• 한국자기학회:학술대회 개요집
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• 한국자기학회 2000년도 International Symposium on Magnetics The 2000 Fall Conference
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• pp.200-206
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• 2000

We have investigated the activation magnetic moment, which characterizes the basis magnetic moment acting as a single magnetic particle during magnetization reversal. The activation magnetic moment was measured from each local area on continuous ferromagnetic thin films, by analyzing the magnetic field dependence of magnetization reversal of the corresponding local area based on a thermally activated relaxation process. It was found that the activation magnetic moment was nonuniform on submicrometer scale; the fluctuation increased with increasing the number of layers in Co/Pd multilayers. The distribution could be well analyzed by exp($\delta$m$\^$3/2/), where $\delta$m is the deviation of the activation magnetic moment from the mean value.

• Journal of Magnetics
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• 제6권2호
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• pp.70-72
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• 2001

We have investigated the activation magnetic moment, which characterizes the basic magnetic moment acting as a single magnetic particle during magnetization reversal. The activation magnetic moment was measured from each local area on continuous ferromagnetic thin films, by analyzing the magnetic field dependence of magnetization reversal of the corresponding local area, based on a thermally activated relaxation process. It was found that the activation magnetic moment was nonuniform on a submicrometer scale; the fluctuation increased with increasing the number of layers in Co/Pd multilayers. The distribution could be well described by exp($\delta m^{3/2}$), where $\delta$m is the deviation of the activation magnetic moment from the mean value.

• Journal of Magnetics
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• 제7권4호
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• pp.151-155
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• 2002

In situ stress changes at interfaces of ultrathin magnetic films were measured by means of a non-contact optical fiber bundle displacement detector. A bending of the substrate due to stress of a deposited film was detected in cantilever geometry. The highest sensitivity of 134 mV/$\mu$m for the displacement detector was realized with a help of computer simulation. The detector was applied to in situ stress measurements of Co/Pt and Ni/Pd magnetic multilayer films prepared on the glass substrates by dc magnetron sputtering. The detector turned out to have a submonolayer sensitivity that enables to observe coherent-to-incoherent transition in these mismatched multilayers and even detect the stress changes within the monoatomic coverage. This highly sensitive detector paves new way to probe the stress relaxation at an interface in ultrathin films.