• Applied Chemistry for Engineering
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• v.19 no.2
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• pp.145-150
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• 2008

In this work we have studied the antifouling properties of the hydrophobic sol-gel modified sensing membrane and its optical properties for sensor application. E. coli JM109, B. cereus 318 and P. pastoris X-33 were cultivated in confocal cultivation dishes with glass surface, respectively. The glass surface was coated with the hydrophobic sol-gels prepared by the dimethoxy-dimethyl-silane (DiMe-DMOS) and tetramethyl-orthosilicate (TMOS). After cultivation, microorganisms adhered on the surface coated with sol-gels and glass surface were dyed by gram-staining method and the numbers of microorganisms were analyzed based on the image data of the scanning electronic microscope (SEM). A great number of microorganisms, about $2{\sim}3{\times}10^4/mm^2$, was adhered on the glass surfaces which no hydrophobic sol-gels were coated. But, the antifouling effect of the hydrophobic sol-gels was large, that microorganisms of less than $200{\sim}300/mm^2$ were adhered on the coated glass surface. The performance of the sensing membranes for detection of pH and dissolved oxygen was enhanced by recoating the light insulation layer prepared with the mixture of the hydrophobic sol-gel and graphite particles.

• Journal of Sensor Science and Technology
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• v.6 no.5
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• pp.407-413
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• 1997

The crystallized CuPc(copper phthalocyanine) film on a p-type <100> Si substrate is prepared at the substrate temperature of $300^{\circ}C$ by thermal evaporation. X -ray diffraction analysis showed the CuPc film to have a-axis oriented structure. For the measurement of photovoltaic characteristics of the CuPc/Si film and the Si substrate, a transverse current-voltage (I-V) curve is observed. In the dark, the Au/Si junction is shown to be ohmic contact. However, under illumination, a photovoltaic effect is not observed. The I-V curve in the dark indicates that the CuPc film on Si may form an ohmic contact. Since the CuPc film is a p-type semiconductor, the CuPc/p-Si junction has no barrier at the interface. Under illumination, the CuPc/Si junction shows a large photocurrent comparing with that of the wafer. The result indicates that the CuPc layer plays an important role in the photocarrier generation under red illumination (600 nm). The CuPc/Si film shows the photo voltaic characteristics with a short-circuit photocurrent ($J_{sc}$) of $4.29\;mA/cm^{2}$ and an open-circuit voltage ($V_{oc}$) of 12 mA.

• Korean Journal of Optics and Photonics
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• v.34 no.1
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• pp.22-30
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• 2023

The use of segmented mirrors is one of the ways to make the primary mirror of a spaceborne satellite larger, where several small mirrors are combined into a large monolithic mirror. To align multiple segmented mirrors as one large mirror, there must be no discontinuity in the x, y-axis (tilt) and axial alignment error (piston) between adjacent mirrors. When the tilt and piston are removed, we can collect the light in one direction and get an expected clear image. Therefore, we need a precise wavefront sensor that can measure the alignment error of the segmented mirrors in nm scale. The tilt error can be easily detected by the point spread image of the segmented mirrors, while the piston error is hard to detect because of the absence of apparent features, but makes a downgraded image. In this paper we used an optical testing interferometer such as a Fizeau interferometer, which has various advantages when aligning the segmented mirror on the ground, and focused on measuring the axial displacement error of a segmented mirror as the basic research of measuring the piston errors between adjacent mirrors. First, we calculated the relationship between the axial displacement error of the segmented mirror and the surface defocus error of the interferometer and verified the calculated formula through experiments. Using the experimental results, we analyzed the measurement uncertainty and obtained the limitation of the Fizeau interferometer in detecting axial displacement errors.