• Title/Summary/Keyword: 광디스크기판

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Measurement of Birefringence Distribution in Optical Disk Substrates Fabricated by Injection-Compression Molding (사출압축성형을 통한 광디스크 기판 성형 및 복굴절의 측정)

  • 김종성
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 1999.03b
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    • pp.218-224
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    • 1999
  • It is necessary to improve mechanical and optical properties in the optical disk substrates as the information storage devices with high storage density using short wavelength laser are being developed. Injection compression molding is regarded as the most suitable process to manufacture optical disk substrates with high is regarded as the most suitable process to manufacture optical disk substrates with high dimensional accuracy low residual stresses and superb optical properties In the present study polycarbonate optical disk substrates were fabricated by injection compression molding and the birefringence regarded as one of the most important optical properties for optical disk is measured. The effects of various processing conditions upon the development of birefringence distribution were examined experimentally. It was found that the value of the birefringence distribution were very sensitive to the mold wall temperature history and the variance of the birefringence distribution in the radial direction was affected by the level of the packing and the compression pressure.

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On the Birefringence Distribution in Optical Disk Substrate Fabricated by Injection Compression Molding (광디스크 기판의 사출압축성형시 발생하는 복굴절에 관한 연구)

  • Kim, Jong-Seong;Kim, Hyeon;Gang, Sin-Il
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.23 no.11 s.170
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    • pp.2050-2057
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    • 1999
  • It is necessary to improve mechanical and optical properties in the optical disk substrates as the information storage devices with high storage density using short wavelength laser are being developed. Injection compression molding is regarded as the most suitable process to manufacture optical disk substrates with high dimensional accuracy, low residual stresses, and superb optical properties. In the present study, polycarbonate optical disk substrates were fabricated by injection compression molding and the birefringence, regarded as one of the most important optical properties for optical disk, is measured. The effects of various processing conditions upon the development of birefringence distribution were examined experimentally. It was found that the values of the birefringence distribution were very sensitive to the mold wall temperature history and the variance of the birefringence distribution in the radial direction was affected by the level of the packing and the compression pressure.

Development Trend of Optical Data Storage Media and Design and Fabrication of High Density optical Disk Substrate (광 정보 저장 미디어의 개발 동향 및 광 디스크 기판의 초정밀 설계 및 성형)

  • Kim, Dong-Mook;Kang, Shin-Ill;Rhim, Yoon-Chul
    • Journal of the Korean Society for Precision Engineering
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    • v.18 no.4
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    • pp.46-54
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    • 2001
  • Technology of data storage device has developed noticeably as demands and needs of new media increase, Huge data can be conveniently handled using removable type optical disk. In the present paper, the trend and current issue of development for optical disk media are introduced. Standardization of next generation optical disk media, technology of recording and reading, and applications of magneto-optical devices are also discussed. Finally, a methodology of process optimization for design and fabrication of high density optical disk substrate is proposed.

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The Effects of Substrate Bias Voltage on the Formation of $(ZnS)_{1-x}-(SiO_2)_x$ Protective Films in Phase Change Optical Disk by R.F. Sputtering Method. (R.F. 스퍼터링법에 의한 상변화형 광디스크의 $(ZnS)_{1-x}-(SiO_2)_x$ 보호막 제조시 기판 바이어스전압의 영향)

  • Lee, Tae-Yun;Kim, Do-Hun
    • Korean Journal of Materials Research
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    • v.8 no.10
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    • pp.961-968
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    • 1998
  • In order to investigate the effects of substrate bias voltage on the formation of$ZnS-SiO_2$ protective film in phase change optical disk by R.F. magnetron sputtering method, thin dielectric film was formed on Si wafer and Corning glass by using ZnS(80mol%)-$SiO_2$(20mol%)t arget under argon gas. In this study, the Taguchi experimental method was applied in order to obtain optimum conditions with reduced number of experiments and to control numerous variables effectively. At the same time this method can assure the reproducibility of experiments. Optimum conditions for film formation obtained by above method were target RF power of 200 W. substrate RF power of 20 W, Ar pressure of 5 mTorr. sputtering time of 20 min.. respectively. The phase of specimen was determined by using XRD and TEM. The compositional analysis of specimen was performed by XPS test. In order to measure the thermal resistivity of deposited specimen, annealing test was carried out at $300^{\circ}C$ and $600^{\circ}C$. For the account of void fraction in thin film, the Bruggeman EMA(Effective Medium Approximation) method was applied using the optical data obtained by Spectroscopic Ellipsometry. According to the results of this work, the existence of strong interaction between bias voltage and sputtering time was confirmed for refractive index value. According to XRD and TEM analysis of specimen, the film structure formed in bias voltage resulted in more refined structures than that formed without bias voltage. But excess bias voltage resulted in grain growth in thin film. It was confirmed that the application of optimum bias voltage increased film density by reduction of void fraction of about 3.7%.

