• Proceedings of the Optical Society of Korea Conference
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• 2009.10a
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• pp.278-279
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• 2009

• Proceedings of the Optical Society of Korea Conference
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• 2007.02a
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• pp.119-120
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• 2007

• Proceedings of the Optical Society of Korea Conference
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• 2005.07a
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• pp.282-283
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• 2005

• Proceedings of the Optical Society of Korea Conference
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• 2004.02a
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• pp.230-231
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• 2004

• Proceedings of the Optical Society of Korea Conference
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• 2004.02a
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• pp.232-233
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• 2004

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.91-92
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• 2006

• Proceedings of the Optical Society of Korea Conference
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• 2008.07a
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• pp.285-286
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• 2008

• Ceramist
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• v.5 no.2
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• pp.5-7
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• 2002

• Journal of the Mineralogical Society of Korea
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• v.18 no.4 s.46
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• pp.289-299
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• 2005

Annealing experiments on albite powders, thin sections, and TEM specimens have been performed utilizing an optical microscope heating stage. Sample orientations were determined by optical microscope and XRD, and then confirmed by TEM diffraction patterns. Partial melting of samples occurred at $1030^{\circ}C$-l2 hr for powder, but at $1060^{\circ}C$-12 hr for TEM specimen. It is difficult to get TEM images of albite microstructures above this temperature due to thickening and the amorphous phase of the melted part. Correlative studies between optical microscopy and TEM indicated that the $1050^{\circ}C$-12 hr annealing in ambient condition was most adequate to observe tweed microstructures in albite through TEM. In situ TEM heating experiments for direct observation of tweed microstructures in albite may require annealing at slightly higher temperatures than $1050^{\circ}C$ considering the high vacuum condition inside TEM.

• Korean Journal of Optics and Photonics
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• v.15 no.6
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• pp.583-590
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• 2004

The autofocus is one of the important processes in the automated vision inspection or measurements using optical microscopes, because it influences the measuring accuracy. In this paper, we used the confocal microscope configuration based on not a pinhole but a single-mode optical fiber. A single mode fiber has the functions of source and detector by applying the reciprocal scheme. As a result, we acquired a simple system configuration and easy alignment of the optical axis. Also, we embodied a fast autofocus system by acquiring the focus error signal through a source modulation technique. The source modulation technique can effectively reduce physical disturbances compared with objective lens modulation, and it is easily applicable to general optical microscopes. The focus error signal was measured with respect to the modulation amplitude, reflectance of the specimen and inclination angle of the measuring surface. The performance of the proposed autofocus system was verified through autofocusing flat mirror surface. In addition, we confirmed that source modulation rarely degrades the depth resolution by the comparison between the FWHMs of axial response curves.