• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.388-388
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• 2016

Chemical mist deposition (CMD) of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) was investigated with cavitation frequency f, solvent, flow rate of nitrogen, substrate temperature $T_s$, and substrate dc bias $V_s$ as variables for efficient PEDOT:PSS/crystalline (c-)Si heterojunction solar cells (Fig. 1). The high-speed camera and differential mobility analysis characterizations revealed that average size and flux of PEDOT:PSS mist depend on f, solvent, and $V_s$. The size distribution of mist particles including EG/DI water cosolvent is also shown at three different $V_s$ of 0, 1.5, and 5 kV for a f of 3 MHz (Fig. 2). The size distribution of EG/DI water mist without PEDOT:PSS is also shown at the bottom. A peak maximum shifted from 300-350 to 20-30 nm with a narrow band width of ~150 nm for PEDOT:PSS solution, whose maximum number density increased significantly up to 8000/cc with increasing $V_s$. On the other hand, for EG/water cosolvent mist alone, the peak maximum was observed at a 72.3 nm with a number density of ~700/cc and a band width of ~160 nm and it decreased markedly with increasing $V_s$. These findings were not observed for PEDOT:PSS/EG/DI water mist. In addition, the Mie scattering image of PEDOT:PSS mist under white bias light was not observed at $V_s$ above 5 kV, because the average size of mist became smaller. These results imply that most of solvent is solvated in PEDOT:PSS molecule and/or solvent is vaporized. Thus, higher f and $V_s$ generate preferentially fine mist particle with a narrower band width. Film deposition occurred when $V_s$ was impressed on positive to a c-Si substrate at a Ts of $30-40^{\circ}C$, whereas no deposition of films occurred on negative, implying that negatively charged mist mainly provide the film deposition. The uniform deposition of PEDOT:PSS films occurred on textured c-Si(100) substrate by adjusting $T_s$ and $V_s$. The adhesion of CMD PEDOT:PSS to c-Si enhanced by $V_s$ conspicuously compared to that of spin-coated film. The CMD PEDOT:PSS/c-Si solar cell devices on textured c-Si(100) exhibited a ${\eta}$ of 11.0% with the better uniformity of the solar cell parameters. Furthermore, ${\eta}$ increased to 12.5% with a $J_{sc}$ of $35.6mA/cm^2$, a $V_{oc}$ of 0.53 V, and a FF of 0.67 with an antireflection (AR) coating layer of 20-nm-thick CMD molybdenum oxide $MoO_x$ (n= 2.1) using negatively charged mist of 0.1 wt% 12 Molybdo (VI) phosphoric acid n-Hydrate) $H_3(PMo_{12}O_40){\cdot}nH_2O$ in methanol. CMD. These findings suggest that the CMD with negatively charged mist has a great potential for the uniform deposition of organic and inorganic on textured c-Si substrate by adjusting $T_s$ and $V_s$.

• Restorative Dentistry and Endodontics
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• 제35권2호
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• pp.80-87
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• 2010

이 실험의 목적은 NaOCl과 CHX의 혼합사용 시, 발생하는 침전물의 형성을 막기 위해 두 용액간의 접촉을 줄일 수 있는 여러 가지 방법을 비교하고, 관찰된 침전물의 원소를 분석하는 것이다. 발거된 50개의 단근치를 사용하였으며 2.5% NaOCl을 이용하여 .04 taper ProFile #40까지 근관형성 하였다. 치아는 다음과 같은 근관세척 방법에 따라 4개의 실험군과 1개의 대조군으로 나누었다; 대조군: 2.5% NaOCl, 1군: 2.5% NaOCl + 2% CHX, 2군: 2.5% NaOCl + paper points + 2% CHX, 3군: 2.5% NaOCl + .04/#45 근관확대 + 2% CHX, 4군: 2.5% NaOCl +95% alcohol+ 2% CHX. 근관세척 후 치아를 양분하고 치관부, 중간부, 치근부 세부위로 나누어 전계 방사형 주사 전자현미경을 통하여 잔사 비율, 개방 상아세관 비율, 상아세관 내 물질의 원소분석을 시행하였다. 실험결과, 실험군 사이에 잔사비율과 개방된 상아세관 비율 비교에서 통계학 적으로 유의할 만한 차이는 나타나지 않았다. 1 군의 한 시편에서 C의 함유량이 높게 나타났으며 N과 Cl도 함께 검출되어 para-chloraniline으로 추정되며, 1 군의 다른 시편과 나머지 실험군에서는 O, P, C, Ca의 순으로 함유량이 높은 것으로 나타나 수산화인회석으로 추정된다. NaOCl 세척 후 바로 CHX 세척을 한 군에서 PCA로 의심되는 물질이 검출된 바, 두 용액의 직접적인 접촉을 피하기 위해 주의가 필요하며, 본 실험에 사용된 여러 근관 세척방법 이용 시 침전물의 형성을 예방할 수 있을 것이다.