• Korean Journal of Materials Research
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• v.6 no.6
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• pp.618-625
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• 1996

고주파 마그네트론 스퍼터링(RF magnetron sputtering)법을 이용하여 자동차유리 성에 제거용 주석첨가 인듐산화물(indium tin oxide;ITO) 투명저항박막의 증착과 그 전기 및 광학 특성을 연구하였다. 기판온도는 A, T.-30$0^{\circ}C$, O2/(Ar+O2)비는 0-0.3로 변화시키며 실험하였다. 기판온도가 높아질수록, 그리고 O2/(Ar+O2)비가 높아질수록 박막의 증착속도는 감소하였다. 또한, 기판온도가 높아질수록 In2O3(400) 방향의 결정성은 감소하고, In2O3(222)와 (400) 피크만이 잔존하였다. 기판온도가 높아질수록 가시광영역의 광투과도는 향상되었고, 면저항은 20$0^{\circ}C$까지는 감소하였으나 20$0^{\circ}C$이상에서는 거의 일정하였으며, 결정립 크기는 온도가 높아질수록 증가하였다. 박막의 면저항은 O2/(Ar+O2)비가 0.1에서는 감소하고, 그 이상에서는 증가하였으며, 광투과도는 O2/(Ar+O2)비에 거의 영향을 받지 않았다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.9
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• pp.611-615
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• 2001

Y$_2$O$_3$ thin films have been proposed as a buffering insulator of metal/ferroelectric/insulator/semiconductor field effect transistor(MFISFET)-type ferroelectric random access memory (FRAM). In this study, $Y_2$O$_3$ thin films were etched with inductively coupled plasma(ICP). The etch rates of $Y_2$O$_3$ and YMnO$_3$, and the selectivity of $Y_2$O$_3$ to YMnO$_3$ were investigated by varying Cl$_2$/(Cl$_2$＋Ar) gas mixing ratio. The maximum etch rate of $Y_2$O$_3$, and the selectivity of $Y_2$O$_3$ to YMnO$_3$ were 302$\AA$/min, and 2.4 at Cl$_2$/(Cl$_2$＋Ar) gas mixing ratio of 0.2 respectively. Optical emission spectroscopy(OES) was used to understand the effects of gas combination on the etch rate of $Y_2$O$_3$ thin film. The surface reaction of the etched $Y_2$O$_3$ thin films was investigated by x-ray photoelectron spectroscopy (XPS). XPS analysis confirmed that there was chemical reaction between Y and Cl. This result was confirmed by secondary ion mass spectroscopy(SIMS) analysis.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.73-73
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• 2011

Zn-Sn-O (ZTO) 다성분계 산화물 박막은 일반적인 rf 스퍼터법으로 성막할 경우 비정질상으로 성장하여 결정질 산화물 박막에 비해 우수한 표면평탄도와 식각 단면을 제공한다. 비정질임에도 불구하고 넓은 자유전하 농도 범위에서 높은 Hall 이동도를 제공할 수 있는 것으로 보고되어 있어 비정질 산화물의 투명도전성 박막에 대한 관심이 높아지고 있다. 투명 TFT에 적용되는 또 다른 비정질계 산화물 박막인 In-Zn-O (IZO) 박막에 비해 ZTO 박막은 상대적으로 제한된 연구가 이루어졌으나, In의 함유되지 않아 경제적으로 유리하고, 특히 SnO2의 우수한 기계적 및 화학적 특성과 ZnO의 내환원성 특성을 잠재하고 있는 유망한 투명도전성 박막재료이다. 본 연구에서는 Zn-Sn-O계 박막을 통상의 rf 스퍼터법으로 성막하여 조성, 증착 온도, 그리고 열처리 온도에 따른 ZTO 박막의 구조적인 특성 변화와 이에 따른 전기적 및 광학적 특성 변화에 대하여 고찰하였다. ZnO 타겟과 SnO2 타겟을 사용하여 co-sputtering하여 ZnO의 부피 분률을 13~59 mol%까지 변화되도록 조절하여 증착하였다. 증착 온도는 상온, 150 및 $300^{\circ}C$로, 그리고 성막가스 중의 산소분률은 0%, 0.5% 및 1% 로 변화시켰다. 40 mol% 이상의 ZnO를 함유한 ZTO 박막은 가시광 영역에서의 평균 광투과도는 좋으나 전기적인 특성이 열악하였으며, ZnO 분율이 낮은 ZTO 박막은 10-2~10-3 ohm-cm 정도의 비교적 낮은 비저항을 나타내었으나 광투과도 면에서 떨어지는 단점을 보였다. 평균 광투과도는 증착 온도가 증가할수록, 그리고 산소의 양이 증가할수록 향상 되었다. 자유전하농도가 1017~1020 cm-3 정도의 넓은 범위에서 10 cm2/Vs 을 넘는 홀 이동도를 가지는 ZTO 박막의 증착이 가능함을 확인하였으며, 이로부터 투명 TFT 소자로 적용이 가능성이 있음을 보였다. EPMA를 이용한 정량분석 및 XRD를 이용한 구조분석과 연계한 ZTO 박막의 물성 및 최적 조건에 대한 논의가 이루어질 것이다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2007.11a
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• pp.103-104
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• 2007

