• Title/Summary/Keyword: 간접 평판형검출기

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An Optimal Structure of a Novel Flat Panel Detector to Reduce Scatter Radiation for Clinical Usage: Performance Evaluation with Various Angle of Incident X-ray (산란선 제거를 위한 신개념 간접 평판형 검출기의 임상적용을 위한 최적 구조 : 입사 X선 각도에 따른 성능평가)

  • Yoon, Yongsu
    • Journal of radiological science and technology
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    • v.40 no.4
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    • pp.533-542
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    • 2017
  • In diagnostic radiology, the imaging system has been changed from film/screen to digital system. However, the method for removing scatter radiation such as anti-scatter grid has not kept pace with this change. Therefore, authors have devised the indirect flat panel detector (FPD) system with net-like lead in substrate layer which can remove the scattered radiation. In clinical context, there are many radiographic examinations with angulated incident X-ray. However, our proposed FPD has net-like lead foil so the vertical lead foil to the angulate incident X-ray would have bad effect on its performance. In this study, we identified the effect of vertical/horizontal lead foil component on the novel system's performance and improved the structure of novel system for clinical usage with angulated incident X-ray. Grid exposure factor and image contrast were calculated to investigate various structure of novel system using Monte Carlo simulation software when the incident X-ray was tilted ($0^{\circ}$, $15^{\circ}$, and $30^{\circ}$ from the detector plane). More photons were needed to obtain same image quality in the novel system with vertical lead foil only then the system with horizontal lead foil only. An optimal structure of novel system having different heights of its vertical and horizontal lead foil component showed improved performance compared with the novel system in a previous study. Therefore, the novel system will be useful in a clinical context with the angulated incident X-ray if the height and direction of lead foil in the substrate layer are optimized as the condition of conventional radiography.

Comparison of Modulation Transfer Function in Measurements by Using Edge Device angle in Indirect Digital Radiography (간접평판형 검출기에서 변조전달함수 측정 시 Edge 각도에 따른 비교 연구)

  • Min, Jung-Whan;Jeong, Hoi-Woun
    • Journal of radiological science and technology
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    • v.42 no.4
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    • pp.259-263
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    • 2019
  • This study was purpose to compare image quality of Indirect digital radiography (IDR) system by using the International electro-technical commission standard(IEC 62220-1) which were applied to IEC in medical imaging. To evaluation the analysis of Modulation transfer function(MTF) measurements edge device each angle by using edge method. In this study, Aero (Konica, Japan) which is Indirect flat panel detector(FPD) was used, the size of image receptor matrix $1994{\times}2430$ which performed 12bit processing and pixel pitch is $175{\mu}m$. In IEC standard method were applied to each angle were compared. The results of shown as LSF at $2.0^{\circ}$ and $3.0^{\circ}$ angeles. Shape is constant and shows smooth shape. The amount of data seemed reasonable and 2.19 cycles/mm and 2.01 cycles/mm at a spatial frequency of $2.0^{\circ}$ and $3.0^{\circ}$ at an MTF value of 0.1. At an MTF value of 0.5, the spatial frequencies were $2.0^{\circ}$ and 1.11 cycles/mm and 0.93 cycles/mm at an angle of $3.0^{\circ}$. This study were to evaluate MTF by setting the each $2{\sim}3^{\circ}$ each angle and to suggest the quantitative methods of measuring by using IEC.

Comparison of Noise Power Spectrum in Measurements by Using International Electro-technical Commission Standard Devices in Indirect Digital Radiography (간접평판형 검출기에서 국제전자기술위원회 기준을 통한 잡음전력스펙트럼 비교 연구)

  • Min, Jung-Whan;Jeong, Hoi-Woun;Kim, Ki-Won;Kwon, Kyung-Tae;Jung, Jae-Yong;Son, Jin-Hyun;Kim, Hyun-Soo
    • Journal of radiological science and technology
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    • v.41 no.5
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    • pp.457-462
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    • 2018
  • The purpose of this study was to compare image quality of indirect digital radiography (IDR) system using the International Electro-technical Commission standard (IEC 62220-1), and to suggest the analysis of noise power spectrum (NPS) which were applied to IEC 62220-1 in medical imaging. In this study, Pixium 4600 (Trixell, France) which is indirect flat panel detector (FPD) was used. The size of image receptor (IR) is $7{\times}17$ inch (matrix $3001{\times}3001$) which performed 14bit processing and pixel pitch is $143{\mu}m$. In IEC standard, NPS evaluation were applied to RQA3, RQA5, RQA7 and RQA9. Because of different radiation quality, each region of interesting (ROI) were compared. The results of NPS indicated up to $3.5mm^{-1}$ including low Nyquist frequency. RQA5 indicated the lowest NPS and the others indicated higher NPS results relatively. NPS result of ROI a38 was higher than ROI a92 and this result indicated that there are more noise in left (cathode) than right (anode). This study were to evaluate NPS by using different radiation quality and setting the each ROI, and to suggest the quantitative methods of measuring NPS.

Design and Fabrication of HgI2 Sensor for Phosphor Screen based flat panel X-ray Detector (형광체 스크린 기반 평판형 X선 검출기 적용을 위한 요오드화수은 필름 광도전체 센서 설계 및 제작)

  • Park, Ji Koon;Jung, Bong Jae;Choi, Il Hong;Noh, Si Cheol
    • Journal of the Institute of Electronics and Information Engineers
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    • v.51 no.12
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    • pp.189-194
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    • 2014
  • In this study, from a new x-ray detector that combines a columnar CsI:Na scintillation layer with a photosensitive mercuric iodide layer was investigated. In this structure, X-rays are converted into visible light on a thick CsI:Na layer, which is then converted to electric charges in a thin $HgI_2$ bottom layer. The thin coplanar mercuric iodide films as a photosensitive converter requiring only a few tens of volts of bias, associated with a thick columnar coating of phosphor layer, were simulated and designed. The results of this research suggest that the new coplanar x-ray detector with a hybrid-type structure can resolve the following problems: high voltage from the a-Se, and low conversion efficiency from the indirect conversion method. The results of this research suggest that the new CsI:Na/$HgI_2$ x-ray detector with a double-layer type structure can resolve the following problems: high voltage from the direct conversion method, and low conversion efficiency from the indirect conversion method.