology
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• v.17 no.4
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• pp.429-434
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• 2013

In this paper, the TM (Transverse Magnetic) scattering problems by a perfectly conducting strip grating over a grounded two dielectric layers with edge boundary condition are analyzed by applying the FGMM (Fourier Galerkin Moment Method). For the TM scattering problem, the induced surface current density is expected to the very high value at both edges of the strip, then the induced surface current density on the conductive strip is expanded in a series of the multiplication of the Chebyshev polynomials of the first kind and the functions of appropriate edge boundary condition. Generally, when the value of the relative permittivity of dielectric layers over the ground plane increased, the strip width according to the sharp variation points of the reflected power is shifted to a higher value. The numerical results shown the fast convergent solution and good agreement compared to those of the existing papers.

• Nuclear Engineering and Technology
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• v.22 no.4
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• pp.359-370
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• 1990

This study concerns with comparing low-dimensional reactor kinetics methods with a three-dimensional kinetics method to be used for safety analysis of light water reactors in order to suggest means of preparing input parameters required for low-dimensional methods. For this purpose a one-dimensional finite difference two-group diffusion theory code ODTRAN and a third-order Hermit polynomial-based point kinetics code POTRAN are developed and used to obtain low-dimensional solutions to the LRA-BWR kinetics benchmark problem. The results are compared with a three-dimensional modified Borresen's coarse-mesh solution of the kinetics problem by CMSNACK code. Through this comparison some simple but practical means of preparing input parameters of low-dimensional kinetics analysis methods are suggested.

• Journal of the Computational Structural Engineering Institute of Korea
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• v.27 no.1
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• pp.17-26
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• 2014

This paper presents a dynamic crack propagation algorithm based on the Moving Least Squares(MLS) difference method. The derivative approximation for the MLS difference method is derived by Taylor expansion and moving least squares procedure. The method can analyze dynamic crack problems using only node model, which is completely free from the constraint of grid or mesh structure. The dynamic equilibrium equation is integrated by the Newmark method. When a crack propagates, the MLS difference method does not need the reconstruction of mode model at every time step, instead, partial revision of nodal arrangement near the new crack tip is carried out. A crack is modeled by the visibility criterion and dynamic energy release rate is evaluated to decide the onset of crack growth together with the corresponding growth angle. Mode I and mixed mode crack propagation problems are numerically simulated and the accuracy and stability of the proposed algorithm are successfully verified through the comparison with the analytical solutions and the Element-Free Galerkin method results.

• Journal of Elementary Mathematics Education in Korea
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• v.15 no.1
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• pp.199-219
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• 2011

In this thesis, we designed a experimental learning-teaching plan of 'decimal fraction concept' at the 4-th grade level. We rest our plan on two basic premises. One is the fact that a essential concept of decimal fraction is 'polynomial of which indeterminate is 10', and another is the fact that the origin of decimal fraction is successive measurement activities which improving accuracy through decimal partition of measuring unit. The main features of our experimental learning-teaching plan is as follows. Firstly, students can experience a operation which generate decimal unit system through decimal partitioning of measuring unit. Secondly, the decimal fraction expansion will be initially introduced and the complete representation of decimal fraction according to positional notation will follow. Thirdly, such various interpretations of decimal fraction as 3.751m, 3m+7dm+5cm+1mm, $(3+\frac{7}{10}+\frac{5}{100}+\frac{1}{1000})m$ and $\frac{3751}{1000}m$ will be handled. Fourthly, decimal fraction will not be introduced with 'unit decimal fraction' such as 0.1, 0.01, 0.001, ${\cdots}$ but with 'natural number+decimal fraction' such as 2.345. Fifthly, we arranged a numeration activity ruled by random unit system previous to formal representation ruled by decimal positional notation. A experimental learning-teaching plan which presented in this thesis must be examined through teaching experiment. It is necessary to successive research for this task.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.8 no.5
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• pp.495-503
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• 1997

In this paper, the E-polarized electromagnetic scattering problems by a resistive strip grating with tapered resistivity on 3 dielectric layers are analyzed to find out the effects for the tapered resistivity of resistive strip and the relative permittivity and thickness of 3 die- lectric layers by applying the Fourier-Galerkin moment methods. The induced surface current density is expanded in a series of Jacobi-polynomial ${P^{(\chi,\beta)}}_p$(.) of the order $\alpha$= 0 and $\beta$=1 as a kind of orthogonal polyomians, and the tapered resistivity assumes to vary linearly from 0 at one edge to finite resistivity at the other edge. The normalized reflected and transmitted powers are obtained by varying the tapered resistivity and the relative permittivity and thickness of dielectric layers. The sharp variation points are observed when the higher order modes are transferred between propagating and evanescent modes, and in general the local minimum positions occur at less grating period for the more relative permittivity of dielectric layers. It should be noted that the patterns of the normalized reflected and transmitted powers for the tapered resistivity are very much different from those of the uniform resistivity and perfectly conducting cases. The proposed method of this paper cna solve the scattering problems for the tapered resistive, uniform resistive, and PEC strip cases.

• KIPS Transactions on Software and Data Engineering
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• v.12 no.3
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• pp.141-148
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• 2023

Accurate overlay metrology is essential to achieve high yields of semiconductor products. Overlay metrology performance is greatly affected by overlay target design and measurement method. Therefore, in order to improve the performance of the overlay target, measurement methods applicable to various targets are required. In this study, we propose a new algorithm that can measure image-based overlay. The proposed measurement algorithm can estimate the sub-pixel position by using a motion vector. The motion vector may estimate the position of the sub-pixel unit by applying a quadratic equation model through polynomial expansion using pixels in the selected region. The measurement method using the motion vector can calculate the stacking error in all directions at once, unlike the existing correlation coefficient-based measurement method that calculates the stacking error on the X-axis and the Y-axis, respectively. Therefore, more accurate overlay measurement is possible by reflecting the relationship between the X-axis and the Y-axis. However, since the amount of computation is increased compared to the existing correlation coefficient-based algorithm, more computation time may be required. The purpose of this study is not to present an algorithm improved over the existing method, but to suggest a direction for a new measurement method. Through the experimental results, it was confirmed that measurement results similar to those of the existing method could be obtained.