$CuInO_2$ 단일상은 합성조건이 매우 까다롭기 때문에 일반적인 고상법으로 얻기 힘든 것으로 알려저 있다. 투명전도성 $CuInO_2$ 박막을 증착하기 위하여 일반적인 고상법으로 Cu와 In의 비율이 1:1인 $Cu_2O-In_2O_3$ composite target 및 In 대신 Ca, Mg, Ti가 각각 1mol% 도핑된 target을 제작하였다. 제작된 각각의 composite target을 이용하여 pulsed laser deposition(PLD) 공정으로 투명전도성 $CuInO_2$ 박막을 증착하였다. Cu와 In이 1:1 인 $Cu_2O-In_2O_3$ composite target을 사용한 경우, 증착된 박막이 Cu와 In의 비율이 1:1인 c-axis 배향된 단일상의 $CuInO_2$ 박막임을 확인하였다.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.4 no.4
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• pp.378-387
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• 1994

To improve the properties of $PbTiO_3$ thin films successfully grown by thermal diffusion of 3 component layers of $Ti0_2/Pb/TiO_2(900{\AA}/900{\AA}/900{\AA})$ in preceding research, 3, 5, 7, 9, and 11 multilayer structures $(TiO_2/Pb/.../Tio_2)$ with thinner component layer of $200~300 {\AA}$ thick were deposited on Si substrate by RF sputtering, which were followed by RTA to form $PbTiO_3$ thin films. As a result, $PbTiO_3$ single phase was formed above $500^{\circ}C$. When the thickness of component layer reduced and the number of component layers increased, suppression of Pb-silicate and voids formation resulted in relatively sharp interfaces and the film composition became more homogeneous. Relative dielectric constants in MIM structure were independent of the annealing condition, but they increased with increasing thickness of the $PbTiO_3$ thin films. The maximum breakdown field in MIS structure reached 150kV/cm.

• Journal of the Korean Ceramic Society
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• v.34 no.2
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• pp.181-187
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• 1997

The layered BaTiO3 thin films with a high dielectric constant of polycrystalline BaTiO3 and a good in-sulating property of amorphous BaTiO3 were prepared. And their electrical properties were characterized with stacking methods. The BaTiO3 thin films were prepared by rf-magnetron sputtering technique using a ceramic target on Indium-doped Tin oxide coated glasses. A new stacking method resulted in higher dielec-tric constant, capacitance per unit area, and breakdown strength than those prepared by a conventional stacking method; the new method continuously decrease the substrate temperature after initial deposition of a polycrystalline BaTiO3 layer. The observed high dielectric constant could be explained only by a mul-tilayered amorphous/microcrystalline/polycrystalline structure, which was confirmed indirectly by AES depth profile.