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Effect of Insulation Layer on Birefringence and Land-groove Pattern in DVD-RAM Substrate (단열층이 DVD 기판의 복굴절 및 전사성에 미치는 영향)

  • Kim, Y.;Seong, K.;Kang, S.
    • Proceedings of the KSME Conference
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    • 2001.06c
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    • pp.432-437
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    • 2001
  • It is necessary to improve mechanical and optical porperties in the optical disk substrates as the information storage devices with high storage density using blue laser are being developed. Injection compression molding is regarded as the most suitable process to manufacture optical disk substrates for quality recording and read-out. In the present research, the effects of processing conditions and the insulation layer thickness on gapwise birefringence and the land-groove pattern were investigated. It was found that the values of the birefringence distribution were very sensitive to mold temperature history, and the level of birefringence reduced and, furthermore, the quality of replication was improved due to the insulation layer.

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The Effects of Electrode Distance on the Formation of $(ZnS)_{1-x}(SiO_2)_x$ Protective Films in Phase Change Optical Disk by R.F. Sputtering Method (R.F. Sputtering 방법에 의한 상변화형 광디스크의 $(ZnS)_{1-x}(SiO_2)_x$ 보호막 형성에 미치는 전극거리의 영향)

  • Lee, Jun-Ho;Kim, Do-Hun
    • Korean Journal of Materials Research
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    • v.9 no.12
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    • pp.1245-1251
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    • 1999
  • Phase-change optical disk very rapid recording, high densification of data, resulting in high feedback rate and good C/N(carrier to noise) ratio of a feedback signal. However, repetitive thermal energy may cause the deformation of a disk or the lowering of an eliminability and a cyclability of the recording. The lowering of the cyclability can be reduced by insertion of thin layer of ZnS-$SiO_2$ dielectric thin film in appropriate disk structure between the upper and lower part of the recording film. Using the Taguchi method, optimum conditions satisfying both the optimized quality characteristic values and the scattering values for film formation were found to be the target R.F. power of 200W, the substrate R.F. power of 20W, the Ar pressure of 6mTorr, and the electrode distance of 6cm. From the refractive index data, the existence of the strong interaction between the electrode distance and Ar pressure was confirmed, and so was the large effect of the electrode distance on transmittance. According to the analysis of TEM and XRD, the closer the electrode distance was, the finer was the grain size due to the high deposition rate. However, the closer electrode distance brought the negative effect on the morphology of the film and caused the reduction of transmittance. AFM and SEM analyses showed that the closer the electrode distance was, the worse was the morphology due to the high rate of the deposition. Under optimum condition, the deposited thin film showed a good morphology and dense microstructure with less defects.

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Effect of Insulation Layer on Birefringence and Land-groove Pattern in DVD-RAM Substrate (단열층이 DVD 기판의 복굴절 및 전사성에 미치는 영향)

  • Gang, Sin-Il;Kim, Yeong-Min;Seong, Gi-Byeong;Lee, Jun-Seok;Lee, Seung-Won
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.26 no.4
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    • pp.631-636
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    • 2002
  • It is necessary to improve mechanical and optical properties in the optical disk substrates as the information storage devices with high storage density using blue laser are being developed. Injection compression molding is regarded as the most suitable process to manufacture optical disk substrates for quality recording and read-out. In the present research, the effects of mold temperature and the insulation layer thickness on gapwise birefringence and the land-groove pattern were investigated. It was found that the values of the birefringence distribution were very sensitive to mold temperature history, and the level of birefringence reduced and, furthermore, the quality of replication was improved due to the insulation layer.

An Theoretical Investigation on the Minimization of Birefringence Distribution in Optical Disk Substrate (광디스크 기판 성형시 발생하는 복굴절의 최소화를 위한 이론적 연구)

  • 김종성;강신일
    • Transactions of Materials Processing
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    • v.9 no.2
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    • pp.103-111
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    • 2000
  • It is necessary to improve mechanical and optical properties in the optical disk substrates as the information storage density using short wavelength laser are being developed. The birefringence distribution is regarded as one of the most important optical properties for optical disk. In the present study, the birefringence distrubution is calculated using the Leonov model for viscoelastic constitutive equations and Cross/WLF model for viscosity approximation. The effects of processing conditions upon the development of birefringence discosity approximation. The effects of processing conditions upon the development of birefringence distribution in the optical disk were examined theoretically. It was found that the values of the birefringence distributions were very sensitive to the mold wall temperature history which minimizes the birefringence distribution. The analytical results showed the possibility of improving mechanical and optical properties in the optical disk substrates by active control of the mold wall temperature history.

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Modeling of Passive Heating for Replicating Sub-micron Patterns in Optical Disk Substrates (단열층을 이용한 광디스크 기판 성형에 대한 수치 해석)

  • 배재철;김영민;김홍민;강신일
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2003.10a
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    • pp.80-83
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    • 2003
  • Transcribability of pit or land groove structures in replicating an optical disk substrate greatly affects the performance of a high-density optical disk. However, a solidified layer, generated during the polymer filling, deteriorates transcribability because the solidified layer prevents the polymer melt in filling the sub-micro patterns. Therefore, the development of the solidified layer during filling stage of injection molding must be delayed. For this delay, passive heating by insulation layer has been used. In the present study, to examine the development of the solidified layer delayed by passive heating, the flow of polymer melt with passive heating was analyzed. Passive heating markedly delayed the development of the solidified layer, reduced the viscosity of the polymer melt, and increased the fluidity of the polymer melt in the vicinity of the stamper surface with the sub-micro patterns. As a result, we predict that passive heating can improve transcribability of an optical disk substrate. To verify our prediction, we fabricated an optical disk substrate by using passive heating of a mold and measured the transcribability.

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