• Journal of Sensor Science and Technology
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• v.11 no.2
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• pp.118-123
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• 2002

$ZnGa_2O_4$ thin film phosphors have been deposited using a pulsed laser deposition technique on $Al_2O_3$(0001) substrates at a substrate temperature of $550^{\circ}C$ with various oxygen pressures 100, 200 and 300 mTorr. The films grown under different growth oxygen pressures have been characterized using microstructural and luminescent measurements. The different photoluminescence (PL) characteristics with the increase in oxygen pressures may result from the change of the crystallinity and the composition ratio of Zn and Ga in the films. The luminescent spectra show a broad band extending from 300 to 600 nm peaking at 460 nm. The PL brightness data obtained from the $ZnGa_2O_4$ films grown under optimized conditions have indicated that the sapphire is a promising substrate for the growth of high quality $ZnGa_2O_4$ thin film phosphor.

• Journal of the Korean Vacuum Society
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• v.9 no.3
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• pp.227-232
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• 2000

$MgTiO_3$thin films have been grown on various substrates by pulsed laser deposition (PLD) to investigate the application for microwave dielectrics and optical devices. Epitaxial $MgTiO_3$thin films were obtained on sapphire (c-plane$A1_2O_3$$MgTiO_3$thin films deposited on $SiO_2/Si$ and platinized silicon ($Pt/Ti/SiO_2/Si$) substrates were highly oriented. $MgTiO_3$thin films grown on sapphire were transparent in the visible and had a sharp absorption edge about 290 nm. These $MgTiO_3$thin films had extremely fine feature of surface morphology, i.e., rms roughness of 0.87 nm, which was examined by AFM. We have investigated the dielectric properties of the $MgTiO_3$thin films in $MIM(Pt/MgTiO_3/Pt)$ capacitors. Dielectric constant and loss of $MgTiO_3$thin films deposited by PLD were about 24 and 1.5% at 1 MHz, respectively. These $MgTiO_3$thin films also exhibited little dielectric dispersion.

• Journal of the Korean Vacuum Society
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• v.20 no.3
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• pp.205-210
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• 2011

Structural and electrochemical properties of spinel oxide $LiMn_2O_4$ thin films prepared by using a sol-gel method on Pt/Ti/$SiO_2$/Si substrates were investigated. When Li/Mn molar ratio of the film was smaller than 0.5, $Mn_2O_3$hase was found to coexist with $LiMn_2O_4$. Half-cell batteries fabricated using the $LiMn_2O_4$ films as the cathode were put into chargedischarge (C-D) cycles and the change in structural properties of the cathode after the cycles was examined by X-ray diffraction and Raman spectroscopy. As the C-D cycle number increases, the discharge capacity of pure $LiMn_2O_4$ battery gradually decreases, being reduced to 72% of the initial capacity at 300 cycles. Such capacity fading is attributable to the decrease in the number of $Li^+$ ions that return to the tetrahedral sites of the spinel structure during the discharge step and the resultant increase in $Mn^{4+}$ density in the film. Also, $Mn_2O_3$ phase gradually appeared in the film as the cycle number increases.

• Journal of the Korean Magnetics Society
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• v.11 no.3
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• pp.97-103
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• 2001

Polycrystalline thin films of La$_{2}$3/Sr$_{1}$3/MnO$_3$(LSMO) were prepared by water-based sol-gel processing on thermally oxidized Si(100) substrate. The thickness dependence of the low-field tunnel-type magnetoresistance properties at room temperature was studied. Tunnel-type magnetoresistance at low-field is found to be strongly dependent on film thickness. Maximum value of tunnel-type magnetoresistance of LSMO thin films was appeared at the film thickness of ~1500 $\AA$. This behavior can be explained in terms of dead layer between LSMO thin film and Si(100) substrate and thermal lattice strain effect in the LSMO thin films.